NIST logo

Publications Portal

You searched on: Topic Area: Physics Sorted by: title

Displaying records 31 to 40 of 217 records.
Resort by: Date / Title


31. Density functional theory study of clean, hydrated, and defective alumina (1-102) surfaces
Topic: Physics
Published: 4/1/2010
Authors: Sara E. Mason, Christopher R. Iceman, Thomas P. Trainor, Anne M. (Anne M.) Chaka
Abstract: We report an ab initio thermodynamic analysis of the a-Al2O3 (1-102) surface aimed at understanding the experimentally observed terminations over a range of surface preparation conditions, as well as a novel stoichiometric model for the (2x1) surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904117

32. Depletion Effects and Gelation in a Binary Hard-Sphere Fluid
Topic: Physics
Published: 12/1/1999
Authors: L L Lue, L V Woodcock
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100725

33. Detection of l-C3H+ in Sgr B2(N) and Sgr B2(OH) and Refinement of its Spectroscopic Constants via the Publicly Available PRIMOS Survey and the Barry E. Turner Legacy Survey
Topic: Physics
Published: 9/1/2013
Authors: Francis John Lovas, Brett A. McGuire, P. Brandon Carroll, Ryan A. Loomis, Geoffery A. Blake, Jan M. Hollis, Phillip R. Jewell, Anthony J. Remijan
Abstract: Pety et al. (2012) recently reported the detection and assignment of l-C3H+ in the Horsehead nebula. Here, we expand that analysis to include the J = 1 - 0 and J = 2 - 1 transitions of l-C3H+ observed in absorption towards Sgr B2(N) in data from the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913359

34. Determination of graphene work function and graphene-insulator-semiconductor band alignment by internal photoemission spectroscopy
Topic: Physics
Published: 7/11/2012
Authors: Rusen Yan, Qin Q. Zhang, Wei Li, Irene G. Calizo, Tian T. Shen, Curt A Richter, Angela R Hight Walker, Xuelei X. Liang, David J Gundlach, Nhan V Nguyen, Huili Grace Xing, Alan Seabaugh
Abstract: We determined the band alignment of a graphene-oxide-silicon structure using internal photoemission spectroscopy. From the flatband voltage and Dirac voltage we infer a 4.3  10e11 cm-2 negative extrinsic charge present on the graphene surface. Als ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911396

35. Development of Multicolor Flow Cytometry Standards: Assignment of Equivalent Reference Fluorophores (ERF) Unit
Series: Journal of Research (NIST JRES)
Topic: Physics
Published: Date unknown
Authors: Lili Wang, Adolfas Kastytis Gaigalas
Abstract: A procedure is described for assigning values of the number of equivalent reference fluorophores (ERF) to microspheres labeled with a fluorophore designed to produce fluorescence in a given channel of a multicolor flow cytometer. There is a different ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906632

36. Development of an Ultra-Pure, Carrier-Free 209Po Solution Standard
Series: Journal of Research (NIST JRES)
Topic: Physics
Published: Date unknown
Authors: Ronald Colle, Ryan P Fitzgerald, Lizbeth Laureano-Perez
Abstract: Ultra-pure, carrier-free 209Po solution standards have been prepared and standardized for their massic alpha-particle emission rate. The standards, which will be disseminated by the National Institute of Standards and Technology (NIST) as Standard Re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918599

37. Development of an infrared optical scattering instrument from 1 um to 5 um
Topic: Physics
Published: 10/1/2009
Authors: Jinan Zeng, Leonard M Hanssen
Abstract: The wavelength coverage of the IR optical scattering instrument developed at the National Institute of Standards and Technology has been extended to cover the continuous range from 1 um to 5 um. Besides the previously available diode lasers at wavele ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903521

38. Development of in-situ calibration method for current-to-voltage converters for high-accuracy SI-traceable low-DC-current measurements
Topic: Physics
Published: 9/20/2013
Authors: George P Eppeldauer, Howard W Yoon, Dean G Jarrett, Thomas C Larason
Abstract: For photocurrent measurements with low uncertainties, wide-dynamic range reference current-to-voltage converters and a new converter calibration method have been developed at the National Institute of Standards and Technology (NIST). The high feedba ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914149

39. Dimensional Analysis of Through Silicon Vias Using the TSOM Method
Topic: Physics
Published: 7/12/2011
Authors: Ravikiran Attota, Andrew Rudack
Abstract: There is a great need for accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). Through-focus scanning optical microscopy (TSOM) is an optical metrology method that pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909226

40. Dipole Moment of a Pb-O Vacancy Pair in PbTiO^d3^
Topic: Physics
Published: 4/1/2004
Authors: Eric J Cockayne, Benjamin P Burton
Abstract: The polarization of a nearest-neighbor (nn) Pb-O vacancy pair in PbTiO3 is calculated, using the modern theory of polarization, implemented in the density functional theory ultrasoft pseudopotential formalism. The dipole moment per divacancy is about ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850779



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series