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Topic Area: Nanotechnology
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Displaying records 351 to 360 of 382 records.
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351. Microhotplate Chemical Vapor Deposition in the Environmental SEM Chamber
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, Richard E Cavicchi, M J Nystrom, F DiMeo
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100380

352. SIMS Imaging of Electron Beam Scattering in the Environmental SEM
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100383

353. The Scanning Scattering Microscopy for Surface and Buried Interface Roughness and Defect Imaging
Topic: Nanotechnology
Published: 12/1/1997
Authors: J Lorincik, J Fine, John G Gillen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100359

354. Carbonization Rate of Soot Precursor Particles
Topic: Nanotechnology
Published: 12/1/1996
Authors: R A Dobbins, G J Govatzidakis, W Lu, A F Schwartzman, Robert A Fletcher
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100348

355. Formation of Shallow Junctions During Rapid Thermal Processing from Electron-Beam Deposited Boron Sources
Topic: Nanotechnology
Published: 12/1/1996
Authors: W Zagozdzon-wosik, K Korablev, I Rusakova, David S Simons, J H Shi, P Chi, J C Wolfe
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100386

356. Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region
Topic: Nanotechnology
Published: 12/1/1996
Authors: G Redmond, C Gilles, M Fialin, O Rouer, Ryna B. Marinenko, Robert L. Myklebust, Dale E Newbury
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100370

357. The Role of Inclusions in U-Pb and Sm-Nd Garnet Geochronology: Stepwise Dissolution Experiments and Grace Uranium Mapping by Fission Track Analysis
Topic: Nanotechnology
Published: 1/1/1996
Authors: C.P. Dewolf, Cynthia J Zeissler, A.N. Halliday, K. Mezger, E.J. Essene
Abstract: The U-Pb and Sm-Nd dating of garnet are important tools for understanding rates of tectonometamorphic processes and have been widely applied in studies of metamorphic terranes. However, the budgets of uranium, lead, samarium, and neodymium in garnet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902131

358. The Development of Standard Reference Material 2137 - A Boron Implant in Silicon Standard for Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 12/1/1995
Authors: David S Simons, P Chi, Robert G Downing, George Paul Lamaze
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100550

359. Use of Secondary Ion Mass Spectrometry to Image (44) Calcium Uptake in the Cell Walls of Apple Fruit
Topic: Nanotechnology
Published: 9/1/1995
Authors: Sandip Roy, John G Gillen, W.S. Conway, A.E. Watada, W.P. Wergin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902023

360. Prompt Gamma Activation Analysis Enhanced by a Neutron Focusing Capillary Lens
Topic: Nanotechnology
Published: 1/1/1995
Authors: H. Chen, David F r Mildner, Robert G Downing, R.L. Paul, Richard Mark Lindstrom, Cynthia J Zeissler, Q.F. Xiao, V.A. Sharov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902133



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