NIST logo

Publications Portal

You searched on:
Topic Area: Spectroscopy
Sorted by: title

Displaying records 31 to 40 of 104 records.
Resort by: Date / Title


31. Fabrication of silicon-based Molecular Electronic Structures Using Flip Chip Lamination
Topic: Spectroscopy
Published: 1/19/2011
Authors: Christina Ann Hacker, Michael A Walsh, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908430

32. Fast Imaging of Hard X-Rays With a Laboratory Microscope
Topic: Spectroscopy
Published: 7/1/2000
Authors: A S Bakulin, S M Durbin, Terrence J Jach, J Pedulla
Abstract: An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural investigations of materials with hard x-rays. It uses the Kirkpatrick-Baez multilayer mirror design t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831164

33. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Spectroscopy
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

34. Frequency-Stabilized Cavity Ring-Down Spectrometer for High-Sensitivity Measurements of Water Vapor Concentration
Topic: Spectroscopy
Published: 1/1/2006
Authors: Joseph Terence Hodges, Daniel Lisak
Abstract: We present a portable spectrometer that uses the frequency-stabilized cavity ring-down spectroscopy technique to realize high-precision measurements of trace water vapor concentration. Measuring one of the strongest rovibrational transitions in the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830970

35. Frequency-stabilized cavity ring-down spectrometer for high-sensitivity measurements of water vapor concentration
Topic: Spectroscopy
Published: 8/12/2006
Authors: Joseph Terence Hodges, D Lisak
Abstract: We present a portable spectrometer that uses the frequency-stabilized cavity ring-down spectroscopy technique to realize high-precision measurements of trace water vapor concentration. Measuring one of the strongest rovibrational transitions in the 1 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907264

36. Frequency-stabilized cavity ring-down spectroscopy measurements of carbon dioxide isotope ratios
Topic: Spectroscopy
Published: 5/15/2011
Authors: Joseph Terence Hodges, David A Long, Mitchio Okumura, Charles E Miller
Abstract: Carbon dioxide (CO2) isotopic ratios were measured at 1.6 μm through the use of frequency-stabilized cavity ring-down spectroscopy (FS-CRDS). We report the highest spectrum signal-to-noise ratios to date for CO2 transitions, with values as high ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907103

37. Grazing Incidence X-Ray Photoelectron Spectroscopy: A Method to Study Gate Dielectric Films on Si
Topic: Spectroscopy
Published: 11/1/2002
Authors: Terrence J Jach, E Landree
Abstract: Grazing Incidence X-ray Photoelectron Spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemistry of ultrathin gate dielectric films. It combines aspects of x-ray reflectivity and convent ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831285

38. Grazing Incidence X-Ray Photoemission Spectroscopy and the Accuracy of Thickness Measurements of CMOS Gate Dielectrics
Topic: Spectroscopy
Published: 8/1/2001
Authors: Terrence J Jach, E Landree
Abstract: Grazing incidence x-ray photoelectron spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemical state of ultrathin gate dielectric films. This method utilizes the non-linear dependence o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831227

39. High precision, broadband optical measurements with fiber laser frequency combs
Topic: Spectroscopy
Published: 11/2/2010
Authors: Nathan Reynolds Newbury, Ian R Coddington, Esther Baumann, Fabrizio Raphael Giorgetta, William C Swann, Alexander M. Zolot
Abstract: Optical frequency combs have been used extensively, and with remarkable success, to measure the absolute frequency of cw lasers. The use of frequency combs has also expanded to include applications such as precision ranging, component metrology, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907200

40. High resolution spectroscopy using fiber-laser frequency combs
Topic: Spectroscopy
Published: 6/8/2008
Authors: Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: The output of a femtosecond fiber laser can be both spectrally broadened and stabilized, thereby providing a broadband coherent source in the near infrared. In the frequency domain, the result is a frequency comb with frequency stabilities at the mil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32924



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series