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You searched on: Topic Area: Spectroscopy

Displaying records 51 to 60 of 79 records.
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51. Frequency-stabilized cavity ring-down spectrometer for high-sensitivity measurements of water vapor concentration
Topic: Spectroscopy
Published: 8/12/2006
Authors: Joseph Terence Hodges, D Lisak
Abstract: We present a portable spectrometer that uses the frequency-stabilized cavity ring-down spectroscopy technique to realize high-precision measurements of trace water vapor concentration. Measuring one of the strongest rovibrational transitions in the 1 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907264

52. Frequency-Stabilized Cavity Ring-Down Spectrometer for High-Sensitivity Measurements of Water Vapor Concentration
Topic: Spectroscopy
Published: 1/1/2006
Authors: Joseph Terence Hodges, Daniel Lisak
Abstract: We present a portable spectrometer that uses the frequency-stabilized cavity ring-down spectroscopy technique to realize high-precision measurements of trace water vapor concentration. Measuring one of the strongest rovibrational transitions in the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830970

53. Ultrafast Transient THz Spectroscopy of Azobenzene
Topic: Spectroscopy
Published: 1/1/2005
Authors: Okan Esenturk, Edwin J Heilweil
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104459

54. Structure of Polystyrene at the Interface With Various Liquids
Topic: Spectroscopy
Published: 9/4/2004
Authors: Clayton S. Yang, P T. Wilson, Lee J Richter
Abstract: Vibrationally resonant sum frequency generation (VR-SFG) is used to determine the structure of the phenyl side groups of deuterated polystyrene at the liquid/solid interface for the nonsolvent liquids: hexane, methanol, ethanol, glycerol, and water. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831332

55. High-Resolution Cavity Ring-Down Spectroscopy of H216O at 10687.36 cm-1
Topic: Spectroscopy
Published: 2/11/2004
Author: Joseph Terence Hodges
Abstract: We describe a frequency-stabilized cavity ring-down spectroscopy apparatus enabling high-resolution line shape measurements of water vapor. The measured line strength and broadening parameter for the H216O transition at 10687.36 cm-1 are compared to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830856

56. Grazing Incidence X-Ray Photoelectron Spectroscopy: A Method to Study Gate Dielectric Films on Si
Topic: Spectroscopy
Published: 11/1/2002
Authors: Terrence J Jach, E Landree
Abstract: Grazing Incidence X-ray Photoelectron Spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemistry of ultrathin gate dielectric films. It combines aspects of x-ray reflectivity and convent ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831285

57. On the Application of Quantitative Cavity Ring Down Spectroscopy to Measruements of Line Shapes and Continuum Absorption
Topic: Spectroscopy
Published: 6/7/2002
Authors: J G. Cormier, Joseph Terence Hodges, J R Drummond
Abstract: Cavity ringdown spectroscopy (CRDS) is a highly sensitive spectroscopic technique that has been successfully applied to problems such as trace gas detection and the observation of weak spectra. Despite possessing several intrinsic advantages over oth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830795

58. The NIST Electron Effective-Attenuation-Length Database
Series: OTHER
Topic: Spectroscopy
Published: 2/1/2002
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: The NIST Electron Effective-Attenuation-Length Database provides values of electron effective attenuation lengths (EALs) in solid elements and compounds at selected electron energies between 50 eV and 2,000 eV. The database was designed mainly to pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831244

59. Influence of Elastic-Electron Scattering on Measurements of Sillicon Dioxide Film Thicknesses by X-Ray Photoelectron Spectroscopy
Topic: Spectroscopy
Published: 9/1/2001
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We investigate the systematic error due to neglet of elastic scattering of photoelectrons in measurements of the thicknesses of thin films of SiO^d2^ on Si by x-ray photoelectron spectroscopy (XPS). Calulations were made of substrate Si 2p photoelec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831215

60. Comparisons of Calculated and Measured Effective Attenuation Lengths for Silicon Dioxide Over a Wide Electron Energy Range
Topic: Spectroscopy
Published: 8/1/2001
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We report calculations of effective attenuation lengths (EALs) for Si 2p photoelectrons in silicon dioxide at photoelectron energies between 82 and 1385 eV. These EALs are compared with measured values reported recently by Shimada et al. [Surf. Inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831218



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