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You searched on: Topic Area: Electromagnetics

Displaying records 41 to 50 of 90 records.
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41. The Reverberation Chamber's Unstirred Field: A Validation of the Image Theory Interpretation
Topic: Electromagnetics
Published: 8/15/2011
Authors: Ryan J. Pirkl, John M Ladbury, Catherine A Remley
Abstract: Synthetic aperture measurements of a reverberation chamber's unstirred wireless channel are used to compare the observed power, time-of-arrival, and angle-of-arrival of unstirred multipath components to that predicted by ray/image theory for a re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907962

42. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Electromagnetics
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932

43. Electrical Characterization of Photoconductive GaN Nanowire Devices from 50 MHz to 33 GHz
Topic: Electromagnetics
Published: 7/1/2011
Authors: Thomas M Wallis, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Paul T Blanchard, Norman A Sanford, Kristine A Bertness, Christpher Smith
Abstract: The electrical response of two-port., photoconductive GaN nanowire devices was measured from 50 MHz to 33 GHz. The admittance of individual contacted nanowires showed an increase on the order of 10% throughout the measured frequency range after expo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903093

44. Recent Developments in Millimeter and Submillimeter Metrology at NIST
Topic: Electromagnetics
Published: 6/30/2011
Author: Ronald A Ginley
Abstract: The millimeter and submillimeter frequency ranges are becoming very important to today‰s electronics, security and communication industries. NIST has undertaken a research program to aggressively pursue this area. This paper will cover the millimet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908859

45. Boundary Effects on the Determination of the Effective Parameters of a Metamaterial from Normal Incidence Reflection and Transmission
Topic: Electromagnetics
Published: 6/1/2011
Authors: Sung Kim, Edward E. Kuester, Christopher L Holloway, James R. Baker-Jarvis, Aaron D. Scher
Abstract: This paper presents a method for the determination of the effective electromagnetic parameters of a metamaterial, taking boundary effects at the interfaces between a conventional material and metamaterial into account. In the technique presented here ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904074

46. Microwave Characterization of Transparent Conducting Films
Topic: Electromagnetics
Published: 5/26/2011
Authors: Jan Obrzut, Oleg A Kirillov
Abstract: The high frequency conductivity of thin metallic and graphitic nano-films attracts interest due to many potential applications in spin electronics, electromagnetic shielding, flexible antennas, displays, and solar cells. The surface morphology of thi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907453

47. NIST's High Frequency Metrology Program: Current Capabilities and Future Directions
Topic: Electromagnetics
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current ec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907842

48. NIST's High Frequency Metrology Programs: Current Capabilities and Future Directions
Topic: Electromagnetics
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: Several core areas are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameter (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic condition ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907843

49. NIST‰s High Frequency Metrology Programs: Current Capabilities and Future Directions
Topic: Electromagnetics
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906809

50. Comparison of Electrical Techniques for Magnetization Dynamics Measurements in Micro/Nanoscale Structures
Topic: Electromagnetics
Published: 3/25/2011
Authors: SangHyun S. Lim, Thomas M Wallis, Atif A. Imtiaz, Dazhen Gu, Pavel Kabos, Pavol Krivosik
Abstract: We compared three electrical detection techniques; differential resistance (dV/dI), RF/microwave transmission, and spin rectification measurements for magnetization dynamics in individual patterned sub-micron structures. Different electrical techniqu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906822



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