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Topic Area: Nanotechnology
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Displaying records 361 to 370 of 389 records.
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361. Carbonization Rate of Soot Precursor Particles
Topic: Nanotechnology
Published: 12/1/1996
Authors: R A Dobbins, G J Govatzidakis, W Lu, A F Schwartzman, Robert A Fletcher
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100348

362. Formation of Shallow Junctions During Rapid Thermal Processing from Electron-Beam Deposited Boron Sources
Topic: Nanotechnology
Published: 12/1/1996
Authors: W Zagozdzon-wosik, K Korablev, I Rusakova, David S Simons, J H Shi, P Chi, J C Wolfe
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100386

363. Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region
Topic: Nanotechnology
Published: 12/1/1996
Authors: G Redmond, C Gilles, M Fialin, O Rouer, Ryna B. Marinenko, Robert L. Myklebust, Dale E Newbury
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100370

364. The Role of Inclusions in U-Pb and Sm-Nd Garnet Geochronology: Stepwise Dissolution Experiments and Grace Uranium Mapping by Fission Track Analysis
Topic: Nanotechnology
Published: 1/1/1996
Authors: C.P. Dewolf, Cynthia J Zeissler, A.N. Halliday, K. Mezger, E.J. Essene
Abstract: The U-Pb and Sm-Nd dating of garnet are important tools for understanding rates of tectonometamorphic processes and have been widely applied in studies of metamorphic terranes. However, the budgets of uranium, lead, samarium, and neodymium in garnet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902131

365. The Development of Standard Reference Material 2137 - A Boron Implant in Silicon Standard for Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 12/1/1995
Authors: David S Simons, P Chi, Robert G Downing, George Paul Lamaze
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100550

366. Use of Secondary Ion Mass Spectrometry to Image (44) Calcium Uptake in the Cell Walls of Apple Fruit
Topic: Nanotechnology
Published: 9/1/1995
Authors: Sandip Roy, John G Gillen, W.S. Conway, A.E. Watada, W.P. Wergin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902023

367. Prompt Gamma Activation Analysis Enhanced by a Neutron Focusing Capillary Lens
Topic: Nanotechnology
Published: 1/1/1995
Authors: H. Chen, David F. R. Mildner, Robert G Downing, R.L. Paul, Richard Mark Lindstrom, Cynthia J Zeissler, Q.F. Xiao, V.A. Sharov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902133

368. Particle Analysis: Sample Preparation
Topic: Nanotechnology
Published: 5/17/1994
Author: Cynthia J Zeissler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902134

369. Patterning of Self-assembled Alkanethiol Monolayers on Silver by Microfocus Ion and Electron Beam Bombardment
Topic: Nanotechnology
Published: 4/1/1994
Authors: John G Gillen, Scott A Wight, Joe Bennett, Michael J Tarlov
Abstract: Decanethiol [CH3(CH2)9SH] self-assembled monolayer films on silver substrates have been irradiated in selected areas by focused ion or electron bombardment. Subsequent immersion of the irradiated sample in a solution of a fluoromercaptan [CF3(CF2)2(C ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902090

370. Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-assembled Monolayers on Silver and Gold
Topic: Nanotechnology
Published: 1/1/1994
Authors: John G Gillen, J. Bennett, Michael J Tarlov, Donald R Burgess Jr
Abstract: Self-assembly of alkanethiol monolayers on gold and silver substrates is a fast, easy, and convenient method for preparing stable organic films with well-defined physical and chemical properties that can be modified by changing the terminal functiona ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902092



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