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Topic Area: Nanotechnology
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Displaying records 321 to 330 of 367 records.
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321. Synthesis, Structural Characterization, and Electronic Structure of Single-Crystalline CuxV2O5 Nanowires
Topic: Nanotechnology
Published: 4/6/2009
Authors: Daniel A Fischer, C Patridge, Cherno Jaye, H Zhang, Amy Marschilok, E Takeuchi, S Banerjee
Abstract: Single-crystalline copper vanadium oxide nanowires β'-CuxV2O5 (x ~ 0.60) have been synthesized by the hydrothermal reduction of bulk CuV2O6 using small-molecule aliphatic alcohols as reducing agents. The prepared copper vanadium bronze nanow ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901684

322. Synthetic Approach for Tunable, Size-Selective Formation of Monodisperse, Diphosphine-Protected Gold Nanoclusters
Topic: Nanotechnology
Published: 8/10/2010
Authors: John M Pettibone, Jeffrey W Hudgens
Abstract: Most nanoparticle syntheses, including those based on the Brust-Schiffrin method, produce a mixture of different metal core sizes. This report presents a new strategy for controlling the size and dispersity of ultra-small nanoclusters through select ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905721

323. TSV Reveal height and bump dimension metrology by the TSOM method
Topic: Nanotechnology
Published: 4/30/2013
Authors: Ravikiran Attota, Haesung Park, Victor Vartanian, Ndubuisi George Orji, Richard A Allen
Abstract: Through-focus scanning optical microscopy (TSOM) transforms conventional optical microscopes into truly 3D metrology tools for nanoscale- to- microscale dimensional analysis with nanometer-scale sensitivity. Although not a resolution enhancement meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913667

324. Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, James Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831399

325. Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831413

326. Temperature-Controlled Depth Profiling in Polymeric Biomaterials Using Cluster Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, J Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile through various polymeric biomaterials at a series of temperatures from -125 oC to 150 oC. The depth profile characteristics (e.g. inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831404

327. Temperature-Programmed Electrospray-Differential Mobility Analysis for Characterization of Ligated Nanoparticles in Complex Media
Topic: Nanotechnology
Published: 8/12/2013
Authors: De-Hao D. Tsai, Frank W DelRio, John M Pettibone, Pin Ann Lin, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: In this study, an electrospray-differential mobility analyzer (ES-DMA) was operated with an aerosol flow-mode, temperature-programmed approach to enhance its ability to characterize the particle size distributions (PSDs) of nanoscale particles (NPs) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913860

328. Tensile measurement of single crystal gallium nitride nanowires on MEMS test stages
Topic: Nanotechnology
Published: 4/18/2010
Authors: J. J. Brown, A. I. Baca, Kristine A Bertness, D. A. Dikin, R. S. Ruoff, Victor M. Bright
Abstract: This paper reports the first direct tensile tests on nearly defect free, n-type (Si-doped) gallium nitride single crystal nanowires. Here, for the first time, nanowires have been integrated with actuated, active microelectromechanical (MEMS) structur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902539

329. Terbium-Doped Magnetite Nanocrystals for Multimodal Imaging Agents
Topic: Nanotechnology
Published: Date unknown
Authors: Katherine P Rice, Stephen E Russek, Roy Howard Geiss, Justin M Shaw, Robert John Usselman, Eric R Evarts, Thomas J Silva, Hans Toya Nembach, Elke Arenholz, Yves Idzerda
Abstract: High quality cubic Tb-doped magnetite nanocrystals have been fabricated and have shown that the Tb is incorporated into the octahedral 3+ sites. Magnetization and FMR data indicate that the Tb spins are weakly coupled to the iron spin lattice at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914472

330. The Cooper Pair Transistor
Topic: Nanotechnology
Published: 9/17/2010
Author: Jose Alberto Aumentado
Abstract: The Cooper pair transistor (CPT) is a superconducting electrometer that has applications in quantum information as well as fundamental superconductivity studies. Since it operates in a near-dissipationless mode, it has potential as a minimally inva ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902021



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