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Displaying records 21 to 30 of 195 records.
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21. Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force Microscopy
Topic: Nanotechnology
Published: 10/15/2008
Authors: Shaw C Feng, Che B. Joung, Theodore Vincent Vorburger
Abstract: Critical Dimension Atomic Force Microscopy (CD-AFM) is a primary means to measure the geometric shapes of walls and trenches on the nanometer scale in laboratories supporting the electronic industry. As the widths of commercially available CD-AFM pro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824690

22. Characterization of Standard Reference Material 2942, Ce-Ion-Doped Glass, Spectral Correction Standard for UV Fluorescence
Topic: Nanotechnology
Published: Date unknown
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Jeffrey R. Anderson, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2942 is a cuvette-shaped, Ce-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance verification of steady-state fluorescence spectrometers. Properties of this st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906188

23. Characterization of Surface Accumulation and Release of Nanosilica During Irradiation of Polymer Nanocomposites with Ultraviolet Light
Topic: Nanotechnology
Published: 8/12/2012
Authors: Tinh Nguyen, Bastien T. Pellegrin, Coralie Bernard, Savelas A Rabb, Paul E Stutzman, Justin M Gorham, Xiaohong Gu, Lee Lijian Yu, Joannie W Chin
Abstract: Nanofillers are increasingly used for enhancing multiple properties of polymeric materials in many applications. However, polymers are susceptible to photodegradation by solar ultraviolet (UV) radiation Therefore, nanofillers in a polymer nanocompos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909878

24. Characterizing Equilibrium in Epitaxial Growth
Topic: Nanotechnology
Published: 2/20/2012
Authors: Paul N. Patrone, Russel Caflisch, Dionisios Margetis
Abstract: Using a kinetic model of epitaxial growth, we describe how geometry controls kinetic pathways through which external deposition influences the state of a vicinal surface. The state of the surface is determined by three key, adjustable parameters: th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909660

25. Chemical Science and Technology Laboratory (CSTL) 2009 Annual Report
Series: NIST Interagency/Internal Report (NISTIR)
Topic: Nanotechnology
Published: 11/17/2009
Authors: Willie E May, Richard R Cavanagh, Dianne L Poster, Michael D. Amos
Abstract: CSTL is entrusted with building, sustaining, and maximizing the chemical measurement system that is criticial to chemical technological innovation, economic competitiveness and new job growth for the benefit of the Nation.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902427

26. Comparison of the Properties of Cellulose Nanocrystals and Cellulose Nanofibrils Isolated From Bacteria, Tunicate, and Wood Processed Using Acid, Enzymatic, Mechanical, and Oxidative Methods
Topic: Nanotechnology
Published: 4/18/2014
Authors: Iulia Alisa Sacui, Jeffrey W Gilman, Ryan C Nieuwendaal, Stephan J Stranick, Henryk Szmacinski, Mehdi Jorfi, Christopher Weder, Johan Foster, Richard Olsson, Daniel Burnett
Abstract: This work describes the study and characterization of native cellulose nanocrystals and nanofibrils (CNCs, CNFs), whose crystallinity, morphology, aspect ratio, and surface chemistry depend on the raw material source and hydrolysis conditions. Me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915137

27. Competitive Adsorption of Thiolated Polyethylene Glycol and Mercaptoproprionic acid on Gold Nanoparticles Measured by Physical Characterization Methods
Topic: Nanotechnology
Published: 5/24/0010
Authors: De-Hao D. Tsai, Frank W DelRio, Robert I. MacCuspie, Tae Joon Cho, Michael Russel Zachariah, Vincent A Hackley
Abstract: Adsorption kinetics between thiolated polyethylene glycol (SH-PEG) and mercaptoproprionic acid (MPA) on gold nanoparticles (Au-NP) were studied using dynamic light scattering (DLS) and electrospray differential mobility analysis (ES-DMA). Through a c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904724

28. Controlled dielectrophoretic nanowire self-assembly using atomic layer deposition and suspended microfabricated electrodes
Topic: Nanotechnology
Published: 5/28/2012
Authors: Kristine A Bertness, Joseph J. Brown, Alicia I Baca, Victor M. Bright
Abstract: Effects of design and materials on the dielectrophoretic self-assembly of individual gallium nitride nanowires (GaN NWs) onto microfabricated electrodes have been experimentally investigated. The use of TiO^d2^ surface coating generated by atomic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910631

29. Controlled nucleation of GaN nanowires grown with molecular beam epitaxy
Topic: Nanotechnology
Published: 7/13/2010
Authors: Kristine A Bertness, Aric Warner Sanders, Devin M. Rourke, Todd E Harvey, Alexana Roshko, Norman A Sanford
Abstract: The location of GaN nanowires was controlled with essentially perfect selectivity using patterned SiNx prior to molecular beam epitaxy growth. Growth was uniform within mask openings and absent on the mask surface for over 95 % of the usable area of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904471

30. Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node
Topic: Nanotechnology
Published: 6/7/2013
Authors: Ravikiran Attota, Benjamin D. Bunday, Victor Vertanian
Abstract: We present results using simulations and experiments to demonstrate metrological applications of the through-focus scanning optical microscopy (TSOM) down to features at and well below the International Technology Roadmap for Semiconductors' 22  ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913353



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