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Topic Area: Nanotechnology
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Displaying records 31 to 40 of 395 records.
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31. Block Copolymer Thin Films: Physics and Applications
Topic: Nanotechnology
Published: 2/15/2001
Authors: Michael J Fasolka, A M Mayes
Abstract: A two-part review of research concerning block copolymer thin films is presented. The first section summarizes experimental and theoretical studies of the fundamental physics of these systems, concentrating upon the forces that govern film morpholog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841503

32. Calibration of a Force Feedback Joystick
Series: OTHER
Topic: Nanotechnology
Published: 8/29/2008
Authors: J H Daruwalla, Nicholas G Dagalakis
Abstract: The objective of this project was to calibrate a commercially available force feedback joystick that could be used for the control of a laser beam optical tweezers test-bed. A calibration box was built to hold the joystick and the load-cell. The joy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822174

33. Capillary Instability in Nanoimprinted Polymer Films
Topic: Nanotechnology
Published: 5/21/2009
Authors: Kyle J. Alvine, Yifu Ding, Hyun W. Ro, Brian C. Okerberg, Alamgir Karim, Christopher L Soles, Jack F Douglas
Abstract: Capillary forces play an active role in defining the equilibrium structure of nanoscale structures. This effect can be especially pronounced in soft materials such as polymers near or above their glass transition temperatures where material flow is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852751

34. Carbonization Rate of Soot Precursor Particles
Topic: Nanotechnology
Published: 12/1/1996
Authors: R A Dobbins, G J Govatzidakis, W Lu, A F Schwartzman, Robert A Fletcher
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100348

35. Center for Nanoscale Science & Technology 2010 Report
Series: Special Publication (NIST SP)
Report Number: 1121
Topic: Nanotechnology
Published: 5/9/2011
Authors: Lloyd J. Whitman, Robert G. Rudnitsky, G. Denise Rogers
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908125

36. Challenges and Opportunities of Organic Electronics
Topic: Nanotechnology
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

37. Channeling-Induced Asymmetric Distortion of Depth Profiles from Polycrystalline-TiN/Ti/TiN(001) Trilayers During Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 5/1/2000
Authors: G Ramanath, J E Greene, I Petrov, J E Baker, L H Allen, John G Gillen
Abstract: Asymmetric depth profiles of elemental and molecular secondary ions are observed during secondary ion mass spectrometry (SIMS) analyses of polycrystalline-TiN/Ti/TiN(001) trilayers using a Cs+ ion beam. The sputter-etching rate R and the secondary i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831134

38. Characterization and Ion-Induced Degradation of Cross-Linked Poly(Methyl Methacylate) Studies Using Time of Flight Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 12/30/2006
Authors: M S. Wagner, K Lenghaus, John G Gillen, Michael J Tarlov
Abstract: In this study, a series of random copolymers of methyl methacrylate (MMA) and ethylene glycol dimethacrylate (EGDMA) were prepared as surface-initiated polymer (SIP) films on silicon substrates using atom transfer radical polymerization. Positive and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831017

39. Characterization of Airborne Nanoparticle Released from Consumer Products
Series: Technical Note (NIST TN)
Report Number: 1787
Topic: Nanotechnology
Published: 8/29/2013
Authors: Li Piin Sung, Joannie W Chin, Andrew Keith Persily
Abstract: This interim report summarizes research results to date under the FY2012 interagency agreement between CPSC and NIST to develop testing and measurement protocols for determining the quantities and properties of nanoparticles released from floorin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913002

40. Characterization of C-4 Samples using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Topic: Nanotechnology
Published: 9/1/2010
Authors: Christine M. Mahoney, Albert J. Fahey, Kristen L Steffens, Richard T. Lareau
Abstract: The application of surface analytical techniques such as Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), and X-ray Photoelectron Spectroscopy (XPS) are explored as a means of differentiating between C-4 samples. Three different C-4 sample ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902580



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