NIST logo

Publications Portal

You searched on: Topic Area: Chemical Analysis Sorted by: date

Displaying records 11 to 20 of 99 records.
Resort by: Date / Title


11. The Development and Implementation of Quality Assurance Programs to Support Nutritional Measurements
Topic: Chemical Analysis
Published: 5/24/2013
Authors: Lane C Sander, Mary Bedner, David Lee Duewer, Katrice A Lippa, Melissa Meaney Phillips, Karen W Phinney, Catherine A Rimmer, Michele M Schantz, Katherine E Sharpless, Susan Shu Cheng Tai, Jeanice M Brown Thomas, Stephen A Wise, Laura J Wood, J. M. Betz, Paul M Coates
Abstract: The National Institute of Standards and Technology administers quality assurance programs devoted to improving measurements of nutrients and related metabolites in foods, dietary supplements, and serum and plasma samples. These programs have been de ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912409

12. DNA Purification From Crude Samples for Human Identification Using Gradient Elution Isotachophoresis
Topic: Chemical Analysis
Published: 5/23/2013
Authors: Elizabeth A Strychalski, Christopher Konek, Erica L Romsos, Peter M Vallone, Alyssa Henry, David J Ross
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913391

13. Chemical imaging beyond the diffraction limit using photothermal induced resonance microscopy
Topic: Chemical Analysis
Published: 4/2/2013
Authors: Andrea Centrone, Basudev Lahiri, Glenn E Holland
Abstract: Photo Thermal Induced Resonance (PTIR), recently attracted great interest for enabling chemical identification and imaging with nanoscale resolution. In this paper, the PTIR working principles are reviewed along the main results from a recent publica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913386

14. Discriminating the states of matter in metallic nanoparticle transformations: What are we missing?
Topic: Chemical Analysis
Published: 2/20/2013
Authors: John M Pettibone, Julien C. Gigault, Vincent A Hackley
Abstract: A limiting factor in assessing the risk of current and emerging nanomaterials in biological and environmental systems is the ability to accurately detect and characterize their size, shape and composition in broad distributions and complex media. Asy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913009

15. Chemical Imaging Beyond the Diffraction Limit: Experimental Validation of the PTIR Technique
Topic: Chemical Analysis
Published: 2/11/2013
Authors: Basudev Lahiri, Glenn E Holland, Andrea Centrone
Abstract: Photo Thermal Induced Resonance (PTIR), recently attracted great interest for enabling chemical identification and imaging with nanoscale resolution. In this work, electron beam nano-patterned polymer samples were fabricated directly on 3-dimentional ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911012

16. Weathering Patterns of Ignitable Liquids with the Advanced Distillation Curve Method
Series: Journal of Research (NIST JRES)
Report Number: 118.003
Topic: Chemical Analysis
Published: 1/17/2013
Authors: Samuel Allen, Thomas J Bruno
Abstract: One can take advantage of the striking similarity of ignitable liquid vaporization (or weathering) patterns and the separation observed during distillation to predict the composition of residual compounds in fire debris. This is done with the ad ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907398

17. NIST/NIH Vitamin D Metabolites Quality Assurance Program Report of Participant Results: Winter 2010 Compatibility Study (Exercise 1)
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7890
Topic: Chemical Analysis
Published: 12/21/2012
Authors: Mary Bedner, Katrice A Lippa
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911152

18. Nanoscale Specific Heat Capacity Measurements Using Optoelectronic Bilayer Microcantilevers
Topic: Chemical Analysis
Published: 12/12/2012
Authors: Brian G. (Brian Gregory) Burke, William A Osborn, Richard Swift Gates, David A LaVan
Abstract: We describe a new technique for optically and electrically detecting and heating bilayer microcantilevers (Pt−SiNx) to high temperatures at fast heating rates for nanoscale specific heat capacity measurements. The bilayer microcantilever acts s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912233

19. East versus West: Organic Contaminant Differences in Brown Pelican (Pelecanus occidentalis) Eggs from South Carolina, USA and the Gulf of California, Mexico
Topic: Chemical Analysis
Published: 11/1/2012
Authors: Stacy S Vander Pol, Daniel W. Anderson, Patrick G. R. Jodice, Joyce E. Stuckey
Abstract: Brown pelicans (Pelecanus occidentalis) were listed as endangered in the United States in 1970, largely due to reproductive failure and mortality caused by organochlorine contaminants, such as DDT. The southeast population, P.o. carolinensis, was del ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906950

20. Radio-microanalytical particle measurements method and application to Fukushima aerosols collected in Japan
Topic: Chemical Analysis
Published: 8/26/2012
Authors: Cynthia J Zeissler, Lawrence Forsley, Richard Mark Lindstrom, Sean Newsome, Adrean Kirk, P.A. Mosier-Boss
Abstract: A nondestructive analytical method based on autoradiography and gamma spectrometry was developed to perform activity distribution analysis for particulate samples. This was applied to aerosols collected in Fukushima Japan, 40 km north of the Daiich ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911065



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series