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Topic Area: Nanotechnology
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Displaying records 361 to 370 of 390 records.
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361. The Scanning Scattering Microscopy for Surface and Buried Interface Roughness and Defect Imaging
Topic: Nanotechnology
Published: 12/1/1997
Authors: J Lorincik, J Fine, John G Gillen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100359

362. Carbonization Rate of Soot Precursor Particles
Topic: Nanotechnology
Published: 12/1/1996
Authors: R A Dobbins, G J Govatzidakis, W Lu, A F Schwartzman, Robert A Fletcher
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100348

363. Formation of Shallow Junctions During Rapid Thermal Processing from Electron-Beam Deposited Boron Sources
Topic: Nanotechnology
Published: 12/1/1996
Authors: W Zagozdzon-wosik, K Korablev, I Rusakova, David S Simons, J H Shi, P Chi, J C Wolfe
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100386

364. Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region
Topic: Nanotechnology
Published: 12/1/1996
Authors: G Redmond, C Gilles, M Fialin, O Rouer, Ryna B. Marinenko, Robert L. Myklebust, Dale E Newbury
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100370

365. The Role of Inclusions in U-Pb and Sm-Nd Garnet Geochronology: Stepwise Dissolution Experiments and Grace Uranium Mapping by Fission Track Analysis
Topic: Nanotechnology
Published: 1/1/1996
Authors: C.P. Dewolf, Cynthia J Zeissler, A.N. Halliday, K. Mezger, E.J. Essene
Abstract: The U-Pb and Sm-Nd dating of garnet are important tools for understanding rates of tectonometamorphic processes and have been widely applied in studies of metamorphic terranes. However, the budgets of uranium, lead, samarium, and neodymium in garnet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902131

366. The Development of Standard Reference Material 2137 - A Boron Implant in Silicon Standard for Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 12/1/1995
Authors: David S Simons, P Chi, Robert G Downing, George Paul Lamaze
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100550

367. Use of Secondary Ion Mass Spectrometry to Image (44) Calcium Uptake in the Cell Walls of Apple Fruit
Topic: Nanotechnology
Published: 9/1/1995
Authors: Sandip Roy, John G Gillen, W.S. Conway, A.E. Watada, W.P. Wergin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902023

368. Prompt Gamma Activation Analysis Enhanced by a Neutron Focusing Capillary Lens
Topic: Nanotechnology
Published: 1/1/1995
Authors: H. Chen, David F. R. Mildner, Robert G Downing, R.L. Paul, Richard Mark Lindstrom, Cynthia J Zeissler, Q.F. Xiao, V.A. Sharov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902133

369. Particle Analysis: Sample Preparation
Topic: Nanotechnology
Published: 5/17/1994
Author: Cynthia J Zeissler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902134

370. Patterning of Self-assembled Alkanethiol Monolayers on Silver by Microfocus Ion and Electron Beam Bombardment
Topic: Nanotechnology
Published: 4/1/1994
Authors: John G Gillen, Scott A Wight, Joe Bennett, Michael J Tarlov
Abstract: Decanethiol [CH3(CH2)9SH] self-assembled monolayer films on silver substrates have been irradiated in selected areas by focused ion or electron bombardment. Subsequent immersion of the irradiated sample in a solution of a fluoromercaptan [CF3(CF2)2(C ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902090



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