Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Spectroscopy

Displaying records 51 to 60 of 94 records.
Resort by: Date / Title


51. Spectrum Simulation in DTSA-II
Report Number: 832430
Topic: Spectroscopy
Published: 10/1/2009
Author: Nicholas W m Ritchie
Abstract: Spectrum simulation is a useful practical and pedagogical tool. Particularly with complex samples or trace constituents, a simulation can help to understand the limits of the technique and how to optimize the tools for the optimal measurement. DTSA- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832430

52. Application of Histograms in Evaluation of Large Collections of Gas Chromatographic Retention Indices
Topic: Spectroscopy
Published: 9/18/2009
Authors: Zenkevich G. Igor, Valeri Ivan Babushok, Peter J Linstrom, Edward White, Stephen E Stein
Abstract: The effective use of gas chromatographic retention data presented in the form of reten¬tion indices (RI) requires the development of a compre¬hensive structure-based digital archive of retention parameters. Development of such an archive includes the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902129

53. Microwave Spectrum of 1,2-Propanediol
Topic: Spectroscopy
Published: 9/1/2009
Authors: Francis John Lovas, David F Plusquellic, Brooks Pate, Justin L. Neill, Matt T. Muckle, Anthony J. Remijan
Abstract: The microwave spectrum of the sugar alcohol 1,2-propanediol (CH3CHOHCH2OH) has been measured over the frequency range 6.5 GHz to 25.0 GHz with several pulsed-beam Fourier-transform microwave spectrometers. Seven conformers of 1,2-propanediol have be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902388

54. Scaling Factors and Uncertainties for ab Initio Anharmonic Vibrational Frequencies
Topic: Spectroscopy
Published: 8/21/2009
Authors: Russell D Johnson III, Karl K Irikura, Raghu N Kacker, Ruediger Kessel
Abstract: To predict the vibrational spectra of molecules, ab initio calculations are often used to compute harmonic frequencies, which are usually scaled by empirical factors as an approximate correction for errors in the force constants and for anharmonic ef ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903585

55. Procedures for Wavelength Calibration and Spectral Response Correction of CCD Array Spectrometers
Topic: Spectroscopy
Published: 7/31/2009
Authors: Adolfas Kastytis Gaigalas, Lili Wang, Hua-Jun He, Paul C DeRose
Abstract: This work describes a procedure for acquiring a spectrum of an analyte over an extended range of wavelengths and validating the wavelength and intensity assignments. To acquire a spectrum over an extended range of wavelengths with a spectrometer with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901204

56. Progress in Quantitative Surface Analysis by X-ray Photoelectron Spectroscopy: Current Status and Perspectives
Topic: Spectroscopy
Published: 5/14/2009
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We give a survey of information needed for quantitative surface analyses by X-ray photoelectron spectroscopy (XPS). We describe four terms (the inelastic mean free path, the effective attenuation length, the mean escape depth, and the information dep ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902115

57. Spectroscopic Line Parameters of Water Vapor for Rotation-Vibration Transitions near 7180 cm^(-1)
Topic: Spectroscopy
Published: 5/13/2009
Authors: Daniel Lisak, Daniel K. Havey, Joseph Terence Hodges
Abstract: We present low uncertainty measurements of line parameters for fifteen rotation-vibration transitions of water vapor in the wave number range 7170.27 cm^(-1) to 7183.02 cm^(-1). These experiments incorporated frequency-stabilized cavity ring-down spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901894

58. Characterization of Standard Reference Material 2940, Mn-Ion-Doped Glass, Spectral Correction Standard for Fluorescence
Topic: Spectroscopy
Published: 4/1/2009
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Douglas H. Blackburn, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2940 is a cuvette-shaped, Mn-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance validation of steady-state fluorescence spectrometers. Properties of this stan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832237

59. Semi-Classical Line Shape Models of Rovibrational H2O Spectra Tested Using Frequency-Stabilized Cavity Ring-Down Spectroscopy
Topic: Spectroscopy
Published: 6/20/2008
Authors: Joseph Terence Hodges, Daniel Lisak, R. Ciurylo
Abstract: In this work we present a brief review of recent results for water line shapes obtained by means of the frequency stabilized cavity ring-down spectroscopy (FS-CRDS) technique. We demonstrate its ability to enable precise spectroscopic measurements o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832397

60. Characterization of Standard Reference Material 2941, Uranyl-Ion-Doped Glass, Spectral Correction Standard for Fluorescence
Topic: Spectroscopy
Published: 2/1/2008
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Douglas H. Blackburn, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2941 is a cuvette-shaped, uranyl-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance validation of fluorescence spectrometers. Properties of this standard that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830546



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series