Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Advanced Materials

Displaying records 1 to 10 of 18 records.
Resort by: Date / Title


1. Surface conductance of graphene from non-contact resonant cavity
Topic: Advanced Materials
Published: 3/15/2016
Authors: Jan Obrzut, Caglar Dogu Emiroglu, Oleg A Kirillov, Yanfei Yang, Randolph E Elmquist
Abstract: A method is established to reliably determine surface conductance of single-layer or multi-layer atomically thin nano-carbon graphene structures. These can be synthesized by chemical vapor deposition (CVD), epitaxial growth on silicon carbide (SiC), ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919244

2. Beam broadening in transmission EBSD
Topic: Advanced Materials
Published: 3/16/2015
Authors: Robert R Keller, Katherine P. Rice, Mark Stoykovich
Abstract: Transmission electron backscatter diffraction (t-EBSD), also known as transmission electron forward scatter diffraction (t-EFSD) or transmission Kikuchi diffraction in the SEM (TKD-SEM), can provide significant improvements in spatial resolution ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917237

3. An Approximate Approach to Determining the Permittivity and Permeability near Lambda/2 Resonances in Transmission/Reflection Measurements
Topic: Advanced Materials
Published: 12/31/2014
Authors: Sung Kim, James R. Baker-Jarvis
Abstract: We present a simple and straightforward approximate approach to removing resonant artifacts that arise in the material parameters extracted near half-wavelength resonances that arise from transmission/reflection (T/R) measurements on low-loss materia ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913779

4. Hot carriers in epitaxial graphene sheets with and without hydrogen intercalation: role of substrate coupling
Topic: Advanced Materials
Published: 7/1/2014
Authors: Randolph E Elmquist, Chiashain Chuang, Yanfei Yang, Lung-I Huang, Chi-Te Liang
Abstract: The development of graphene electronic devices produced by industry will rely on efficient control of heat transfer from the graphene sheet to its environment. In nanoscale devices, heat is one of the major obstacles to the operation of such devices ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916191

5. Designing High-Performance PbS and PbSe Nanocrystal Electronic Devices through Stepwise, Post-Synthesis, Colloidal Atomic Layer Deposition
Topic: Advanced Materials
Published: 2/6/2014
Authors: Soong Ju Oh, Nathaniel E. Berry, Hi-Hyuk Choi, E. Ashley Gaulding, Hangfei Lin, Taejong Paik, Benjamin T. Diroll, Shinichiro Muramoto, Murray B. Christopher, Cherie R. Kagan
Abstract: We report a facile, solution based, post synthetic colloidal atomic layer deposition (PS-cALD) process to engineer the surface stoichiometry and therefore electronic properties of lead chalcogenide nanocrystal (NC) thin films. Using the stepwise and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915267

6. Tunable electrical conductivity in metal-organic framework thin film devices
Topic: Advanced Materials
Published: 1/3/2014
Authors: Albert A. Talin, Andrea Centrone, Alexandra C. Ford, Michael E Foster, Vitalie Stavila, Paul M Haney, Robert Adam Kinney, Veronika A Szalai, Farid El Gabaly, Heayoung Yoon, Francois Leonard, Mark Allendorf
Abstract: We report a strategy for realizing tunable electrical conductivity in MOFs in which the nanopores are infiltrated with redox-active, conjugated guest molecules. This approach is demonstrated using thin-film devices of the MOF Cu3(BTC)2 (also known as ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913452

7. Graphene as Transparent Electrode for Direct Observation of Hole Photoemission from Silicon to Oxide
Topic: Advanced Materials
Published: 3/27/2013
Authors: Rusen Yan, Qin Q. Zhang, Oleg A Kirillov, Wei Li, James I. Basham, Alexander George Boosalis, Xuelei X. Liang, Debdeep Jena, Curt A Richter, Alan C. Seabaugh, David J Gundlach, Huili G. Xing, Nhan V Nguyen
Abstract: The outstanding electrical and optical properties of graphene make it an excellent alternative as a transparent electrode. Here we demonstrate the application of graphene as collector material in internal photoemission (IPE) spectroscopy; enabling th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912851

8. Measurement of orbital asymmetry and strain in Co^d90^Fe^d10^/Ni multilayers and alloys: Origins of perpendicular anisotropy
Topic: Advanced Materials
Published: 2/13/2013
Authors: Justin M Shaw, Hans Toya Nembach, Thomas J Silva
Abstract: We use broadband ferromagnetic resonance spectroscopy and x-ray diffraction to investigate the fundamental origin of perpendicular anisotropy in Co^d90^Fe^d10^/Ni multilayers. By careful evaluation of the spectroscopic {I}g{/I}-factor, we determine ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913103

9. Giant piezoelectricity in PMN-PT thin films: Beyond PZT
Topic: Advanced Materials
Published: 11/1/2012
Authors: S. H. Baek, M. S. Rzchowski, Vladimir A Aksyuk
Abstract: Micro-electromechanical systems (MEMS) incorporating piezoelectric layers provide active transduction between electrical and mechanical energy, which enables highly sensitive sensors and low-voltage driven actuators surpassing the passive operation o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912113

10. Effective Material Property Extraction of a Metamaterial by taking boundary effects into account at TE/TM polarized incidence
Topic: Advanced Materials
Published: 1/31/2012
Authors: Sung Kim, Christopher L Holloway, James R. Baker-Jarvis, Edward Kuester, A D Scher
Abstract: In this paper, we present the extraction for effective material parameters for a metamaterial from TE or TM waveguide measurements with generalized sheet transition conditions (GSTCs)used to provide electric and magnetic surface susceptibilities that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908652



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series