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Topic Area: Nanotechnology
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Displaying records 321 to 330 of 391 records.
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321. Spin Transfer Torques by Point-Contact Spin injection
Topic: Nanotechnology
Published: 8/24/2009
Authors: Tingyong Chen, Yi Ji, S X Huang, C L Chien, Mark D Stiles
Abstract: Spin-transfer torques (STT) provide a new mechanism to alter the magnetic configuration in magnetic heterostructures, a feat previously only achieved by an external magnetic field. A current flowing perpendicular through a noncollinear magnetic spin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903458

322. Spring constant calibration of AFM cantilevers with a piezoresistive cantilever transfer standard
Topic: Nanotechnology
Published: 9/24/2007
Authors: Eric Langlois, G. A. Shaw, J. A. Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers used in atomic force microscopy (AFM) by means of a piezoresistive cantilever. Before use, the piezoresistive cantilever was calibrated with an absolute force standard, the NIST el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50568

323. Stable Field Emission from Nanoporous Silicon Carbide
Topic: Nanotechnology
Published: 2/15/2013
Authors: Myung Gyu Kang, Henri J Lezec, Fred Sharifi
Abstract: A new method for fabrication of high current density field emitters based on nanoporous silicon carbide is presented. The emitters are monolithic structures which do not require high temperature gas phase synthesis and the process is compatible with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910029

324. Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
Topic: Nanotechnology
Published: 1/1/2013
Authors: Vincent A Hackley, Frank W DelRio
Abstract: The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM)to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike ele ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912221

325. Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy: I. Results for Peak Binding Energies
Topic: Nanotechnology
Published: 10/1/1998
Authors: Joseph M Conny, Cedric John Powell, Lloyd A. Currie
Abstract: Standard test data(STD) are simulations of analytical instrument responses that help determine the veracity of computer-based, data analysis procedures that are typically used with instruments. The STD were developed for determining errors in peak p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831051

326. Standardization of Isotope Ratio Measurements for Doping Control
Topic: Nanotechnology
Published: 12/1/2004
Author: R Michael Verkouteren
Abstract: Pharmaceutical steroids are known to differ in isotopic composition from those produced naturally in the body. By measuring the ^u13^ C/^u12^C ratio of specific steroids deteched in urine, the technique of Gas Chromatography-Combustion-Isotope Rati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831328

327. Steady-state and transient photoconductivity in c-axis GaN nanowires grown by nitrogen-plasma-assisted molecular beam epitaxy
Topic: Nanotechnology
Published: 2/12/2010
Authors: Norman A Sanford, Paul Timothy Blanchard, Kristine A Bertness, Lorelle Mansfield, John B Schlager, Aric Warner Sanders, Alexana Roshko, Beau Burton, Steven George
Abstract: Analysis of steady-state and transient photoconductivity measurements at room temperature performed on c-axis oriented GaN nanowires yielded estimates of free carrier concentration, drift, mobility, surface band bending, and surface capture coefficie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33133

328. Storage Wars: How citrate capped silver nanoparticle suspensions are affected by not-so-trivial decisions
Topic: Nanotechnology
Published: 3/21/2014
Authors: Justin M Gorham, Anne B Rohlfing, Katrice A Lippa, Robert I. MacCuspie, Amy Hemmati, Richard D Holbrook
Abstract: A critical but often overlooked component of silver nanoparticle (AgNPs) suspensions involves their behavior following short- and long-term storage. The current study investigates the integrity of citrate-capped AgNP suspensions, nominally 20 nm in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913638

329. Strategies for Nanoscale Contour Metrology using Critical Dimension Atomic Force Microscopy
Topic: Nanotechnology
Published: 9/30/2011
Authors: Ndubuisi George Orji, Ronald G Dixson, Andras Vladar, Michael T Postek
Abstract: Contour metrology is one of the techniques used to verify optical proximity correction (OPC) in lithography models. The use of these methods, which are known as resolution enhancement techniques (RET), are necessitated by the continued decrease in f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909559

330. Structural and Electrical Characterization of Flip Chip Laminated omega-functionalized thiols
Topic: Nanotechnology
Published: 4/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907067



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