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Topic Area: Spectroscopy
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Displaying records 81 to 90 of 104 records.
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81. Scaling Factors and Uncertainties for ab Initio Anharmonic Vibrational Frequencies
Topic: Spectroscopy
Published: 8/21/2009
Authors: Russell D Johnson III, Karl K Irikura, Raghu N Kacker, Ruediger Kessel
Abstract: To predict the vibrational spectra of molecules, ab initio calculations are often used to compute harmonic frequencies, which are usually scaled by empirical factors as an approximate correction for errors in the force constants and for anharmonic ef ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903585

82. Semi-Classical Line Shape Models of Rovibrational H2O Spectra Tested Using Frequency-Stabilized Cavity Ring-Down Spectroscopy
Topic: Spectroscopy
Published: 6/20/0008
Authors: Joseph Terence Hodges, Daniel Lisak, R. Ciurylo
Abstract: In this work we present a brief review of recent results for water line shapes obtained by means of the frequency stabilized cavity ring-down spectroscopy (FS-CRDS) technique. We demonstrate its ability to enable precise spectroscopic measurements o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832397

83. Silicon-based Molecular Electronics in the Post-Hype Era
Topic: Spectroscopy
Published: 4/8/2011
Author: Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908431

84. Single-Mode Cavity Ring-Down Spectroscopy for Line Shape Measurements
Topic: Spectroscopy
Published: 12/1/1999
Authors: J P. Looney, Roger D van Zee, Joseph Terence Hodges
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100628

85. Spectroscopic Line Parameters of Water Vapor for Rotation-Vibration Transitions near 7180 cm^(-1)
Topic: Spectroscopy
Published: 5/13/2009
Authors: Daniel Lisak, Daniel K. Havey, Joseph Terence Hodges
Abstract: We present low uncertainty measurements of line parameters for fifteen rotation-vibration transitions of water vapor in the wave number range 7170.27 cm^(-1) to 7183.02 cm^(-1). These experiments incorporated frequency-stabilized cavity ring-down spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901894

86. Spectroscopic Real-Time Ellipsometry of Putidaredoxin Adsorption on Gold Electrodes
Topic: Spectroscopy
Published: 6/25/1997
Authors: Vytautas Reipa, Adolfas Kastytis Gaigalas, V L. Vilker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100258

87. Spectrum Simulation in DTSA-II
Report Number: 832430
Topic: Spectroscopy
Published: 10/1/2009
Author: Nicholas W m Ritchie
Abstract: Spectrum simulation is a useful practical and pedagogical tool. Particularly with complex samples or trace constituents, a simulation can help to understand the limits of the technique and how to optimize the tools for the optimal measurement. DTSA- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832430

88. Standard Photoacoustic Spectrometer: Model and Validation using O2 A-Band Spectra
Topic: Spectroscopy
Published: 6/30/2010
Authors: Keith A Gillis, Daniel K. Havey, Joseph Terence Hodges
Abstract: We model and measure the absolute response of an intensity-modulated photoacoustic spectrometer comprising a 10 cm long resonator and having a {I}Q{/I}-factor of approximately 30. We present a detailed theoretical analysis of the system and predict ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904841

89. Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy III. Errors With Different Curve-Fitting Approaches
Topic: Spectroscopy
Published: 12/1/2000
Authors: Joseph M Conny, Cedric John Powell
Abstract: We present results in the final part of a three-part of a three-part study employing standard test data (STD) to estimate errors in peak parameters derived from data analysis procedures used in x-ray photoelectron spectroscopy (XPS). XPS-STD are sim ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831175

90. Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy: II. Peak Intensities
Topic: Spectroscopy
Published: 7/1/2000
Authors: Joseph M Conny, Cedric John Powell
Abstract: Standard test data for x-ray photoelectron spectroscopy (XPS-STD) have been developed for determining bias and random error in peak parameters derived from curve fitting in XPS. The XPS-STD are simulated C 1s spectra from spline polynomial models of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831149



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