NIST logo

Publications Portal

You searched on:
Topic Area: Spectroscopy
Sorted by: date

Displaying records 61 to 70 of 104 records.
Resort by: Date / Title

61. Grazing Incidence X-Ray Photoemission Spectroscopy and the Accuracy of Thickness Measurements of CMOS Gate Dielectrics
Topic: Spectroscopy
Published: 8/1/2001
Authors: Terrence J Jach, E Landree
Abstract: Grazing incidence x-ray photoelectron spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemical state of ultrathin gate dielectric films. This method utilizes the non-linear dependence o ...

62. Measurement of 8-Hydroxy-2'-Deoxyadenosine In DNA by Liquid Chromatography/Mass Spectrometry
Topic: Spectroscopy
Published: 8/1/2001
Authors: Pawel Jaruga, H Rodriguez, M Miral Dizdar
Abstract: 8-Hydroxyadenine (8-OH-Ade) is one of the major lesions, which is formed in DNA by hydroxyl radical attack on the C-8 position of adenine followed by oxidation. We describe the measurement of the nucleoside form of this compound, 8-hydroxy-2'-deoxyad ...

63. Effects of Elastic-Electron Scattering on Measurements of Silicon Dioxide Film Thicknesses by X-Ray Photoelectron Spectroscopy
Topic: Spectroscopy
Published: 3/1/2001
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: It is now customary for the effects of elastic-electron scattering to be ignored in measurements of the thicknesses of overlayer films by X-ray photoelectron spectroscopy (XPS). It is known, however, that elastic scattering can cause the effective a ...

64. NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
Topic: Spectroscopy
Published: 3/1/2001
Authors: Cedric John Powell, Aleksander Jablonski, A Naumkin, A Kraut-Vass, Joseph M Conny, J R. Rumble
Abstract: A description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for x-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy. NIST currently has three databases available: an ...

65. Current Projects of ISO Technical Committee 201 on Surface Chemical Analysis
Topic: Spectroscopy
Published: 2/1/2001
Author: Cedric John Powell
Abstract: An overview is given of current work projects of Technical Committee 201 on Surface Chemical Analysis of the International Organization for Standardization (ISO). ISTO/TC 201 has subcommittees for Auger electron spectroscopy (AES), secondary ion mas ...

66. Nonequilibrium Theory of Scanning Tunneling Spectroscopy via Adsorbate Resonances: Nonmagnetic and Kondo Impurities
Topic: Spectroscopy
Published: 2/1/2001
Authors: M Plihal, John William Gadzuk
Abstract: We report on a fully nonequilibrium theory of the scanning tunneling microscopy (STM) through resonances induced by impurity atoms adsorbed on metal surfaces. The theory takes into account the effect of the tunneling current and finite bias on the sy ...

67. Articles- Correlation of the Raman Spectra with the Thermal Conductivity of a Set of CVD Diamond Wefers
Topic: Spectroscopy
Published: 1/1/2001
Authors: E S. Etz, A Feldman, Wilbur S. Hurst
Abstract: Reported are the results of a Raman spectroscopic study of a set of chemical-vapor-deposited (CVD) diamond wafers of known thermal conductivity (k). The spectra are obtained at laser wavelengths 514.5, 785 and 1064 nm. The Raman features of these spe ...

68. Characterization of Silicon-Oxynitride Dielectric Thin Films Using Grazing Incidence X-ray Photoelectron Spectroscopy
Topic: Spectroscopy
Published: 1/1/2001
Authors: E Landree, Terrence J Jach, D Brady, A. Karamcheti, J Canterbury, W Chism, A C Diebold
Abstract: To achieve the future goals for logic device dielectric film thickness and composition metrology, a set of well-characterized calibration reference material standards are needed for validating real-time diagnostic techniques used during production. ...

69. Resonance Tunneling of Field Emitted Electrons Through Adsorbates on Metal Surfaces
Series: Special Publication (NIST SP)
Report Number: 958
Topic: Spectroscopy
Published: 1/1/2001
Author: John William Gadzuk
Abstract: The NBS involvement in the development of single atom electron spectroscopy at surfaces, as realized in field emission resonance tunneling and reported in the seminal paper by E.W. Plummer, J.W. Gadzuk and R.D. Young is described.

70. Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy III. Errors With Different Curve-Fitting Approaches
Topic: Spectroscopy
Published: 12/1/2000
Authors: Joseph M Conny, Cedric John Powell
Abstract: We present results in the final part of a three-part of a three-part study employing standard test data (STD) to estimate errors in peak parameters derived from data analysis procedures used in x-ray photoelectron spectroscopy (XPS). XPS-STD are sim ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series