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Topic Area: Nanotechnology
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Displaying records 381 to 390 of 392 records.
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381. Use of Secondary Ion Mass Spectrometry to Image (44) Calcium Uptake in the Cell Walls of Apple Fruit
Topic: Nanotechnology
Published: 9/1/1995
Authors: Sandip Roy, John G Gillen, W.S. Conway, A.E. Watada, W.P. Wergin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902023

382. Use of TSOM for sub-11 nm node pattern defect detection and HAR features
Topic: Nanotechnology
Published: 4/30/2013
Authors: Ravikiran Attota, Abraham Arceo, Bunday Benjamin
Abstract: In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. In defect inspection, conventional bright field techniques will not likely ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913698

383. Value Assignment and Uncertainty Estimation of Selected Light Stable Isotope Reference Materials: RMs 8543-8545, RMs 8562-8564, and RM 8566
Series: Special Publication (NIST SP)
Report Number: 260-149
Topic: Nanotechnology
Published: 12/1/2003
Authors: R Michael Verkouteren, D Klinedinst
Abstract: We report the technical basis for value assignments of several carbon and oxygen stable isotope reference materials distributed by NIST and the International Atomic Energy Agency (IAEA), and make recommendations regarding laboratory practices and fut ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831290

384. Variable Magnification With Kirkpatrick-Baez Optics for Synchrotron X-Ray Microscopy
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 5/1/2006
Authors: Terrence J Jach, A S Bakulin, S M Durbin, J Pedulla, A T Macrander
Abstract: We describe the distinction between the operation of a short focal lengthx-ray microscope forming a real image with a laboratory source (convergentillumination) and with a highly collimated intense beam from a synchrotronlight source (K\{o}hler illum ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831409

385. Vibrational modes of nanolines
Topic: Nanotechnology
Published: 3/5/2008
Authors: Paul R Heyliger, Colm Flannery, Ward L Johnson
Abstract: Brillouin-light-scattering spectra previously have been shown to provide information on acoustic modes of polymeric lines fabricated by nanoimprint lithography. Finite-element methods for modeling such modes are presented here. These methods provide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50582

386. Virtual Environment for Manipulating Microscopic Particles with Optical Tweezer
Topic: Nanotechnology
Published: 6/1/2003
Authors: Yong-Gu Lee, Kevin W Lyons, Thomas W LeBrun
Abstract: In this paper, we use virtual reality techniques to define an intuitive interface to a nanoscale manipulation device. This device utilizes optical methods to focus laser light to trap and reposition nano-to-microscopic particles. The underlying physi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822011

387. Void formation in nanowire contacts revealed
Topic: Nanotechnology
Published: 8/23/2012
Author: Kristine A Bertness
Abstract: Popular contact scheme to p-type GaN fails when applied to nanowires.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912070

388. Water based Polyurethane Graphene Oxide Nanocomposites
Topic: Nanotechnology
Published: 3/3/2010
Authors: Coralie Bernard, Tinh T. Nguyen, Bastien T. Pellegrin, Mat Celina, Alexander J. Shapiro, Deborah L Stanley, Kar T. Tan, Sungjin Park, R. S. Ruoff, Joannie W Chin
Abstract: Graphene oxides are potentially a new class of nanomaterial to enhance multifunctional properties of polymers because of their remarkable thermal conductivity, mechanical strength, and more importantly, low cost. The graphene oxides, produced by exfo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904994

389. What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?
Topic: Nanotechnology
Published: 8/1/1999
Author: Scott A Wight
Abstract: Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831119

390. Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics
Topic: Nanotechnology
Published: 12/1/2001
Authors: Terrence J Jach, S M Durbin, A S Bakulin, David S. Bright, C B Stagarescu, G Srajer, D. Haskel, J Pedulla
Abstract: Modern technology permits us to fabricate Kirkpatrick-Baez (KB) multilayer optics with performance close to the theoretical limit. We have constructed a KB field-imaging microscope which operates in the x-ray energy range 6-10 keV with a field of vi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831231



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