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Topic Area: Nanotechnology
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Displaying records 311 to 320 of 387 records.
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311. Simultaneous Multianalyte Detection with a Nanometer-Scale Pore
Topic: Nanotechnology
Published: 5/15/2001
Authors: John J Kasianowicz, S. E. Henrickson, H H. Weetall, B Robertson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903581

312. Single laser pulse effects on suspended-Au-nanoparticle size distributions and morphology
Topic: Nanotechnology
Published: 4/30/2013
Authors: Richard E Cavicchi, Douglas C Meier, Cary Presser, Suvajyoti S. Guha
Abstract: Samples of suspended gold nanoparticles in the diameter range 10 nm to 100 nm were subjected to a single 7 ns pulse from a 532 nm laser to determine the effects of laser power on particle size distribution, mean size, and morphology. The experime ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912928

313. Single molecule confocal fluorescence lifetime correlation spectroscopy for accurate nanoparticle size determination
Topic: Nanotechnology
Published: 5/15/2014
Authors: Bonghwan Chon, Kimberly A Briggman, Jeeseong Hwang
Abstract: We report on an experimental procedure in confocal single molecule fluorescence lifetime correlation spectroscopy (FLCS) to determine the range of excitation power and molecule concentration in solution under which the application of an unmodified ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914381

314. Single particle biophysics: Nanopores, liposomes and mitochondrial diseases
Topic: Nanotechnology
Published: 3/22/2010
Author: Joseph Earl Reiner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905288

315. Size-related plasticity effects in AFM silicon cantilever tips
Topic: Nanotechnology
Published: 4/17/2006
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: We are developing dynamic atomic force microscopy (AFM) techniques to determine nanoscale elastic properties. Atomic force acoustic microscopy (AFAM) makes use of the resonant frequencies of an AFM cantilever while its tip contacts the sample surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50330

316. Small fluctuations in epitaxial growth via conservative noise
Topic: Nanotechnology
Published: 7/7/2011
Authors: Paul N. Patrone, Rongrong Wang, Dionisios Margetis
Abstract: We study the combined effect of growth (material deposition from above) and nearest-neighbor entropic and force-dipole interactions in a stochastically perturbed system of N line defects (steps) on a vicinal crystal surface in 1+1 dimensions. Firs ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908523

317. Spectral Line-by-Line Pulse Shaping of On-Chip Microresonator Frequency Combs
Topic: Nanotechnology
Published: 12/1/2011
Authors: Fahmida Ferdous, Houxun H. Miao, Daniel E. Leaird, Kartik A Srinivasan, Jian Wang, Lei Chen, Leo Tom Varghese, Andrew M Weiner
Abstract: We report, for the first time to the best of our knowledge, spectral phase characterization and line-by-line pulse shaping of an optical frequency comb generated by nonlinear wave mixing in a micro-ring resonator. The comb is compressed to a train o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907964

318. Spin Transfer Torques by Point-Contact Spin injection
Topic: Nanotechnology
Published: 8/24/2009
Authors: Tingyong Chen, Yi Ji, S X Huang, C L Chien, Mark D Stiles
Abstract: Spin-transfer torques (STT) provide a new mechanism to alter the magnetic configuration in magnetic heterostructures, a feat previously only achieved by an external magnetic field. A current flowing perpendicular through a noncollinear magnetic spin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903458

319. Spring constant calibration of AFM cantilevers with a piezoresistive cantilever transfer standard
Topic: Nanotechnology
Published: 9/24/2007
Authors: Eric Langlois, G. A. Shaw, J. A. Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers used in atomic force microscopy (AFM) by means of a piezoresistive cantilever. Before use, the piezoresistive cantilever was calibrated with an absolute force standard, the NIST el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50568

320. Stable Field Emission from Nanoporous Silicon Carbide
Topic: Nanotechnology
Published: 2/15/2013
Authors: Myung Gyu Kang, Henri J Lezec, Fred Sharifi
Abstract: A new method for fabrication of high current density field emitters based on nanoporous silicon carbide is presented. The emitters are monolithic structures which do not require high temperature gas phase synthesis and the process is compatible with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910029



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