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Topic Area: Gas Metrology

Displaying records 11 to 20 of 29 records.
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11. The Electric And Magnetic Susceptibilities Of Gaseos Oxygen: Comparisons Of New Measurements and Modern Theory
Topic: Gas Metrology
Published: 9/25/2008
Authors: Michael R Moldover, E May, James W Schmidt
Abstract: We used a cross capacitor to measure the relative dielectric permittivity {epsilon}^dr^ of O^d2^ at 273 K, 293 K, and 323 K and at pressures up to 6.5 MPa. Simultaneously we measured oxygen's complex refractive index {I}n{/I} using a quasi-spheri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832266

12. Natural Gas Flow Calibration Service
Series: Special Publication (NIST SP)
Topic: Gas Metrology
Published: 8/1/2008
Author: Aaron N Johnson
Abstract: This document describes NIST's high pressure natural gas flow calibration service (NGFCS). Flow calibrations are conducted offsite at the Colorado Experimental Engineering Station Incorporated (CEESI) in Garner, Iowa. A parallel array of nine tur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832323

13. Shear Thinning Near the Critical Point of Xenon
Topic: Gas Metrology
Published: 4/17/2008
Authors: Robert F Berg, Michael R Moldover, M Yao, G A Zimmerli
Abstract: We measured shear thinning, a viscosity decrease ordinarily associated with complex liquids, near the critical point of xenon. The data span the range of reduced shear rates: 0.001 < {gamma}{tau} < 700, where {gamma}{tau} is the shear rate scal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830987

14. Reference Viscosities of H^d2^, CH^d4^, Ar and Xe at Low Densities
Topic: Gas Metrology
Published: 8/1/2007
Authors: E May, Robert F Berg, Michael R Moldover
Abstract: We determined the zero-density viscosity eta of hydrogen, methane and argon in the temperature range 200 K to 400 K, with standard uncertainties of 0.084 % for hydrogen and argon and 0.096 % for methane. These uncertainties are dominated by the unce ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830996

15. The Polarizability of Helium and Gas Metrology
Topic: Gas Metrology
Published: 6/22/2007
Authors: James W Schmidt, R Gavioso, E May, Michael R Moldover
Abstract: Using a quasi-spherical, microwave cavity resonator, we measured the refractive index of helium to deduce its molar polarizability {I}A{/I}^d{epsilon}^ in the limit of zero density. We obtained ({I}A{/I}^d{epsilon},meas^ - {I}A{/I}^d{epsilon},theory^ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830993

16. Long-Term Stability of Hydrocarbons in NIST Gas Standard Reference Material (SRM) 1800
Topic: Gas Metrology
Published: 8/2/2005
Author: George C Rhoderick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903529

17. Gas Standards Containing Hydrocarbon and Volatile Organic Compounds for Automobile Exhaust and Ambient Air Monitoring
Topic: Gas Metrology
Published: 8/1/2003
Author: George C Rhoderick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903394

18. Advances in Optical Methods for Trace Gas Analysis
Topic: Gas Metrology
Published: 5/1/2003
Author: Pamela M Chu
Abstract: The fundamental principles for chemical analysis by optical methods are established. However, only recent advances in instrumentation and spectroscopic techniques have substantially expended the feasibility of routine spectroscopic analysis of gaseo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830384

19. Final Report on Key Comparison CCQM-K10: Benzene,Toluene, o-Xylene in Nitrogen
Topic: Gas Metrology
Published: 8/1/2002
Authors: Franklin R Guenther, George C Rhoderick, A Marschal, A Medem, K Kato, G S Heo, E.W.B. de Leer, A Baldan, T L Hafkenscheid, G N Nieuwenkamp, A.M.H. van der Veen, L Konopelko, C Brookes, H D'Souza, M J T Milton
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903512

20. Final Report on Key Comparison CCQM-K7: Benzene,Toluene, m-Xylene, o-Xylene and Ethylbenzene in Nitrogen
Topic: Gas Metrology
Published: 8/1/2002
Authors: Franklin R Guenther, George C Rhoderick, Walter R Miller Jr, A Marschal, A Medem, K Kato, H.-Y. So, E.W.B. de Leer, A Baldan, T L Hafkenscheid, G N Nieuwenkamp, A.M.H. van der Veen, L Konopelko, M J T Milton
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903511