NIST logo

Publications Portal

You searched on:
Topic Area: Spectroscopy

Displaying records 41 to 50 of 109 records.
Resort by: Date / Title


41. Scaling Factors and Uncertainties for ab Initio Anharmonic Vibrational Frequencies
Topic: Spectroscopy
Published: 8/21/2009
Authors: Russell D Johnson III, Karl K Irikura, Raghu N Kacker, Ruediger Kessel
Abstract: To predict the vibrational spectra of molecules, ab initio calculations are often used to compute harmonic frequencies, which are usually scaled by empirical factors as an approximate correction for errors in the force constants and for anharmonic ef ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903585

42. Procedures for Wavelength Calibration and Spectral Response Correction of CCD Array Spectrometers
Topic: Spectroscopy
Published: 7/31/2009
Authors: Adolfas Kastytis Gaigalas, Lili Wang, Hua-Jun He, Paul C DeRose
Abstract: This work describes a procedure for acquiring a spectrum of an analyte over an extended range of wavelengths and validating the wavelength and intensity assignments. To acquire a spectrum over an extended range of wavelengths with a spectrometer with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901204

43. Progress in Quantitative Surface Analysis by X-ray Photoelectron Spectroscopy: Current Status and Perspectives
Topic: Spectroscopy
Published: 5/14/2009
Authors: Cedric John Powell, Aleksander Jablonski
Abstract: We give a survey of information needed for quantitative surface analyses by X-ray photoelectron spectroscopy (XPS). We describe four terms (the inelastic mean free path, the effective attenuation length, the mean escape depth, and the information dep ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902115

44. Spectroscopic Line Parameters of Water Vapor for Rotation-Vibration Transitions near 7180 cm^(-1)
Topic: Spectroscopy
Published: 5/13/2009
Authors: Daniel Lisak, Daniel K. Havey, Joseph Terence Hodges
Abstract: We present low uncertainty measurements of line parameters for fifteen rotation-vibration transitions of water vapor in the wave number range 7170.27 cm^(-1) to 7183.02 cm^(-1). These experiments incorporated frequency-stabilized cavity ring-down spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901894

45. Characterization of Standard Reference Material 2940, Mn-Ion-Doped Glass, Spectral Correction Standard for Fluorescence
Topic: Spectroscopy
Published: 4/1/2009
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Douglas H. Blackburn, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2940 is a cuvette-shaped, Mn-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance validation of steady-state fluorescence spectrometers. Properties of this stan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832237

46. High resolution spectroscopy using fiber-laser frequency combs
Topic: Spectroscopy
Published: 6/8/2008
Authors: Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: The output of a femtosecond fiber laser can be both spectrally broadened and stabilized, thereby providing a broadband coherent source in the near infrared. In the frequency domain, the result is a frequency comb with frequency stabilities at the mil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32924

47. Broadband, frequency comb spectroscopy
Topic: Spectroscopy
Published: 5/4/2008
Authors: Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: A stabilized frequency comb provides a broadband array of highly resolved comb lines. Using a multiheterodyne technique, we measure the amplitude and phase of every comb line, allowing for massively parallel, high-resolution spectroscopy.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32960

48. Characterization of Standard Reference Material 2941, Uranyl-Ion-Doped Glass, Spectral Correction Standard for Fluorescence
Topic: Spectroscopy
Published: 2/1/2008
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Douglas H. Blackburn, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2941 is a cuvette-shaped, uranyl-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance validation of fluorescence spectrometers. Properties of this standard that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830546

49. Experimental Line Parameters of the Oxygen A-Band Using Frequency-Stabilized Cavity Ring-Down Spectroscopy
Topic: Spectroscopy
Published: 1/1/2008
Authors: D J Robichaud, Joseph Terence Hodges, Linda R. Brown, D Lisak, Piotr Maslowski, Charles E Miller
Abstract: Line intensities, self- and air-broadened linewidths, pressure-induced shifts, and collisional narrowing coefficients were measured from 18 <= J' <= 32 in the P branch of the O2 A-band (12,975 13,055 cm^(-1)). Spectra were recorded using the freque ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831008

50. Characterization of 3-Color CARS in a 2-Pulse Broadband CARS Spectrum
Topic: Spectroscopy
Published: 11/15/2007
Authors: Young Jong Lee, Marcus T Cicerone, Yuexin Liu
Abstract: We present a new and simple approach to broadband coherent anti-Stokes Raman scattering (CARS) microscopy that yields background-free vibrational spectra. We present evidence for a mechanism where two different frequency components in a continuum pul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852761



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series