NIST logo

Publications Portal

You searched on:
Topic Area: Nanotechnology
Sorted by: title

Displaying records 1 to 10 of 392 records.
Resort by: Date / Title


1. 2009 ITRS Chapter: Radio Frequency and Analog/Mixed-Signal Technologies for Wireless Communications
Topic: Nanotechnology
Published: 1/4/2010
Authors: Herbert S Bennett, John J. Pekarik, Margaret Huang
Abstract: RF and AMS technologies are essential and critical technologies for the rapidly growing wireless communications market. (A list of acronyms is at the end of this paper.) These technologies depend on many materials systems, some of which are compatib ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904526

2. 3-Dimensional Compositional Analysis in Drug Eluting Stent (DES) Coatings Using Cluster Secondary Ion Mass Spectrometry (Cluster SIMS)
Topic: Nanotechnology
Published: 2/1/2008
Authors: Christine M. Mahoney, A M Belu, Albert J. Fahey
Abstract: Cluster Secondary Ion Mass Spectrometry (cluster SIMS) employing an SF5+ polyatomic primary ion sputter source in conjunction with a Bi3+ analysis source was used to obtain 3-dimensional molecular information in polymeric-based drug eluting stent (DE ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831450

3. 3D Molecular Imaging SIMS
Topic: Nanotechnology
Published: 7/1/2006
Authors: John G Gillen, Albert J. Fahey, M Wagner, Christine M. Mahoney
Abstract: Thin monolayer and bilayer filsm of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF^d5^+ polyatomic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831393

4. 3D Nanoscale Characterization of Thin-Film Organic Photovoltaic Device Structures via Spectroscopic Contrast in the TEM
Topic: Nanotechnology
Published: 10/21/2010
Authors: Andrew A Herzing, Lee J Richter, Ian M. Anderson
Abstract: The three-dimensional characterization of third generation photovoltaic device structures at the nanometer scale is essential to the development of efficient, reliable, and inexpensive solar cell technologies. Electron tomography is a powerful metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905254

5. A Benchmark Study on the Thermal Conductivity of Nanofluids
Topic: Nanotechnology
Published: 11/13/2009
Authors: Jacopo Buongiorno, David Venerus, Naveen Prabhat, Thomas McKrell, Jessica Townsend, Rebecca Christianson, Yuriy Tolmachev, Pawel Keblinski, Lin-wen Hu, Jorge Alvarado, In Cheol Bang, Sandra Bishnoi, Marco Bonetti, Frank Botz, Anselmo Cecre, Yun Chang, Gang Chen, Haisheng Chen, Sung Jae Chung, Minking Chyu, Sarit Das, Roberto Di Paola, Yulong Ding, F. Dubois, Grzegorz Dzido, Jacob Eapen, Werner Escher, Denis Funfschilling, Quentin Galand, Jinwei Gao, Patricia Gharagozloo, Kenneth Goodson, Jorge Gustova Jin, Haiping Hong, Mark Horton, Carlo Iorio, Andrzej Jarzebski, Yiran Jiang, L.W. Jin, Stephan Kabelac, Aravind Kamath, Mark A Kedzierski, Chongyoup Kim, Ji Hyun Kim, Sukwon Kim, Lim Geok Kieng, K Leong, Indranil Manna, Bruno Michel, Rui Ni, Hrishikesh Patel, John Philip, Dimos Poulikakos, Cecile Reynaud, Raffaele Savino, Pawan Singh, Pengxiang Song, T. Sundararajan, Elena Timofeeva, Todd Tritcak, A.N. Turanov, Stefan Van Vaerenbergh, Dongsheng Wen, Sanjeeva Witharana, Charles Chun Yang, W.-H. Yeh, Xiao-Zheng Zhao, Sheng-Qi Zhou
Abstract: This article reports on the International Nanofluid Property Benchmark Exercise (INPBE) in which the thermal conductivity of identical samples of colloidal dispersions of nanoparticles, or nanofluids , was measured by over 30 organizations worldwi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902860

6. A Focused Chromium Ion Beam
Topic: Nanotechnology
Published: 10/21/2010
Authors: Adam V Steele, Brenton John Knuffman, Jabez J McClelland, Jon Orloff
Abstract: With the goal of expanding the capabilities of focused ion beam microscopy and milling systems, we have demonstrated nanoscale focusing of chromium ions produced in a magneto-optical trap ion source (MOTIS). Neutral chromium atoms are captured into ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906025

7. A Glowing Future for Lab on a Chip Testing Standards
Topic: Nanotechnology
Published: 6/28/2012
Author: Samuel M Stavis
Abstract: Testing standards are more fundamental from a metrological perspective and less controversial from an industrial perspective than product standards, representing a path of less resistance towards the standardization and commercialization of lab on a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910438

8. A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-electrotechnologies
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 7/30/2009
Authors: Herbert S Bennett, Joan Pellegrino, Howard Andres
Abstract: In 2006, the National Institute of Standards and Technology conducted an assessment of the U.S. measurement system (USMS), which encompasses all private and public organizations that develop, supply, use, or ensure the validity of measurement resul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902431

9. A New Monte Carlo Application for Complex Sample Geometries
Topic: Nanotechnology
Published: 11/1/2005
Author: Nicholas W m Ritchie
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831377

10. A Novel Method to Covalently Functionalize Carbon Nanotubes with Isocyanates
Topic: Nanotechnology
Published: 9/30/2009
Authors: Tinh T. Nguyen, Aline Granier, Kristen L Steffens, Hajin Lee, Naomi Eidelman, Jonathan W. Martin
Abstract: We have developed a novel method to covalently functionalize carbon nanotubes (CNTs) that carry free isocyanate (N=C=O) groups. NCO-functionalized CNTs (NCO-fCNTs) are very desirable, because the NCO group is highly reactive with hydrogen-active grou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903766



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series