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Displaying records 11 to 20 of 187 records.
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11. An Integrated Electrochromic Nanoplasmonic Optical Switch
Topic: Nanotechnology
Published: 5/25/2011
Authors: Amit Kumar Agrawal, Benjamin James McMorran, Ceren Susut, Henri J Lezec, Gery R Stafford, Ugo Bertocci, Albert A. Talin
Abstract: no abstract
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908255

12. Analysis of high-Q, gallium nitride nanowire resonators in response to deposited thin films
Topic: Nanotechnology
Published: 1/1/2011
Authors: J. R. Montague, M. Dalberth, J. M. Gray, D. Seghete, Kristine A Bertness, S M George, Victor M. Bright, C. T. Rogers, Norman A Sanford
Abstract: Gallium nitride nanowires (GaN-NWs) are systems of interest for mechanical resonance-based sensors due to their small mass and, in the case of c-axis NWs, high mechanical quality (Q) factors of 10,000‹100,000. We report on singly-clamped NW mechanic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903757

13. Asphaltene Adsorption onto Self-Assembled Monolayers of Alkyltrichlorosilanes of Varying Chain Length
Topic: Nanotechnology
Published: 12/5/2009
Authors: Daniel A Fischer, Saloman Turgman-Cohen, P K Kilpatrick, Jan Genzer
Abstract: The adsorption of asphaltenes onto flat silica surfaces modified with self-assembled monolayers (SAMs) of alkyltrichlorosilanes of varying thickness due to a variable number of carbon atoms (NC) has been studied by means of contact angle measurements ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903788

14. Block Copolymer Thin Films: Physics and Applications
Topic: Nanotechnology
Published: 2/15/2001
Authors: Michael J Fasolka, A M Mayes
Abstract: A two-part review of research concerning block copolymer thin films is presented. The first section summarizes experimental and theoretical studies of the fundamental physics of these systems, concentrating upon the forces that govern film morpholog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841503

15. Capabilities of Single Particle Inductively Coupled Plasma Mass Spectrometry for the Size Measurement of Nanoparticles: A Case Study on Gold Nanoparticles
Topic: Nanotechnology
Published: 2/28/2014
Authors: Jingyu Liu, Karen E Murphy, Robert I. MacCuspie, Michael R Winchester
Abstract: The increasing application of engineered nanomaterials in consumer and medical products has motivated the development of single particle inductively coupled plasma mass spectrometry (spICP-MS) for characterizing nanomaterials under realistic envi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914724

16. Capillary Instability in Nanoimprinted Polymer Films
Topic: Nanotechnology
Published: 5/21/2009
Authors: Kyle J. Alvine, Yifu Ding, Hyun Wook Ro, Brian C. Okerberg, Alamgir Karim, Christopher L Soles, Jack F Douglas
Abstract: Capillary forces play an active role in defining the equilibrium structure of nanoscale structures. This effect can be especially pronounced in soft materials such as polymers near or above their glass transition temperatures where material flow is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852751

17. Challenges and Opportunities of Organic Electronics
Topic: Nanotechnology
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

18. Challenges, Strategies and Opportunities for Measuring Carbon Nanotubes within a Polymer Composites by X-ray Photoelectron Spectroscopy
Series: Special Publication (NIST SP)
Report Number: 1200-10
Topic: Nanotechnology
Published: 3/14/2015
Authors: Justin M Gorham, Jeremiah Wallace Woodcock, Keana C K Scott
Abstract: FOREWORD This NIST Special Publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917794

19. Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force Microscopy
Topic: Nanotechnology
Published: 10/15/2008
Authors: Shaw C Feng, Che B. Joung, Theodore Vincent Vorburger
Abstract: Critical Dimension Atomic Force Microscopy (CD-AFM) is a primary means to measure the geometric shapes of walls and trenches on the nanometer scale in laboratories supporting the electronic industry. As the widths of commercially available CD-AFM pro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824690

20. Characterization of Standard Reference Material 2942, Ce-Ion-Doped Glass, Spectral Correction Standard for UV Fluorescence
Topic: Nanotechnology
Published: Date unknown
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Jeffrey R. Anderson, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2942 is a cuvette-shaped, Ce-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance verification of steady-state fluorescence spectrometers. Properties of this st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906188



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