NIST logo

Publications Portal

You searched on:
Topic Area: Advanced Materials
Sorted by: title

Displaying records 11 to 20 of 33 records.
Resort by: Date / Title


11. Electrical and structural characterization of high performance airbrushed organic thin film transistors
Topic: Advanced Materials
Published: 3/18/2010
Authors: Calvin Chan, Lee J Richter, Cherno Jaye, Brad Conrad, Hyun W. Ro, David Germack, Daniel A Fischer, Dean M DeLongchamp, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905344

12. Electro-Thermal Simulation and Design of a 60 A, 4.5 kV Half-Bridge Si IGBT/SiC JBS Hybrid Power Module
Topic: Advanced Materials
Published: 9/15/2012
Authors: Tam Hoang Duong, Allen R Hefner Jr, Karl Hobart
Abstract: This paper presents the results from a parametric simulation study that was conducted to optimize the design of a high-current 4.5 kV half-bridge Si-IGBT/SiC-JBS hybrid module for medium voltage hard-switched power conversion as well as to compare th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911712

13. Flip Chip Lamination to electrically contact organic single crystals on flexible substrates
Topic: Advanced Materials
Published: 4/20/2011
Authors: Oana Jurchescu, Brad Conrad, Christina Ann Hacker, David J Gundlach, Curt A Richter
Abstract: The fabrication of top metal contacts for organic electronics represents a challenge and has important consequences for electrical properties of such systems. We report a low cost and non-destructive printing process, Flip Chip Lamination (FCL), to f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907524

14. Fluid interactions with metafilm/metasurfaces for tuning, sensing, and microwave assisted chemical processes
Topic: Advanced Materials
Published: 5/25/2011
Authors: Joshua A Gordon, Christopher L Holloway, James C Booth, James R. Baker-Jarvis, David R Novotny, Sung Kim, Yu Y. Wang
Abstract: In this paper we demonstrate tunability of a metafilm, which is the two-dimensional equivalent of a metamaterial, also referred to as a metasurface, by changing the permittivity in a micro-fluidic channel that interacts with the metafilm. Numerical s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907703

15. Gaseous Electronics Conference RF Reference Cell Newsletter
Topic: Advanced Materials
Published: 5/3/1993
Author: James K Olthoff
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32965

16. Giant piezoelectricity in PMN-PT thin films: Beyond PZT
Topic: Advanced Materials
Published: 11/1/2012
Authors: S. H. Baek, M. S. Rzchowski, Vladimir A Aksyuk
Abstract: Micro-electromechanical systems (MEMS) incorporating piezoelectric layers provide active transduction between electrical and mechanical energy, which enables highly sensitive sensors and low-voltage driven actuators surpassing the passive operation o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912113

17. Graphene as Transparent Electrode for Direct Observation of Hole Photoemission from Silicon to Oxide
Topic: Advanced Materials
Published: 3/27/2013
Authors: Rusen Yan, Qin Q. Zhang, Oleg A Kirillov, Wei Li, James Ian Basham, Alexander George Boosalis, Xuelei X. Liang, Debdeep Jena, Curt A Richter, Alan C. Seabaugh, David J Gundlach, Huili G. Xing, Nhan V Nguyen
Abstract: The outstanding electrical and optical properties of graphene make it an excellent alternative as a transparent electrode. Here we demonstrate the application of graphene as collector material in internal photoemission (IPE) spectroscopy; enabling th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912851

18. High performance airbrushed organic thin film transistors
Topic: Advanced Materials
Published: 3/30/2010
Authors: Calvin Chan, Lee J Richter, Brad Anthony Dinardo, Cherno Jaye, Brad Conrad, Hyun W. Ro, David Germack, Daniel A Fischer, Dean M DeLongchamp, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904576

19. Influence of Impedance Mismatch Effects on Measurements of Unloaded Q Factors of Transmission Mode Dielectric Resonators
Topic: Advanced Materials
Published: 6/1/2003
Authors: Kenneth Leong, James C Booth, Sang Yo Lee
Abstract: Precise measurements of the surface resistance of high temperature superconducting thin films using transmission mode dielectric resonators requires accurate knowledge of the unloaded Q factor. So far, the most accurate method of unloaded Q factor de ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30577

20. Interface Barrier Determination by Internal Photoemission: Applications to Metal/Oxide/Semiconductor Structure
Topic: Advanced Materials
Published: 5/23/2008
Author: Nhan V Nguyen
Abstract: Internal photoemission (IPE) spectroscopy is a powerful technique for investigating electronic properties at solid-solid interfaces.  Upon photon excitation, electrons or/and holes in the solid under an external electrical bias, accumulate at th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32964



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series