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You searched on: Topic Area: Electromagnetics

Displaying records 21 to 30 of 77 records.
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21. A Reference Modulated Scatterer for ISO18000-6 UHF Tag Testing
Topic: Electromagnetics
Published: 11/15/2012
Authors: David R Novotny, Daniel G Kuester, Jeffrey R Guerrieri
Abstract: We present a method for measuring Ultra-High Frequency Radio-Frequency Identification (UHF RFID) tag differential RCS that has the potential for being easier and more accurate than current and proposed methods [1-2]. This method is based on accurate ...

Topic: Electromagnetics
Published: 10/26/2012
Authors: David R Novotny, Joshua A Gordon, Edwin J Heilweil, Brian C. Stillwell, Jeffrey R Guerrieri, Erich N Grossman, Shu Zee A. Lo
Abstract: Beginning the fall of 2012, NIST will be providing scattering measurements for other government agencies. We present performance results of a bi-directional scattering measurement system in the 200-500 GHz range. The goal is to provide dense-spectru ...

23. Full-Wave Analysis of Dielectric-Loaded Cylindrical Waveguides and Cavities Using a New Four-Port Ring Network
Topic: Electromagnetics
Published: 8/31/2012
Authors: Felipe Penaranda-foix, Michael D. Janezic, Jose M. Catala-Civera, Antoni J. Canos-Marin
Abstract: In this paper, a full-wave method for the electromagnetic analysis of dielectric-loaded cylindrical and coaxial waveguides and cavities is developed. For this purpose, a new four-port ring network is proposed, and the mode-matching method is applied ...

24. Legendre Fit to the Reflection Coefficient of a Radiating Rectangular Waveguide Aperture
Topic: Electromagnetics
Published: 8/1/2012
Authors: Dylan F Williams, Mohammad Tayeb Ghasr, Bradley K Alpert, Zhongxiang Shen, Alexander Arsenovic, Robert M Weikle, Reza Zoughi
Abstract: We accurately calculate the reflection coefficient and normalized admittance of radiating open-ended rectangular waveguides and fit our results with a linear combination of Legendre polynomials. We verify the expression to an accuracy of 0.005 with o ...

25. Standardizing Rectangular Metallic Waveguides for Terahertz Applications
Topic: Electromagnetics
Published: 7/1/2012
Authors: Ronald A Ginley, N M Ridler
Abstract: This paper describes an on-going activity to develop an international document standard for defining rectangular metallic waveguides for use in the submillimeter-wave/terahertz frequency range. The IEEE's Microwave Theory & Techniques Society (MTT-S ...

26. Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope
Topic: Electromagnetics
Published: 5/14/2012
Authors: Atif A. Imtiaz, Thomas M Wallis, SangHyun (Sang-Hyun) Lim, H. Tanbakuchi, H-P Huber, A. Hornung, P. Hinterdorfer, J. Smoliner, F. Kienberger, Pavel Kabos
Abstract: We report frequency dependent contrast in d(S11)/dV measurements of a variably doped p-type silicon sample in the frequency range from 2GHz to 18GHz. The measurements were conducted bys use of a scanning microwave microscope. The measurements were ...

27. A Large-Signal Model of Ferroelectric Thin-Film Transmission Lines"
Topic: Electromagnetics
Published: 12/1/2011
Authors: Eduard Rocas, Juan C. Collado Gomez, Jordi Mateu, Nathan D Orloff, James C Booth, Juan Manuel O'C allaghan
Abstract: "This work evaluates the microwave nonlinear properties and tuning at RF frequencies of ferroelectric Ba0.3Sr0.7TiO3 thin-films by on-wafer measurements of the second and third-order harmonics and intermodulation products of several coplanar transmis ...

28. Microwave Radiometric Standards Development at the U.S. National Institute of Standards and Technology
Topic: Electromagnetics
Published: 12/1/2011
Author: David K Walker
Abstract: NIST‰s stated mission is, ,To promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology in ways that enhance economic security and improve our quality of life.Š NIST offers an extensive range o ...

29. Verification of Noise-Parameter Measurements and Uncertainties
Topic: Electromagnetics
Published: 11/1/2011
Authors: James Paul Randa, Dazhen Gu, David K Walker
Abstract: We propose and implement verification methods for measurements of noise parameters of amplifiers and transistors. Because the verification rests on the comparison of different measurement results, it also serves as a test of the uncertainties. The ve ...

30. Effective Material Property Extraction Of a Metamaterial by Taking Boundary Effects into Account At TE/TM Polarized Incidence
Topic: Electromagnetics
Published: 9/22/2011
Authors: Sung Kim, Christopher L Holloway, James R. Baker-Jarvis, Edward Kuester, Kendra L. Kimberly
Abstract: In this paper, we present the extraction for effective material parameters for a metamaterial from TE or TM waveguide measurements with generalized sheet transition conditions (GSTCs) used to provide electric and magnetic surface susceptibilities th ...

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