NIST logo

Publications Portal

You searched on:
Topic Area: Nanotechnology
Sorted by: title

Displaying records 41 to 50 of 401 records.
Resort by: Date / Title


41. Characterization of C-4 Samples using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Topic: Nanotechnology
Published: 9/1/2010
Authors: Christine M. Mahoney, Albert J. Fahey, Kristen L Steffens, Richard T. Lareau
Abstract: The application of surface analytical techniques such as Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), and X-ray Photoelectron Spectroscopy (XPS) are explored as a means of differentiating between C-4 samples. Three different C-4 sample ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902580

42. Characterization of Drug-Eluting Stent (DES) Materials With Cluster Secondary Ion Mass Spectrometry (SIMS)
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, Martin McDermott
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was utilized to analyze several materials commonly used in drug eluting stents (DES). Poly(ethylene-co-vinyl acetate) (PEVA), Poly(lactic-co-glycolic acid) (PLGA) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831403

43. Characterization of Gunpowder Samples Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Topic: Nanotechnology
Published: 4/1/2006
Authors: Christine M. Mahoney, John G Gillen, Albert J. Fahey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901923

44. Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force Microscopy
Topic: Nanotechnology
Published: 10/15/2008
Authors: Shaw C Feng, Che B. Joung, Theodore Vincent Vorburger
Abstract: Critical Dimension Atomic Force Microscopy (CD-AFM) is a primary means to measure the geometric shapes of walls and trenches on the nanometer scale in laboratories supporting the electronic industry. As the widths of commercially available CD-AFM pro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824690

45. Characterization of SRM 1866 Using Spindle Stage Techniques
Series: OTHER
Report Number: 1866
Topic: Nanotechnology
Published: 11/21/1988
Authors: Jennifer R Verkouteren, J M. Phelps, Cynthia J Zeissler, Eric B Steel
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902152

46. Characterization of Standard Reference Material 2942, Ce-Ion-Doped Glass, Spectral Correction Standard for UV Fluorescence
Topic: Nanotechnology
Published: Date unknown
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Jeffrey R. Anderson, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2942 is a cuvette-shaped, Ce-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance verification of steady-state fluorescence spectrometers. Properties of this st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906188

47. Characterization of Surface Accumulation and Release of Nanosilica During Irradiation of Polymer Nanocomposites with Ultraviolet Light
Topic: Nanotechnology
Published: 8/12/2012
Authors: Tinh Nguyen, Bastien T. Pellegrin, Coralie Bernard, Savelas A Rabb, Paul E Stutzman, Justin M Gorham, Xiaohong Gu, Lee Lijian Yu, Joannie W Chin
Abstract: Nanofillers are increasingly used for enhancing multiple properties of polymeric materials in many applications. However, polymers are susceptible to photodegradation by solar ultraviolet (UV) radiation Therefore, nanofillers in a polymer nanocompos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909878

48. Characterization of the Electron Beam Specimen Interaction in the ESEM with SIM Imaging
Topic: Nanotechnology
Published: 7/1/2000
Authors: Scott A Wight, John G Gillen, G B. Saupe
Abstract: A Secondary Ion Mass Spectrometry (SIMS) study has been undertaken to examine surfaces and films modified in the environmental scanning electron microscope (ESEM). Examination of the modifications induced by ESEM electrons and ions lead to a better ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830163

49. Characterizing Equilibrium in Epitaxial Growth
Topic: Nanotechnology
Published: 2/20/2012
Authors: Paul N. Patrone, Russel Caflisch, Dionisios Margetis
Abstract: Using a kinetic model of epitaxial growth, we describe how geometry controls kinetic pathways through which external deposition influences the state of a vicinal surface. The state of the surface is determined by three key, adjustable parameters: th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909660

50. Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy
Topic: Nanotechnology
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specifici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831196



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series