NIST logo

Publications Portal

You searched on:
Topic Area: Nanotechnology
Sorted by: title

Displaying records 281 to 290 of 395 records.
Resort by: Date / Title


281. Prompt Gamma Activation Analysis Enhanced by a Neutron Focusing Capillary Lens
Topic: Nanotechnology
Published: 1/1/1995
Authors: H. Chen, David F. R. Mildner, Robert G Downing, R.L. Paul, Richard M. Lindstrom, Cynthia J Zeissler, Q.F. Xiao, V.A. Sharov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902133

282. Prototype cantilevers for quantitative lateral force microscopy
Topic: Nanotechnology
Published: 9/27/2011
Authors: Mark Reitsma, Richard Swift Gates, Lawrence H Friedman, Robert Francis Cook
Abstract: Prototype cantilevers that enable quantitative micro- to nano-scale surface force measurements using contact-mode atomic force microscopy (AFM) are presented. The ,HammerheadŠ cantilevers allow precise optical lever system calibrations for cantilever ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907018

283. Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt Co Alloy multilayer by SIMS using a Buckminsterfullerene (C60) Source
Topic: Nanotechnology
Published: 5/15/2007
Authors: Kyung Joong Kim, David S Simons, John G Gillen
Abstract: Buckmins erfullerene ion beam has been applied o he dep h profiling of an al erna ing pure P and pure Co mul ilayer. Quan i a ive dep h profiling was performed by secondary ion mass spec rome ry (SIMS) wi h C60 ions using P Co alloy films wi h di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902088

284. Quantitative Elastic-Property Measurements at the Nanoscale with Atomic Force Acoustic Microscopy
Topic: Nanotechnology
Published: 8/31/2005
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos, Roy Howard Geiss
Abstract: We are developing metrology for rapid, quantitative assessment of elastic porperties with nanoscale spatial resolution. Atomic force acoustic microscopy (AFAM) methods enable modulus measurements at either a single point or as a map of local property ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50097

285. Quantitative Measurements of the Size Scaling of Linear and Circular DNA in Nanofluidic Slitlike Confinement
Topic: Nanotechnology
Published: 2/14/2012
Authors: Elizabeth A Strychalski, Jon C Geist, Michael Gaitan, Laurie E Locascio, Samuel M Stavis
Abstract: Quantitative size measurements of single linear and circular DNA molecules in nanofluidic slitlike confinement are reported. A novel experimental method using DNA entropophoresis down a nanofluidic staircase implemented comprehensive variation of sl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908052

286. Quantitative secondary ion mass spectrometry imaging of self-assembled monolayer films for electron beam dose mapping in the environmental scanning electron microscope
Topic: Nanotechnology
Published: 7/1/1998
Authors: John G Gillen, Scott A Wight, David S. Bright, T M. Herne
Abstract: Fluorinated alkanethiol self assembled monolayers (SAM) films immobilized on gold substrates have been used as electron-sensitive resists to map quantitatively the spatial distribution of the primary electron beam scattering in an environmental scann ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831060

287. Quantum Dot Dissemination and Behavior in Bacterial Biofilms
Topic: Nanotechnology
Published: 5/7/2006
Authors: Jayne B Morrow, Richard D Holbrook, Cynthia J Zeissler
Abstract: Quantum dots (QDs) are colloidal semiconductor nanocrystals that photoluminescence emission is proportional to the dot size and have been utilized in fluorescent imaging in biological systems. Biofilms are communities of microorganisms attached to su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902126

288. RAPID INSPECTION OF CARBON NANOTUBE QUALITY
Topic: Nanotechnology
Published: 7/1/2007
Authors: Stephanie A Hooker, Roy Howard Geiss, Aparna Kar
Abstract: Carbon nanotubes have unique properties of interest for applications in aerospace, electronics, and biotechnology. However, the properties of different batches of carbon nanotubes can vary considerably depending on chemical purity and the nanotube ty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50489

289. Radioactive Particle Analysis by Digital Autoradiography
Topic: Nanotechnology
Published: 5/1/2001
Authors: Cynthia J Zeissler, Richard M. Lindstrom, J P McKinley
Abstract: We have been exploring ways to evaluate the activity of radioactive particles that have been detected by phosphor plate digital autoradiography based on photostimulated luminescence (PSL). A PSL system with 25{mu} pixel digitization has been applied ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831184

290. Reaction Mechanism Governing the Formation of 1,3-bis(diphenylphosphino)propane-protected Gold Nanoclusters
Topic: Nanotechnology
Published: 9/19/2011
Authors: Jeffrey W Hudgens, John M Pettibone, Thomas P Senftle, Ryan N. Bratton
Abstract: This report outlines the determination of a reaction mechanism that can be manipulated to develop directed syntheses of gold monolayer protected clusters (MPCs) prepared by the reduction of solutions containing 1,3-bis(diphenylphosphino)propane (L^u3 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909874



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series