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Topic Area: Nanotechnology
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Displaying records 331 to 340 of 391 records.
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331. Studying Long-term Performance of a Nano-ZnO filled Waterborne Polyurethane Coating using Spectroscopies and Microscopies
Topic: Nanotechnology
Published: 9/9/2009
Authors: Xiaohong X. Gu, Dongmei Zhe, Stephanie S Watson, Guodong Chen, Minhua Zhao, Paul E Stutzman, Deborah L Stanley, Tinh T. Nguyen, Joannie W Chin, Jonathan W. Martin
Abstract: Although inorganic UV absorbers such as zinc oxide (ZnO) and cerium oxide (CeO2) exhibit numerous advantages compared to organic UV absorbers, the mechanisms of how these nanoparticles affect the long-term performance of polymeric coatings are less t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903215

332. Summary of ISO/TC 201 Standard: XIII. ISO 18114:2003 - Surface Chemical Analysis - Secondary Ion Mass Spectrometry - Determination of Relative Sensitivity Factors From Ion-Implanted Reference Materials
Topic: Nanotechnology
Published: 3/1/2006
Author: David S Simons
Abstract: Ion-implanted materials are commonly used in secondary-ion mass spectrometry for the calibration of instruments. This international Standard was prepared to provide a uniform method for determining the relative sensitivity factor (RSF) of an element ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831402

333. Super-hydrophobic and/or Super-hydrophilic Surfaces Made by Plasma Process
Topic: Nanotechnology
Published: 5/8/2009
Authors: Lei Chen, Gerard Henein, James Alexander Liddle
Abstract: In this paper, a simple, fast, all-plasma surface modification (APSM) process, which can form super-hydrophobic and/or super-hydrophilic surfaces is introduced. The APSM process includes plasma-induced surface nano-pattern formation, substrate etchin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901919

334. Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles
Topic: Nanotechnology
Published: 5/1/2001
Authors: E Fuoco, John G Gillen, M Wijesundara, William E Wallace III, L Hanley
Abstract: In this paper examine the mechanism of secondary ion yield enhancements previously observed for polyatomic projectiles by measuring the weight loss, volume loss, and surface composition of poly(methylmethacrylate) (PMMA) films sputtered by keV SF^d5^ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831207

335. Surface Effects on the Elastic Modulus of Te Nanowires
Topic: Nanotechnology
Published: 6/17/2008
Authors: Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Mark D Vaudin, Leonid A Bendersky, Robert Francis Cook
Abstract: Nondestructive elastic property measurements have been performed on Te nanowires with diameters in the range 20 150 nm. By using contact resonance atomic force microscopy, the elastic indentation modulus perpendicular to the prismatic facets of the n ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851078

336. Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
Topic: Nanotechnology
Published: 12/2/2008
Authors: Lucile C. Teague, Behrang H Hamadani, John E Anthony, David J Gundlach, James G. Kushmerick, Sanker Subramanian, Thomas Jackson, Curt A Richter, Oana Jurchescu
Abstract: We report scanning Kelvin probe microscopy (SKPM) of electrically biased difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TESADT) organic thin film transistors. SKPM reveals the relationship between the diF-TESADT film structure and device ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831446

337. Surface-directed Growth of Nanowires: A Scalable Platform for Nanodevice Fabrication
Topic: Nanotechnology
Published: 7/11/2011
Author: Babak Nikoobakht
Abstract: Optical lithography continues to be the popular technique for further miniaturization of electronic circuitry and its components. However, as further device miniaturization continues, complexity of pattern generation and cost increase; therefore th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908140

338. Surface-plasmon-enhanced electric fields in two-dimensional arrays of gold nanodisks
Topic: Nanotechnology
Published: 8/4/2008
Authors: Ward L Johnson, Sudook A Kim, Zhandos Utegulov, B. T. Draine
Abstract: Electric-field distributions in two-dimensional arrays of gold nanodisks on Si3N4 membranes are modeled, using the discrete-dipole approximation, as a function of nanodisk diameter (20 − 50 nm), height (10 − 100 nm), ratio of the array sp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854107

339. Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology.
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6864
Topic: Nanotechnology
Published: 1/1/2002
Authors: Chad R Snyder, J P. Looney, M P Casassa
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853823

340. Synthesis and Characterization of Monolayer Bimetallic Surfaces: A Synchrotron NEXAFS and XPS Study
Topic: Nanotechnology
Published: 12/8/2009
Authors: R. Rettew, J. Guthrie, Cherno Jaye, Daniel A Fischer, Faisal Alamgir
Abstract: Surface limited redox replacement (SLRR) is a potentially powerful tool for atomic monolayer-scale model catalyst fabrication for a plethora of spectroscopic techniques. This paper compares overpotential Ni deposition as an intermediary for SLRR with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903790



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