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Topic Area: Nanotechnology
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Displaying records 311 to 320 of 383 records.
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311. Size-related plasticity effects in AFM silicon cantilever tips
Topic: Nanotechnology
Published: 4/17/2006
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: We are developing dynamic atomic force microscopy (AFM) techniques to determine nanoscale elastic properties. Atomic force acoustic microscopy (AFAM) makes use of the resonant frequencies of an AFM cantilever while its tip contacts the sample surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50330

312. Small fluctuations in epitaxial growth via conservative noise
Topic: Nanotechnology
Published: 7/7/2011
Authors: Paul Nathan Patrone, Rongrong Wang, Dionisios Margetis
Abstract: We study the combined effect of growth (material deposition from above) and nearest-neighbor entropic and force-dipole interactions in a stochastically perturbed system of N line defects (steps) on a vicinal crystal surface in 1+1 dimensions. Firs ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908523

313. Spectral Line-by-Line Pulse Shaping of On-Chip Microresonator Frequency Combs
Topic: Nanotechnology
Published: 12/1/2011
Authors: Fahmida Ferdous, Houxun H. Miao, Daniel E. Leaird, Kartik A Srinivasan, Jian Wang, Lei Chen, Leo Tom Varghese, Andrew M Weiner
Abstract: We report, for the first time to the best of our knowledge, spectral phase characterization and line-by-line pulse shaping of an optical frequency comb generated by nonlinear wave mixing in a micro-ring resonator. The comb is compressed to a train o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907964

314. Spin Transfer Torques by Point-Contact Spin injection
Topic: Nanotechnology
Published: 8/24/2009
Authors: Tingyong Chen, Yi Ji, S X Huang, C L Chien, Mark D Stiles
Abstract: Spin-transfer torques (STT) provide a new mechanism to alter the magnetic configuration in magnetic heterostructures, a feat previously only achieved by an external magnetic field. A current flowing perpendicular through a noncollinear magnetic spin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903458

315. Spring constant calibration of AFM cantilevers with a piezoresistive cantilever transfer standard
Topic: Nanotechnology
Published: 9/24/2007
Authors: Eric Langlois, G. A. Shaw, J. A. Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers used in atomic force microscopy (AFM) by means of a piezoresistive cantilever. Before use, the piezoresistive cantilever was calibrated with an absolute force standard, the NIST el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50568

316. Stable Field Emission from Nanoporous Silicon Carbide
Topic: Nanotechnology
Published: 2/15/2013
Authors: Myung Gyu Kang, Henri J Lezec, Fred Sharifi
Abstract: A new method for fabrication of high current density field emitters based on nanoporous silicon carbide is presented. The emitters are monolithic structures which do not require high temperature gas phase synthesis and the process is compatible with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910029

317. Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
Topic: Nanotechnology
Published: 1/1/2013
Authors: Vincent A Hackley, Frank W DelRio
Abstract: The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM)to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike ele ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912221

318. Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy: I. Results for Peak Binding Energies
Topic: Nanotechnology
Published: 10/1/1998
Authors: Joseph M Conny, Cedric John Powell, Lloyd A. Currie
Abstract: Standard test data(STD) are simulations of analytical instrument responses that help determine the veracity of computer-based, data analysis procedures that are typically used with instruments. The STD were developed for determining errors in peak p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831051

319. Standardization of Isotope Ratio Measurements for Doping Control
Topic: Nanotechnology
Published: 12/1/2004
Author: R Michael Verkouteren
Abstract: Pharmaceutical steroids are known to differ in isotopic composition from those produced naturally in the body. By measuring the ^u13^ C/^u12^C ratio of specific steroids deteched in urine, the technique of Gas Chromatography-Combustion-Isotope Rati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831328

320. Steady-state and transient photoconductivity in c-axis GaN nanowires grown by nitrogen-plasma-assisted molecular beam epitaxy
Topic: Nanotechnology
Published: 2/12/2010
Authors: Norman A Sanford, Paul Timothy Blanchard, Kristine A Bertness, Lorelle Mansfield, John B Schlager, Aric Warner Sanders, Alexana Roshko, Beau Burton, Steven George
Abstract: Analysis of steady-state and transient photoconductivity measurements at room temperature performed on c-axis oriented GaN nanowires yielded estimates of free carrier concentration, drift, mobility, surface band bending, and surface capture coefficie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33133



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