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Displaying records 61 to 70 of 402 records.
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61. Consistency of Delta ^u13^ C Measurements Improved
Topic: Nanotechnology
Published: 2/1/2006
Authors: T B Copelen, W Brand, M Gehre, M Groening, HAJ Meijer, Blaza Toman, R Michael Verkouteren
Abstract: We present state-of-the-art measurements and data evaluation methods to show that the consistency of carbon isotope ratio measurements can be improved 39 % to 47 % by anchoring the measurement scale with two isotopic reference materials differing in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831406

62. Contact mechanics and tip shape in afm-based nanomechanical measurements
Topic: Nanotechnology
Published: 8/31/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: Stiffness-load curves obtained in quantitative atomic force acoustic microscopy (AFAM) measurements depend on both the elastic properties of the sample and the geometry of the atomic force microscope (AFM) tip. The geometry of silicon AFM tips change ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50203

63. Controlled dielectrophoretic nanowire self-assembly using atomic layer deposition and suspended microfabricated electrodes
Topic: Nanotechnology
Published: 5/28/2012
Authors: Kristine A Bertness, Joseph J. Brown, Alicia I Baca, Victor M. Bright
Abstract: Effects of design and materials on the dielectrophoretic self-assembly of individual gallium nitride nanowires (GaN NWs) onto microfabricated electrodes have been experimentally investigated. The use of TiO^d2^ surface coating generated by atomic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910631

64. Controlled nucleation of GaN nanowires grown with molecular beam epitaxy
Topic: Nanotechnology
Published: 7/13/2010
Authors: Kristine A Bertness, Aric Warner Sanders, Devin M. Rourke, Todd E Harvey, Alexana Roshko, Norman A Sanford
Abstract: The location of GaN nanowires was controlled with essentially perfect selectivity using patterned SiNx prior to molecular beam epitaxy growth. Growth was uniform within mask openings and absent on the mask surface for over 95 % of the usable area of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904471

65. Copper Oxide Precipitates in NBS Standard Reference Material 482
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 12/1/2002
Authors: Eric S Windsor, R Carlton, John G Gillen, Scott A Wight, David S. Bright
Abstract: Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831277

66. Copper oxide nanoparticle mediated DNA damage in terrestrial plant models
Topic: Nanotechnology
Published: 12/22/2011
Authors: Bryant C Nelson, Donald H Atha, Elijah J Petersen, Huanhua Wang, Danielle Cleveland, Richard D Holbrook, Pawel Jaruga, M Miral Dizdar, Baoshan Xing
Abstract: Engineered nanoparticles, due to their unique electrical, mechanical and catalytic properties, are presently found in many commercial products and will be intentionally or inadvertently released at increasing concentrations into the natural environme ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908088

67. Correlating Nanoparticle Dispersion to Surface Mechanical Properties of TiO2/Polymer Composites
Topic: Nanotechnology
Published: 11/25/2009
Author: Yongyan Pang
Abstract: The main objectives of this study are to characterize the nanoparticle dispersion in polymeric matrices with different mixing chemistry conditions; and to correlate dispersion to surface mechanical properties of the nanopaticle-polymer system. Two ty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904382

68. Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node
Topic: Nanotechnology
Published: 6/7/2013
Authors: Ravikiran Attota, Benjamin D. Bunday, Victor Vertanian
Abstract: We present results using simulations and experiments to demonstrate metrological applications of the through-focus scanning optical microscopy (TSOM) down to features at and well below the International Technology Roadmap for Semiconductors' 22  ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913353

69. DESIGN OF TEST STRUCTURE FOR 3D-STACKED INTEGRATED CIRCUITS (3D-SICS) METROLOGY
Topic: Nanotechnology
Published: 3/25/2014
Authors: Lin You, Jungjoon Ahn, Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914744

70. DNA Origami Used to Assemble Nanoplasmonic Structure
Topic: Nanotechnology
Published: 4/9/2010
Author: James Alexander Liddle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905364



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