NIST logo

Publications Portal

You searched on: Topic Area: Spectroscopy Sorted by: date

Displaying records 81 to 86.
Resort by: Date / Title

81. Raman Microprobe Study of the Visible and Near-Infrared Excited Fluorescence Spectra of Glasses Examined as Potential Raman Intensity Calibration Standards
Topic: Spectroscopy
Published: 2/12/1998
Authors: E S. Etz, Steven J Choquette, Wilbur Scott Hurst, Douglas H. Blackburn

82. Moving spectroelectrochemical cell for surface Raman spectroscopy
Topic: Spectroscopy
Published: 12/1/1997
Authors: G Niaura, Adolfas Kastytis Gaigalas, V L. Vilker

83. Surface-enhanced Raman spectroscopy of phosphate anions: Adsorption on silver, gold, and copper electrodes
Topic: Spectroscopy
Published: 11/6/1997
Authors: G Niaura, Adolfas Kastytis Gaigalas, V L. Vilker

84. Spectroscopic Real-Time Ellipsometry of Putidaredoxin Adsorption on Gold Electrodes
Topic: Spectroscopy
Published: 6/25/1997
Authors: Vytautas Reipa, Adolfas Kastytis Gaigalas, V L. Vilker

85. Adsorption of Phosphate Anions on Gold Electrodes Modified by Underpotentially Deposited Silver Adatoms: Surface-Enhanced Raman Spectroscopy Study
Topic: Spectroscopy
Published: 5/4/1997
Authors: G Niaura, Adolfas Kastytis Gaigalas, V L. Vilker

86. High-Precision Pressure Shifting Measurement Technique Using Frequency-Stabilized Cavity Ring-Down Spectroscopy
Topic: Spectroscopy
Published: 1/1/0008
Authors: D J Robichaud, Joseph Terence Hodges, D Lisak, Charles E Miller, Mitchio Okumura
Abstract: We describe a high-precision method for measuring pressure shifting of absorption lines. The technique involves the acquisition of high-resolution spectra using a cavity ring-down spectrometer whose length is continuously locked to a frequency-stabil ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series