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You searched on: Topic Area: Spectroscopy

Displaying records 61 to 70 of 82 records.
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61. The NIST Electron Effective-Attenuation-Length Database
Series: OTHER
Topic: Spectroscopy
Published: 2/1/2002
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: The NIST Electron Effective-Attenuation-Length Database provides values of electron effective attenuation lengths (EALs) in solid elements and compounds at selected electron energies between 50 eV and 2,000 eV. The database was designed mainly to pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831244

62. Influence of Elastic-Electron Scattering on Measurements of Sillicon Dioxide Film Thicknesses by X-Ray Photoelectron Spectroscopy
Topic: Spectroscopy
Published: 9/1/2001
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We investigate the systematic error due to neglet of elastic scattering of photoelectrons in measurements of the thicknesses of thin films of SiO^d2^ on Si by x-ray photoelectron spectroscopy (XPS). Calulations were made of substrate Si 2p photoelec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831215

63. Comparisons of Calculated and Measured Effective Attenuation Lengths for Silicon Dioxide Over a Wide Electron Energy Range
Topic: Spectroscopy
Published: 8/1/2001
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We report calculations of effective attenuation lengths (EALs) for Si 2p photoelectrons in silicon dioxide at photoelectron energies between 82 and 1385 eV. These EALs are compared with measured values reported recently by Shimada et al. [Surf. Inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831218

64. Current Projects of ISO Technical Committee 201 on Surface Chemical Analysis
Topic: Spectroscopy
Published: 2/1/2001
Author: Cedric John Powell
Abstract: An overview is given of current work projects of Technical Committee 201 on Surface Chemical Analysis of the International Organization for Standardization (ISO). ISTO/TC 201 has subcommittees for Auger electron spectroscopy (AES), secondary ion mas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831198

65. Characterization of Silicon-Oxynitride Dielectric Thin Films Using Grazing Incidence X-ray Photoelectron Spectroscopy
Topic: Spectroscopy
Published: 1/1/2001
Authors: E Landree, Terrence J Jach, D Brady, A. Karamcheti, J Canterbury, W Chism, A C Diebold
Abstract: To achieve the future goals for logic device dielectric film thickness and composition metrology, a set of well-characterized calibration reference material standards are needed for validating real-time diagnostic techniques used during production. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831214

66. Cytochrome c at Model Membrane Surfaces: Exploration via Second Harmonic Generation - Circular Dichroism and Surface-Enhanced Resonance Raman Spectroscopy
Topic: Spectroscopy
Published: 7/11/2000
Authors: T Petralli-Mallow, Anne L Plant, M Lewis, J Hicks
Abstract: The novel nonlinear optical method second harmonic generation-circular dichroism (SHG-CD) has been used to follow the adsorption and redox properties of a peripheral membrane protein horse heart cytochrome c, adsorbed at several model membrane surfac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830091

67. Evaluation of Electron Inelastic Mean Free Paths for Selected Elements and Compounds
Topic: Spectroscopy
Published: 2/1/2000
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We have performed an evaluation of calculated and measured electron inelastic mean free paths (IMFPs) for selected materials and for electron energies between 50 eV and 10,000 eV. This evaluation is based on IMFPs calculated from experimental optica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831121

68. Single-Mode Cavity Ring-Down Spectroscopy for Line Shape Measurements
Topic: Spectroscopy
Published: 12/1/1999
Authors: J P. Looney, Roger D van Zee, Joseph Terence Hodges
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100628

69. Reorientation of Tetradecylmethylviologen on Gold Upon Co-Adsorption of Decanethiol and its Medition of Electron Transfer to Nitrate Reductase
Topic: Spectroscopy
Published: 11/9/1999
Authors: Vytautas Reipa, S L Yeh, H G Monbouquette, V L. Vilker
Abstract: Decanethiol was coadsorbed with tetradecylmethyl viologen (C^d14^MV; 1-Methyl-1 -tetradecyl-4,4 -bipyridinium chloride) on gold electrodes in order to improve stability of C^d14^MV as an electrochemical mediator for coupling to nitrate reductase enzy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830056

70. Comparison of Backbone Dynamics of Oxidized and Reduced Putidaredoxin by ^u15^N NMR Relaxation Measurements
Topic: Spectroscopy
Published: 8/3/1999
Authors: Fahriye Nese Sari, Marcia J Holden, M P. Mayhew, V L. Vilker, B Coxon
Abstract: The backbone dynamics of uniformly ^u15^N-labeled reduced and oxidized putidaredoxin (Pdx) have been studied by 2D ^u15^N NMR relaxation measurements. ^u15^N T^d1^ and T^d2^ values and ^u1^H-^u15^N NOE s have been measured for the diamagnetic region ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830085



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