Publications Portal

You searched on:
Topic Area: Nanotechnology
Sorted by: title

Displaying records 61 to 70 of 340 records.
Resort by: Date / Title

61. DNA Origami Used to Assemble Nanoplasmonic Structure
Topic: Nanotechnology
Published: 4/9/2010
Author: James Alexander Liddle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905364

62. Degradation and Nanofiller Release of Polymer Nanocomposites Exposed to UV
Topic: Nanotechnology
Published: 7/15/2009
Authors: Tinh Nguyen, Bastien T. Pellegrin, Alexander J. Shapiro, Xiaohong Gu, Joannie W Chin
Abstract: Nanofillers are increasingly used to enhance multifunctional properties of polymers. However, recent research suggests that nanomaterials may have a negative impact on the environmental health and safety. Since polymers are susceptible to photodegrad ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902990

63. Degradation and Nanoparticle Release of Nanocomposite Coatings Exposed to UV Radiation
Topic: Nanotechnology
Published: 6/2/2010
Authors: Tinh Nguyen, Bastien T. Pellegrin, Coralie Bernard, Xiaohong Gu, Justin M Gorham, Paul E Stutzman, Alexander J. Shapiro, Walter Eric Byrd, Joannie W Chin
Abstract: The release of nanoparticles from nanocomposite coatings during their life cycle potentially has negative effects to the environments and presents a roadblock to their uses. The degradation and nanoparticle release of amine-cured epoxy coatings conta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905834

64. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 6/1/2004
Authors: Christine M. Mahoney, S V. Roberson, John G Gillen
Abstract: The feasibility of cluster Secondary Ion Mass Spectrometry (SIMS) for depth profiling of drug delivery systems is explored. Behaviors of various biodegradable polymer films under dynamic SF^d5^^u+^ primary ion bombardment was investigated including s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831329

65. Depth Profiling of Poly(L-Lactic Acid)/Pluronic Polymer BlendsWith Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Topic: Nanotechnology
Published: 6/1/2005
Authors: Christine M. Mahoney, J Yu, J Gardella
Abstract: Polymeric blends comprised of the biodegradable polymer poly-L-lactic acid (PLLA) and polyethylene oxide (PEO) are of considerable interest due to their potential applications as protein drug delivery devices. In such devices, the PEO component will ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831372

66. Design of an on-chip microscale nanoassembly system
Topic: Nanotechnology
Published: 2/10/2009
Authors: Jason John Gorman, Yong Sik Kim, Andras Vladar, Nicholas G Dagalakis
Abstract: A microscale nanoassembly system has been designed for the fabrication of nanodevices and in situ electromechanical characterisation of nanostructures. This system consists of four Microelectromechanical Systems(MEMS)-based nanomanipulators positione ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901179

67. Design, fabrication, and testing of a serial kinematic MEMS XY stage for multi-finger manipulation
Topic: Nanotechnology
Published: 8/29/2012
Authors: Yong Sik Kim, Jae Myung Yoo, Seung Ho Yang, Young M. Choi, Nicholas G Dagalakis, Satyandra K. Gupta
Abstract: In micro-electro-mechanical systems (MEMS) it is difficult to obtain large range of motion with small coupled error. This limitation was overcome by designing and fabricating a nested structure as a serial kinematic mechanism (SKM). In this paper, a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911710

68. Determination of the Electron Escape Depth for NEXAFS Spectroscopy
Topic: Nanotechnology
Published: 6/2/2009
Authors: Daniel A Fischer, K E Sohn, M D Dimitriou, Jan Genzer, C Hawker, Edward J Kramer
Abstract: Depth profiling using near-edge X-ray absorption fine structure (NEXAFS) spectroscopy was used to determine the carbon atom density as a function of depth by analyzing the post-edge signal in NEXAFS spectra. We show that the common assumption in the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901683

69. Development and Application of Multiple Delta-Layer Reference Materials for Semiconductor Analysis
Topic: Nanotechnology
Published: 1/1/2005
Authors: K J Kim, D Moon, P Chi, David S Simons
Abstract: The rapid progress in the semiconductor industry requires more precise in-depth profiling analysis of doping elements in narrower and shallower regions. Secondary ion mass spectrometry (SIMS) is the most popular technique for the depth distribution o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831369

70. Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-Assembled Monolayers and Secondary Ion Mass Spectroscopy
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100382