NIST logo

Publications Portal

You searched on: Topic Area: Nanotechnology Sorted by: title

Displaying records 31 to 40 of 189 records.
Resort by: Date / Title


31. Degradation and Nanoparticle Release of Nanocomposite Coatings Exposed to UV Radiation
Topic: Nanotechnology
Published: 6/2/2010
Authors: Tinh Nguyen, Bastien T. Pellegrin, Coralie Bernard, Xiaohong Gu, Justin M Gorham, Paul E Stutzman, Alexander J. Shapiro, Walter Eric Byrd, Joannie W Chin
Abstract: The release of nanoparticles from nanocomposite coatings during their life cycle potentially has negative effects to the environments and presents a roadblock to their uses. The degradation and nanoparticle release of amine-cured epoxy coatings conta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905834

32. Design and modeling of an ultra-compact 2x2 nanomechanical plasmonic switch
Topic: Nanotechnology
Published: 5/4/2016
Author: Vladimir A Aksyuk
Abstract: A 2x2 Mach-Zehnder optical switch design with a footprint of 0.5 um x 2.5 um using nanomechanical gap plasmon phase modulators [1] is presented. The extremely small footprint and modest optical loss are enabled by the strong phase modulation of gap p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917754

33. Design of an on-chip microscale nanoassembly system
Topic: Nanotechnology
Published: 2/10/2009
Authors: Jason John Gorman, Yong Sik Kim, Andras Vladar, Nicholas G Dagalakis
Abstract: A microscale nanoassembly system has been designed for the fabrication of nanodevices and in situ electromechanical characterisation of nanostructures. This system consists of four Microelectromechanical Systems(MEMS)-based nanomanipulators positione ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901179

34. Development of Multicolor Flow Cytometry Standards: Assignment of Equivalent Reference Fluorophores (ERF) Unit
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: Date unknown
Authors: Lili Wang, Adolfas Kastytis Gaigalas
Abstract: A procedure is described for assigning values of the number of equivalent reference fluorophores (ERF) to microspheres labeled with a fluorophore designed to produce fluorescence in a given channel of a multicolor flow cytometer. There is a different ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906632

35. Dielectric Spectroscopy Investigation of Relaxation in C60-Polyisoprene Nanocomposites
Topic: Nanotechnology
Published: 3/23/2009
Authors: Yifu Ding, Sebastian Pawlus, Alexei Sokolov, Jack F Douglas, Alamgir Karim, Christopher L Soles
Abstract: We investigate the influence of adding C60 nanoparticles on the dielectric relaxation spectra of both unentangled and entangled polyisoprene (PIP). Relaxation modes corresponding to both segmental and chain relaxation were analyzed over a broad tempe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900194

36. Direct Evidence of Nanoparticle Release from Epoxy Nanocomposites Exposed to UV Radiation
Topic: Nanotechnology
Published: 4/14/2010
Authors: Tinh Nguyen, Bastien T. Pellegrin, Coralie Bernard, Xiaohong Gu, Justin M Gorham, Paul E Stutzman, Alexander J. Shapiro, Walter Eric Byrd, Joannie W Chin
Abstract: This study assessed the fate of SiO2 nanoparticles (nanoSiO2) in epoxy/nanoSiO2 composites exposed to ultraviolet (UV) radiation. The matrix was a stoichiometric mixture of adiglycidyl ether of bisphenol A epoxy and an aliphatic tri-amine. Films of u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905527

37. Discriminating the states of matter in metallic nanoparticle transformations: What are we missing?
Topic: Nanotechnology
Published: 2/20/2013
Authors: John M Pettibone, Julien C. Gigault, Vincent A Hackley
Abstract: A limiting factor in assessing the risk of current and emerging nanomaterials in biological and environmental systems is the ability to accurately detect and characterize their size, shape and composition in broad distributions and complex media. Asy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913009

38. Does Your SEM Really Tell the Truth? - How would you know? Part 1
Topic: Nanotechnology
Published: 12/16/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The high resolution of the SEM is especially suited for both qualitative and quantit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912761

39. Dominant Thermal Boundary Resistance in Multi-Walled Carbon Nanotube Bundles Fabricated at Low Temperatures
Topic: Nanotechnology
Published: 7/11/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Sarbajit Banerjee, Kees Beenakker, R. Ishihara
Abstract: While carbon nanotubes (CNT) have been suggested as thermal management mate- rial for integrated circuits, the thermal properties and especially the thermal bound- ary resistance (TBR) of as-grown CNT have hardly been investigated. Here the therma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915307

40. Driven DNA Transport Into an Asymmetric Nanometer-Scale Pore
Topic: Nanotechnology
Published: 10/2/2000
Authors: S. E. Henrickson, Martin Misakian, B Robertson, John J Kasianowicz
Abstract: To understand the mechanism by which individual DNA molecules partition into a nanometer-scale pore, we studied the concentration and voltage dependence of polynucleotide-induced current blockades of single a-hemolysin ionic channels. At fixed singl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830159



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series