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41. Demonstrating a High Symmetric Single-Photon Heralding Efficiency in Spontaneous Parametric Downconversion
Topic: Physics
Published: 5/6/2013
Authors: Marcelo Pereira, Francisco E. Becerra Chavez, Boris L. Glebov, Jingyun Fan, Sae Woo Nam, Alan L Migdall
Abstract: We demonstrate a symmetric, single-spatial mode, single-photon heralding efficiency of 84% for a type-II spontaneous parametric downconversion process. This achievement of high efficiency, single-spatial mode collection is key to enabling many quantu ...

42. Density functional theory study of clean, hydrated, and defective alumina (1-102) surfaces
Topic: Physics
Published: 4/1/2010
Authors: Sara E. Mason, Christopher R. Iceman, Thomas P. Trainor, Anne M. Chaka
Abstract: We report an ab initio thermodynamic analysis of the a-Al2O3 (1-102) surface aimed at understanding the experimentally observed terminations over a range of surface preparation conditions, as well as a novel stoichiometric model for the (2x1) surface ...

43. Depletion Effects and Gelation in a Binary Hard-Sphere Fluid
Topic: Physics
Published: 12/1/1999
Authors: L L Lue, L V Woodcock

44. Detection of l-C3H+ in Sgr B2(N) and Sgr B2(OH) and Refinement of its Spectroscopic Constants via the Publicly Available PRIMOS Survey and the Barry E. Turner Legacy Survey
Topic: Physics
Published: 9/1/2013
Authors: Francis John Lovas, Brett A. McGuire, P. Brandon Carroll, Ryan A. Loomis, Geoffery A. Blake, Jan M. Hollis, Phillip R. Jewell, Anthony J. Remijan
Abstract: Pety et al. (2012) recently reported the detection and assignment of l-C3H+ in the Horsehead nebula. Here, we expand that analysis to include the J = 1 - 0 and J = 2 - 1 transitions of l-C3H+ observed in absorption towards Sgr B2(N) in data from the ...

45. Determination of graphene work function and graphene-insulator-semiconductor band alignment by internal photoemission spectroscopy
Topic: Physics
Published: 7/11/2012
Authors: Rusen Yan, Qin Q. Zhang, Wei Li, Irene G. Calizo, Tian T. Shen, Curt A Richter, Angela R Hight Walker, Xuelei X. Liang, David J Gundlach, Nhan V Nguyen, Huili Grace Xing, Alan Seabaugh
Abstract: We determined the band alignment of a graphene-oxide-silicon structure using internal photoemission spectroscopy. From the flatband voltage and Dirac voltage we infer a 4.3  10e11 cm-2 negative extrinsic charge present on the graphene surface. Als ...

46. Development of Multicolor Flow Cytometry Standards: Assignment of Equivalent Reference Fluorophores (ERF) Unit
Series: Journal of Research (NIST JRES)
Topic: Physics
Published: Date unknown
Authors: Lili Wang, Adolfas Kastytis Gaigalas
Abstract: A procedure is described for assigning values of the number of equivalent reference fluorophores (ERF) to microspheres labeled with a fluorophore designed to produce fluorescence in a given channel of a multicolor flow cytometer. There is a different ...

47. Development of an Ultra-Pure, Carrier-Free 209Po Solution Standard
Series: Journal of Research (NIST JRES)
Topic: Physics
Published: 7/23/2015
Authors: Ronald Colle, Ryan P Fitzgerald, Lizbeth Laureano-Perez
Abstract: Ultra-pure, carrier-free 209Po solution standards have been prepared and standardized for their massic alpha-particle emission rate. The standards, which will be disseminated by the National Institute of Standards and Technology (NIST) as Standard Re ...

48. Development of an infrared optical scattering instrument from 1 um to 5 um
Topic: Physics
Published: 10/1/2009
Authors: Jinan Zeng, Leonard M Hanssen
Abstract: The wavelength coverage of the IR optical scattering instrument developed at the National Institute of Standards and Technology has been extended to cover the continuous range from 1 um to 5 um. Besides the previously available diode lasers at wavele ...

49. Development of in-situ calibration method for current-to-voltage converters for high-accuracy SI-traceable low-DC-current measurements
Topic: Physics
Published: 9/20/2013
Authors: George P Eppeldauer, Howard W Yoon, Dean G Jarrett, Thomas C Larason
Abstract: For photocurrent measurements with low uncertainties, wide-dynamic range reference current-to-voltage converters and a new converter calibration method have been developed at the National Institute of Standards and Technology (NIST). The high feedba ...

50. Dimensional Analysis of Through Silicon Vias Using the TSOM Method
Topic: Physics
Published: 7/12/2011
Authors: Ravikiran Attota, Andrew Rudack
Abstract: There is a great need for accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). Through-focus scanning optical microscopy (TSOM) is an optical metrology method that pr ...

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