NIST logo

Publications Portal

You searched on:
Topic Area: Spectroscopy

Displaying records 11 to 20 of 115 records.
Resort by: Date / Title


11. To Predict Vibrational Spectra, Are Anharmonic Calculations Worthwhile?
Topic: Spectroscopy
Published: 1/22/2013
Authors: Ruth Lafuente Jacobsen, Karl K Irikura, Russell D Johnson III, Raghu N Kacker
Abstract: Anharmonic calculations using vibrational perturbation theory are known to provide near-spectroscopic accuracy when combined with high-level ab initio potential energy functions. However, performance with economical, popular electronic structure meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911024

12. Further Studies with Isolated Absolute Infrared Spectra of Bacteriorhodopsin Photocycle Intermediates: Conformational Changes and Possible Role of a New Proton-Binding Center
Topic: Spectroscopy
Published: 1/1/2013
Authors: Richard W Hendler, Curtis W Meuse, Paul Smith, John W Kakareka
Abstract: We recently published procedures describing the isolation of absolute infrared spectra for the intermediates of the bacteriorhodopsin (BR) photocycle and from these, obtaining transitional difference spectra between consecutive intermediates. In t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916138

13. Controlling Thermochromism in a Photonic Block Copolymer Gel
Topic: Spectroscopy
Published: 9/26/2012
Authors: Joseph J Walish, Yin Fan , Andrea Centrone, Edwin L. Thomas
Abstract: Controlling the color via temperature-induced changes of self-assembled photonic materials is important for their application in sensors and displays. The thermochromic behavior of a PS-P2VP photonic gel was studied (UV-VIS, FTIR) and found to origin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910499

14. Measurement of H2O-Broadening of O2 A-band Transitions and Implications for Atmospheric Remote Sensing
Topic: Spectroscopy
Published: 3/27/2012
Authors: E. M. Vess, C. J. Wallace, H. M. Campbell, V. E. Awadalla, Joseph Terence Hodges, David A Long, D. K. Havey
Abstract: We present laboratory measurements of H2O-broadened 16O2 A-band ( ) absorption spectra acquired with a laser-based photoacoustic spectroscopy method. This absorption band is widely used in a variety of high-precision atmospheric remote sensing appli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910528

15. Predictive Gold Nanocluster Formation Controlled by Metal-Ligand Complexes
Topic: Spectroscopy
Published: 1/9/2012
Authors: John M Pettibone, Jeffrey W Hudgens
Abstract: The formation of ligand-protected transition metal nanoclusters in size-selective syntheses is driven by the inherent properties of the protecting ligands. We have previously reported the selective, monodisperse product formation of phosphine protect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908225

16. Charaterization of Standard Reference Material 2943, Cu-Ion-Doped Glass, Spectral Correction Standard for Blue Fluorescence
Topic: Spectroscopy
Published: 12/1/2011
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Jeffrey R. Anderson, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2943 is a cuvette-shaped, Cu0ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance verification of steady-state florescence spectrometers. Properties of this st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907361

17. Compton Scattering Artifacts in Electron Excited X-ray Spectra Measured with a Silicon Drift Detector
Topic: Spectroscopy
Published: 12/1/2011
Authors: Nicholas W m Ritchie, Dale E Newbury, Abigail P. Lindstrom
Abstract: Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive x-ray spectrometry. Peaks which result from non-ideal behavior in the detector or sample can fool even an experience microanalyst into believing that they have ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907003

18. Structural and electrical properties of Flip Chip Laminated metal-molecule-silicon structures modifying molecular backbone and atomic tether
Topic: Spectroscopy
Published: 10/19/2011
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
Abstract: The formation of electrical contacts on organic molecules preserving their integrity and using a scalable technique is a key step toward the fabrication of molecular electronic devices. Here we study the structural and electrical properties of metal- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906090

19. Rotationally Resolved C2 Symmetric Conformers of Bis-(4-hydroxyphenyl)methane: Textbook Examples of Excitonic Coupling in the S1 and S2 Electronic States
Topic: Spectroscopy
Published: 9/1/2011
Authors: Shin G. Chou, Chirantha P. Rodrigo, Christian Muller, Kevin O Douglass, Timothy Zwier, David F Plusquellic
Abstract: Rotationally resolved microwave and ultraviolet spectra of jet-cooled bis-4 hydroxy)-diphenylmethane (b4HBM) have been obtained using Fourier-transform microwave and UV laser/molecular beam spectrometers. A recent vibronic level study of b4HPM1 has ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907835

20. In Situ Gas Phase Measurements During Metal Alkylamide Atomic Layer Deposition
Topic: Spectroscopy
Published: 7/12/2011
Authors: James E Maslar, William Andrew Kimes, Brent A Sperling
Abstract: Metal alkylamide compounds, such as tetrakis(ethylmethylamido) hafnium (TEMAH), represent a technologically important class of metalorganic precursors for the deposition of metal oxides and metal nitrides via atomic layer deposition (ALD) or chemical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908672



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series