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Topic Area: Nanotechnology
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Displaying records 271 to 280 of 342 records.
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271. Semiconductor Nanocrystal Probes for Human Metaphase Chromosomes
Topic: Nanotechnology
Published: 2/1/2004
Authors: Yan Xiao, Peter E. Dr. Barker
Abstract: Novel inorganic fluorophores called semiconductor nanocrystals have recently been incorporated into protein, antibody and microbead oligonucleotide detection methods where previously, organic dyes were universally employed. To improve quantitation o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830407

272. Shape Factors of ISO 12103-A3 (Medium Test Dust)
Topic: Nanotechnology
Published: 11/1/2000
Authors: Robert A Fletcher, David S. Bright
Abstract: A new derivative of Arizona sand, ISO Medium Test Dust, is coming into use as a liquid optical particle count calibrant. ISO Medium Test Dust and optical particle counters are used to test filtering efficiency. Particle shape plays a role in both fil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831146

273. Si Resonant Interband Tunnel Diodes Grown by Low-Temperature Molecular Beam Epitaxy
Topic: Nanotechnology
Published: 8/1/1999
Authors: P E Thompson, K D Hobart, M E Twigg, G Jernigan, T E Dillon, S L Rommel, P R Berger, David S Simons, P Chi, R Lake, A C Seabaugh
Abstract: Si resonant interband tunnel diodes that demonstrate negative differential resistance at room temperature are presented. The structures were grown using low temperature (320 C) molecular beam epitaxy followed by a post-growth anneal. After a 650 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831118

274. Silicon Carbide Nanostructures: A Tight Binding Approach
Topic: Nanotechnology
Published: 6/28/2009
Authors: Anthony D. Patrick, Xiao Dong, Thomas C Allison, Estela Blaisten-Barojas
Abstract: A tight-binding model Hamiltonian is newly parametrized for silicon carbide based on fits to a database of energy points calculated within the density functional theory approach of the electronic energy surfaces of nanoclusters and the total en ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904026

275. Silicon-based Molecular Electronics in the Post-Hype Era
Topic: Nanotechnology
Published: 4/8/2011
Author: Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908431

276. Simulation of lattice strain due to CNT-metal interface
Topic: Nanotechnology
Published: 1/17/2011
Authors: Alexander Y. Smolyanitsky, Vinod K Tewary
Abstract: We report an atomistic molecular statics study of strains in single wall carbon nanotubes (SWCNTs) interfaced with a planar nickel surface. We calculate axial and radial strain distributions along the SWCNT axis. We demonstrate strains of up to 2% ex ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906877

277. Simultaneous Multianalyte Detection with a Nanometer-Scale Pore
Topic: Nanotechnology
Published: 5/15/2001
Authors: John J Kasianowicz, S. E. Henrickson, H H. Weetall, B Robertson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903581

278. Single particle biophysics: Nanopores, liposomes and mitochondrial diseases
Topic: Nanotechnology
Published: 3/22/2010
Author: Joseph Earl Reiner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905288

279. Size-related plasticity effects in AFM silicon cantilever tips
Topic: Nanotechnology
Published: 4/17/2006
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C Hurley
Abstract: We are developing dynamic atomic force microscopy (AFM) techniques to determine nanoscale elastic properties. Atomic force acoustic microscopy (AFAM) makes use of the resonant frequencies of an AFM cantilever while its tip contacts the sample surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50330

280. Small fluctuations in epitaxial growth via conservative noise
Topic: Nanotechnology
Published: 7/7/2011
Authors: Paul Nathan Patrone, Rongrong Wang, Dionisios Margetis
Abstract: We study the combined effect of growth (material deposition from above) and nearest-neighbor entropic and force-dipole interactions in a stochastically perturbed system of N line defects (steps) on a vicinal crystal surface in 1+1 dimensions. Firs ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908523