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You searched on: Topic Area: Electromagnetics

Displaying records 41 to 50 of 87 records.
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41. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Electromagnetics
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932

42. Electrical Characterization of Photoconductive GaN Nanowire Devices from 50 MHz to 33 GHz
Topic: Electromagnetics
Published: 7/1/2011
Authors: Thomas M Wallis, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Paul T Blanchard, Norman A Sanford, Kristine A Bertness, Christpher Smith
Abstract: The electrical response of two-port., photoconductive GaN nanowire devices was measured from 50 MHz to 33 GHz. The admittance of individual contacted nanowires showed an increase on the order of 10% throughout the measured frequency range after expo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903093

43. Recent Developments in Millimeter and Submillimeter Metrology at NIST
Topic: Electromagnetics
Published: 6/30/2011
Author: Ronald A Ginley
Abstract: The millimeter and submillimeter frequency ranges are becoming very important to today‰s electronics, security and communication industries. NIST has undertaken a research program to aggressively pursue this area. This paper will cover the millimet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908859

44. Boundary Effects on the Determination of the Effective Parameters of a Metamaterial from Normal Incidence Reflection and Transmission
Topic: Electromagnetics
Published: 6/1/2011
Authors: Sung Kim, Edward E. Kuester, Christopher L Holloway, James R. Baker-Jarvis, Aaron D. Scher
Abstract: This paper presents a method for the determination of the effective electromagnetic parameters of a metamaterial, taking boundary effects at the interfaces between a conventional material and metamaterial into account. In the technique presented here ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904074

45. Microwave Characterization of Transparent Conducting Films
Topic: Electromagnetics
Published: 5/26/2011
Authors: Jan Obrzut, Oleg A Kirillov
Abstract: The high frequency conductivity of thin metallic and graphitic nano-films attracts interest due to many potential applications in spin electronics, electromagnetic shielding, flexible antennas, displays, and solar cells. The surface morphology of thi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907453

46. NIST's High Frequency Metrology Program: Current Capabilities and Future Directions
Topic: Electromagnetics
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current ec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907842

47. NIST's High Frequency Metrology Programs: Current Capabilities and Future Directions
Topic: Electromagnetics
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: Several core areas are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameter (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic condition ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907843

48. NIST‰s High Frequency Metrology Programs: Current Capabilities and Future Directions
Topic: Electromagnetics
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906809

49. Confidence in VNA Measurements ‹ The ARFTG Measurement Comparison Program
Topic: Electromagnetics
Published: 3/14/2011
Author: Ronald A Ginley
Abstract: This paper describes the ARFTG scattering parameter Measurement Comparison Program (MCP) which is supported by NIST. The ARFTG MCP is designed specifically to allow users of vector network analyzers to compare their measurements to those of their pee ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907841

50. Quantitative Permittivity Measurements of Nanoliter Liquid Volumes in Microfluidic Channels to 40 GHz.
Topic: Electromagnetics
Published: 12/1/2010
Authors: James C Booth, Nathan D Orloff, Jordi Mateu, James A Beall, Matthew Rinehart
Abstract: We describe the design, fabrication, and evaluation of a new on-wafer measurement platform for the rapid, quantitative determination of the complex permittivity of nL fluid volumes over the frequency range from 10 MHz - 40 GHz. Our measurement platfo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903958



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