NIST logo

Publications Portal

You searched on:
Topic Area: Nanotechnology
Sorted by: title

Displaying records 31 to 40 of 391 records.
Resort by: Date / Title

31. Calibration of a Force Feedback Joystick
Series: OTHER
Topic: Nanotechnology
Published: 8/29/2008
Authors: J H Daruwalla, Nicholas G Dagalakis
Abstract: The objective of this project was to calibrate a commercially available force feedback joystick that could be used for the control of a laser beam optical tweezers test-bed. A calibration box was built to hold the joystick and the load-cell. The joy ...

32. Capillary Instability in Nanoimprinted Polymer Films
Topic: Nanotechnology
Published: 5/21/2009
Authors: Kyle J. Alvine, Yifu Ding, Hyun W. Ro, Brian C. Okerberg, Alamgir Karim, Christopher L Soles, Jack F Douglas
Abstract: Capillary forces play an active role in defining the equilibrium structure of nanoscale structures. This effect can be especially pronounced in soft materials such as polymers near or above their glass transition temperatures where material flow is ...

33. Carbonization Rate of Soot Precursor Particles
Topic: Nanotechnology
Published: 12/1/1996
Authors: R A Dobbins, G J Govatzidakis, W Lu, A F Schwartzman, Robert A Fletcher

34. Center for Nanoscale Science & Technology 2010 Report
Series: Special Publication (NIST SP)
Report Number: 1121
Topic: Nanotechnology
Published: 5/9/2011
Authors: Lloyd J. Whitman, Robert G. Rudnitsky, G. Denise Rogers

35. Challenges and Opportunities of Organic Electronics
Topic: Nanotechnology
Published: 4/2/2010
Author: Calvin Chan

36. Channeling-Induced Asymmetric Distortion of Depth Profiles from Polycrystalline-TiN/Ti/TiN(001) Trilayers During Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 5/1/2000
Authors: G Ramanath, J E Greene, I Petrov, J E Baker, L H Allen, John G Gillen
Abstract: Asymmetric depth profiles of elemental and molecular secondary ions are observed during secondary ion mass spectrometry (SIMS) analyses of polycrystalline-TiN/Ti/TiN(001) trilayers using a Cs+ ion beam. The sputter-etching rate R and the secondary i ...

37. Characterization and Ion-Induced Degradation of Cross-Linked Poly(Methyl Methacylate) Studies Using Time of Flight Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 12/30/2006
Authors: M S. Wagner, K Lenghaus, John G Gillen, Michael J Tarlov
Abstract: In this study, a series of random copolymers of methyl methacrylate (MMA) and ethylene glycol dimethacrylate (EGDMA) were prepared as surface-initiated polymer (SIP) films on silicon substrates using atom transfer radical polymerization. Positive and ...

38. Characterization of Airborne Nanoparticle Released from Consumer Products
Series: Technical Note (NIST TN)
Report Number: 1787
Topic: Nanotechnology
Published: 8/29/2013
Authors: Li Piin Sung, Joannie W Chin, Andrew Keith Persily
Abstract: This interim report summarizes research results to date under the FY2012 interagency agreement between CPSC and NIST to develop testing and measurement protocols for determining the quantities and properties of nanoparticles released from floorin ...

39. Characterization of C-4 Samples using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Topic: Nanotechnology
Published: 9/1/2010
Authors: Christine M. Mahoney, Albert J. Fahey, Kristen L Steffens, Richard T. Lareau
Abstract: The application of surface analytical techniques such as Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), and X-ray Photoelectron Spectroscopy (XPS) are explored as a means of differentiating between C-4 samples. Three different C-4 sample ...

40. Characterization of Drug-Eluting Stent (DES) Materials With Cluster Secondary Ion Mass Spectrometry (SIMS)
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, Martin McDermott
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was utilized to analyze several materials commonly used in drug eluting stents (DES). Poly(ethylene-co-vinyl acetate) (PEVA), Poly(lactic-co-glycolic acid) (PLGA) ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series