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Topic Area: Nanotechnology
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Displaying records 61 to 70 of 386 records.
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61. Microscopy for STEM Educators
Topic: Nanotechnology
Published: 5/21/2012
Authors: Michael T Postek, Mary B Satterfield, Bradley N Damazo, Robert Gordon
Abstract: The future of our nation hinges on our ability to prepare our next generation to be innovators in science, technology, engineering and math (STEM). Excitement for STEM must begin at the earliest stages of our education process. Yet, today far too few ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910648

62. Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Nanotechnology
Published: 4/10/2012
Authors: Ravikiran (Ravikiran) Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910

63. Significantly Improved Trapping Lifetime of Nanoparticles in an Optical Trap using Feedback Control
Topic: Nanotechnology
Published: 4/10/2012
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, Jason John Gorman
Abstract: We demonstrate an increase in trapping lifetime for optically trapped nanoparticles by more than an order of magnitude using feedback control. This has been demonstrated through simu- lation and experimental results for 100, nm gold particles and 3 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909642

64. On CD-AFM bias related to probe bending
Topic: Nanotechnology
Published: 4/9/2012
Authors: Vladimir A Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910903

65. Optical fiber-coupled cryogenic radiometer with carbon nanotube absorber
Topic: Nanotechnology
Published: 4/1/2012
Authors: David J Livigni, Nathan A Tomlin, Christopher L Cromer, John H Lehman
Abstract: A cryogenic radiometer was constructed for direct-substitution optical fiber power measurements. The cavity is intended to operate at the 3 K temperature stage of a dilution refrigerator or 4.2 K stage of a liquid cryostat. The optical fiber is remov ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909507

66. Modeling the effects of acid amplifiers on photoresist stochastics
Topic: Nanotechnology
Published: 3/23/2012
Authors: Gregg M. Gallatin, Patrick Naulleau, Robert Brainard
Abstract: The tradeoff between Resolution, Line Edge Roughness (LER) and Sensitivity, the so called RLS tradeoff, continues to be a difficult challenge, especially for EUV lithography. Acid amplifiers have recently been proposed as a method to improve upon t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910777

67. Tumor Necrosis Factor Interaction with Gold Nanoparticles
Topic: Nanotechnology
Published: 3/14/2012
Authors: De-Hao D. Tsai, Sherrie R. Elzey, Frank W DelRio, Robert I. MacCuspie, Suvajyoti S. Guha, Michael Russel Zachariah, Athena M Keene, Jeffrey D Clogston, Vincent A Hackley
Abstract: We report on a systematic investigation of molecular conjugation of tumor necrosis factor protein-α (TNF) onto gold nanoparticles (AuNPs) and the subsequent binding behavior to its antibody (anti-TNF). We employ a combination of physical and spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909899

68. Electrospray ‹ Differential Mobility Analysis as an Orthogonal Tool to Size Exclusion Chromatography for Characterization of Protein Aggregates
Topic: Nanotechnology
Published: 3/12/2012
Authors: Suvajyoti S. Guha, Joshua R. Wayment, Michael J Tarlov, Michael Russel Zachariah
Abstract: The biopharmaceutical industry characterizes and quantifies aggregation of protein therapeutics using multiple analytical techniques to cross validate results. Here we demonstrate the use of electrospray-differential mobility analysis (ES-DMA), a gas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909715

69. Fractional Diffusion, Low Exponent Levy Stable Laws, and Slow Motion Denoising of Helium Ion Microscope Nanoscale Imagery
Series: Journal of Research (NIST JRES)
Report Number: 117.006
Topic: Nanotechnology
Published: 2/22/2012
Authors: Andras Vladar, Alfred S Carasso
Abstract: Helium ion microscopes (HIM) are capable of acquiring images with better than 1nm resolution, and HIM images are particularly rich in morphological surface details. However, such images are generally quite noisy. A major challenge is to denoise the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906607

70. Characterizing Equilibrium in Epitaxial Growth
Topic: Nanotechnology
Published: 2/20/2012
Authors: Paul N. Patrone, Russel Caflisch, Dionisios Margetis
Abstract: Using a kinetic model of epitaxial growth, we describe how geometry controls kinetic pathways through which external deposition influences the state of a vicinal surface. The state of the surface is determined by three key, adjustable parameters: th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909660



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