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Displaying records 311 to 320 of 402 records.
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311. SRM 8411: Report of Investigation, Research Material 8411 Mixed Asbestos Research Fiber
Series: OTHER
Topic: Nanotechnology
Published: 11/18/1988
Authors: Eric B Steel, J. J. Sheridan, Cynthia J Zeissler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902149

312. Sample Preparation Protocols for Realization of Reproducible Characterization of Single-walled Carbon Nanotubes
Topic: Nanotechnology
Published: 12/1/2009
Authors: Angela R Hight Walker, Jeffrey A Fagan, Stephanie A Hooker, Michael T Postek, Stephen A Wise, Andras Vladar, Rolf Louis Zeisler
Abstract: Harmonized sample pre-treatment is an integral first step in ensuring metrological quality of measurements as regards repeatability, inter-laboratory reproducibility and commutability. The development of standard preparation methods for SWCNT sample ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901229

313. Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source
Topic: Nanotechnology
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NS ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831210

314. Secondary Ion Mass Spectrometry Using Cluster Primary Ion Beams
Topic: Nanotechnology
Published: 1/1/2003
Authors: John G Gillen, Albert J. Fahey
Abstract: At the National Institute of Standards and Technology (NIST) we have a capability for conducting cluster SIMS experiments on both our ion microscope and TOF-SIMS instruments. This paper will review our recent work on cluster ion source development, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831247

315. Secondary Ion Yield Matrix Effects in SIMS Depth Profiles of Si/Ge Multilayers
Topic: Nanotechnology
Published: 4/1/1989
Authors: John G Gillen, J M. Phelps, Randall W. Nelson, Peter Williams, Steven M. Hues
Abstract: Thin multilayer samples of Si/Ge, with individual layer thicknesses of 4-33 nm, have been analyzed by secondary ion mass spectrometry (SIMS) using Ar+, O2+ and Cs+ primary ion beams. Bombardment with both Ar+ and O2+ produced positive secondary ion d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902086

316. Selective Oxidation of Glycerol by Highly Active Bimetallic Catalysts at Ambient Temperature under Base Free Conditions
Topic: Nanotechnology
Published: 8/24/2011
Authors: Andrew A Herzing, Gemma L. Brett, Peter Miedziak, Nikolaos Dimitratos, Meenakshisundaram Sankar, Marco Conte, Jose Antonio Lopez-Sanchez, David W Knight, Stuart H Taylor, Graham J Hutchings, Qian He, Christopher J Kiely
Abstract: AuPt or AuPd nanoparticles when supported on Mg(OH)2 are highly active for the selective oxidation of glycerol under base-free conditions at ambient temperatures. When bimetallic particles with the appropriate composition are prepared, catalysts wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907936

317. Semiconductor Nanocrystal Probes for Human Metaphase Chromosomes
Topic: Nanotechnology
Published: 2/1/2004
Authors: Yan Xiao, Peter E. Dr. Barker
Abstract: Novel inorganic fluorophores called semiconductor nanocrystals have recently been incorporated into protein, antibody and microbead oligonucleotide detection methods where previously, organic dyes were universally employed. To improve quantitation o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830407

318. Sensitivity of gold nano conductors to common contaminations ‹ ab initio results
Topic: Nanotechnology
Published: 5/29/2013
Authors: Shmuel Barzilai, Francesca M Tavazza, Lyle E Levine
Abstract: Gold nanowire chains are considered a good candidate for nanoelectronic devices because they exhibit remarkable structural and electrical properties. A previous study shows that the beryllium terminated BeO (0001) surface may be a useful platform for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913345

319. Shape Factors of ISO 12103-A3 (Medium Test Dust)
Topic: Nanotechnology
Published: 11/1/2000
Authors: Robert A Fletcher, David S. Bright
Abstract: A new derivative of Arizona sand, ISO Medium Test Dust, is coming into use as a liquid optical particle count calibrant. ISO Medium Test Dust and optical particle counters are used to test filtering efficiency. Particle shape plays a role in both fil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831146

320. Si Resonant Interband Tunnel Diodes Grown by Low-Temperature Molecular Beam Epitaxy
Topic: Nanotechnology
Published: 8/1/1999
Authors: P E Thompson, K D Hobart, M E Twigg, G Jernigan, T E Dillon, S L Rommel, P R Berger, David S Simons, P Chi, R Lake, A C Seabaugh
Abstract: Si resonant interband tunnel diodes that demonstrate negative differential resistance at room temperature are presented. The structures were grown using low temperature (320 C) molecular beam epitaxy followed by a post-growth anneal. After a 650 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831118



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