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Displaying records 51 to 60 of 223 records.
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51. Specimen-thickness effects on transmission Kikuchi patterns in the scanning electron microscope
Topic: Nanotechnology
Published: 3/24/2014
Authors: Katherine P. Rice, Robert R Keller, Mark Stoykovich
Abstract: We report the effects of varying specimen thickness onthe generation of transmission Kikuchi patterns in the scanning electron microscope. Diffraction patterns sufficient for automated indexing were observed from films spanning nearly three orders of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914420

52. Frequency, amplitude, and phase measurement in contact resonance atomic force microscopies
Topic: Nanotechnology
Published: 3/12/2014
Authors: Gheorghe Stan, Santiago de Jesus Solares Rivera
Abstract: We analysed the resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, differing in the method used to excite the system (cantilever base vs. sample exc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914965

53. Capabilities of Single Particle Inductively Coupled Plasma Mass Spectrometry for the Size Measurement of Nanoparticles: A Case Study on Gold Nanoparticles
Topic: Nanotechnology
Published: 2/28/2014
Authors: Jingyu Liu, Karen E Murphy, Robert I. MacCuspie, Michael R Winchester
Abstract: The increasing application of engineered nanomaterials in consumer and medical products has motivated the development of single particle inductively coupled plasma mass spectrometry (spICP-MS) for characterizing nanomaterials under realistic envi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914724

54. Head and Media Challenges for 3 Tb/in^u2^ Microwave Assisted Magnetic Recording
Topic: Nanotechnology
Published: 2/3/2014
Authors: Thomas J Silva, Justin M Shaw, Hans Toya Nembach, Mike Mallary, Kumar Srinivasan, Gerado Bertero, Dan Wolf, Christian Kaiser, Michael Chaplin, Mahendra Pakala, Leng Qunwen, Yiming Wang, Carl Elliot, Lui Francis
Abstract: A specific design for Microwave Assisted Magnetic Recording (MAMR) at about 3Tb/in^u2^ (0.47 Tb/cm^u2^ or 4.7 Pb/m^u2^) is discussed in detail to highlight the challenges of MAMR and to contrast its requirements with conventional Perpendicular Magnet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914220

55. Template synthesis of gold nanoparticles with an organic molecular cage
Topic: Nanotechnology
Published: 1/16/2014
Authors: Ryan McCaffrey, Hai Long, Yinghua Jin, Aric Warner Sanders, Wounjhang Park, Wei Zhang
Abstract: We report a novel strategy for the controlled synthesis of gold nanoparticles (AuNPs) with narrow size distribution (1.9 {plus or minus} 0.4 nm) through NP nucleation and growth inside the cavity of a well-defined three-dimensional, shape-persist ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915368

56. Does Your SEM Really Tell the Truth? - How would you know? Part 1
Topic: Nanotechnology
Published: 12/16/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The high resolution of the SEM is especially suited for both qualitative and quantit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912761

57. Impact of UV Irradiation on the Surface Chemistry and Structure of Multiwall Carbon Nanotube Epoxy Nanocomposites
Topic: Nanotechnology
Published: 12/6/2013
Authors: Elijah J Petersen, Thomas F. Lam, Justin M Gorham, Keana C K Scott, Christian J Long, Deborah L Stanley, Renu Sharma, James Alexander Liddle, Tinh Nguyen
Abstract: One of the most promising applications of nanomaterials is as nanofillers to enhance the properties of polymeric materials. However, the effect of nanofillers on polymers subject to typical environmental stresses, such as ultraviolet (UV) radiation, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913865

58. Nanomanufacturing Concerns about Measurements made in the SEM II: Specimen Contamination
Topic: Nanotechnology
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar, Premsagar Purushotham Kavuri
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The improvements that have been made have significantly improved the overall SEM per ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914028

59. Nanomanufacturing concerns about Measurements made in the SEM I: Imaging and its Measurement
Topic: Nanotechnology
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The high resolution of the SEM is especially useful for qualitative and quantitative applications for both nanotechnology and nanomanufacturing. But, should users be concerned about the imaging and measurements made with this instrument? Perhaps one ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914029

60. Temperature-Programmed Electrospray-Differential Mobility Analysis for Characterization of Ligated Nanoparticles in Complex Media
Topic: Nanotechnology
Published: 8/12/2013
Authors: De-Hao D. Tsai, Frank W DelRio, John M Pettibone, Pin Ann Lin, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: In this study, an electrospray-differential mobility analyzer (ES-DMA) was operated with an aerosol flow-mode, temperature-programmed approach to enhance its ability to characterize the particle size distributions (PSDs) of nanoscale particles (NPs) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913860



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