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Displaying records 31 to 40 of 79 records.
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31. High-Precision Pressure Shifting Measurement Technique Using Frequency-Stabilized Cavity Ring-Down Spectroscopy
Topic: Spectroscopy
Published: 1/1/0008
Authors: D J Robichaud, Joseph Terence Hodges, D Lisak, Charles E Miller, Mitchio Okumura
Abstract: We describe a high-precision method for measuring pressure shifting of absorption lines. The technique involves the acquisition of high-resolution spectra using a cavity ring-down spectrometer whose length is continuously locked to a frequency-stabil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831000

32. High-Resolution Cavity Ring-Down Spectroscopy of H216O at 10687.36 cm-1
Topic: Spectroscopy
Published: 2/11/2004
Author: Joseph Terence Hodges
Abstract: We describe a frequency-stabilized cavity ring-down spectroscopy apparatus enabling high-resolution line shape measurements of water vapor. The measured line strength and broadening parameter for the H216O transition at 10687.36 cm-1 are compared to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830856

33. High-Speed Coherent Raman Fingerprint Imaging of Biological Tissues
Topic: Spectroscopy
Published: 7/20/2014
Authors: Charles H Camp, Young Jong Lee, John Michael Heddleston, Christopher Michael Hartshorn, Angela R Hight Walker, Jeremy N. Rich, Justin D. Lathia, Marcus T Cicerone
Abstract: We have developed a coherent Raman imaging platform using broadband coherent anti-Stokes Raman scattering (BCARS) that provides an unprecedented combination of speed, sensitivity, and spectral breadth. The system utilizes a unique configuration of la ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914850

34. Hybrid Bilayer Membranes in Air and Water: Infrared Spectroscopy and Neutron Reflectivity Studies
Topic: Spectroscopy
Published: 3/1/1998
Authors: Curtis W Meuse, S. Krueger, Charles F. Majkrzak, Joseph A. Dura, Jing Fu, J. T. Connor, Anne L Plant
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901632

35. Improved Normalization of Systematic Biases Affecting Ion Current Measurements in Label-free Proteomics Data
Topic: Spectroscopy
Published: 2/21/2014
Authors: Paul A Rudnick, Xinjian Yan, Stephen E Stein, Xia Wang, Nell Sedransk
Abstract: Systematic biases, or batch effects, in ,high-throughput‰ biological datasets can be described as obscuring variabilities introduced during experimental design or analytical processing. These biases, if left unresolved, can lead to misinterpreta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913822

36. In Situ Characterization of Gas-Phase Species Present During Hafnium Oxide Atomic Layer Deposition
Topic: Spectroscopy
Published: 1/1/2007
Authors: James E Maslar, Wilbur Scott Hurst, Donald R Burgess Jr., William Andrew Kimes, Nhan V Nguyen
Abstract: In this work, the species present in the gas phase during atomic layer deposition of hafnium oxide were investigated in an attempt to gain insight into the chemistry of this system. Hafnium oxide was deposited on a silicon substrate using tetrakis(e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830716

37. In Situ Gas Phase Measurements During Metal Alkylamide Atomic Layer Deposition
Topic: Spectroscopy
Published: 7/12/2011
Authors: James E Maslar, William Andrew Kimes, Brent A Sperling
Abstract: Metal alkylamide compounds, such as tetrakis(ethylmethylamido) hafnium (TEMAH), represent a technologically important class of metalorganic precursors for the deposition of metal oxides and metal nitrides via atomic layer deposition (ALD) or chemical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908672

38. Influence of Elastic-Electron Scattering on Measurements of Sillicon Dioxide Film Thicknesses by X-Ray Photoelectron Spectroscopy
Topic: Spectroscopy
Published: 9/1/2001
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We investigate the systematic error due to neglet of elastic scattering of photoelectrons in measurements of the thicknesses of thin films of SiO^d2^ on Si by x-ray photoelectron spectroscopy (XPS). Calulations were made of substrate Si 2p photoelec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831215

39. Microwave Spectrum of 1,2-Propanediol
Topic: Spectroscopy
Published: 9/1/2009
Authors: Francis John Lovas, David F Plusquellic, Brooks Pate, Justin L. Neill, Matt T. Muckle, Anthony J. Remijan
Abstract: The microwave spectrum of the sugar alcohol 1,2-propanediol (CH3CHOHCH2OH) has been measured over the frequency range 6.5 GHz to 25.0 GHz with several pulsed-beam Fourier-transform microwave spectrometers. Seven conformers of 1,2-propanediol have be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902388

40. Modifying electron transfer at the silicon-molecule interface using atomic tethers
Topic: Spectroscopy
Published: 12/10/2009
Author: Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907065



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