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Topic Area: Nanotechnology
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Displaying records 321 to 330 of 395 records.
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321. Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles
Topic: Nanotechnology
Published: 5/1/2001
Authors: E Fuoco, John G Gillen, M Wijesundara, William E Wallace III, L Hanley
Abstract: In this paper examine the mechanism of secondary ion yield enhancements previously observed for polyatomic projectiles by measuring the weight loss, volume loss, and surface composition of poly(methylmethacrylate) (PMMA) films sputtered by keV SF^d5^ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831207

322. Negative Cesium Sputter Ion Source for Generating Cluster Primary Ion Beams for Secondary Ion Mass Spectrometry Analysis
Topic: Nanotechnology
Published: 4/1/2001
Authors: John G Gillen, R Lance King, B Freibaum, R Lareau, J Bennett, F Chmara
Abstract: The use of a cluster (or polyatomic) primary ion projectile for organic SIMS has been demonstrated to increase the yield of characteristic molecular secondary ions, more efficiently desorb higher molecular weight species and reduce the accumulation o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831137

323. Block Copolymer Thin Films: Physics and Applications
Topic: Nanotechnology
Published: 2/15/2001
Authors: Michael J Fasolka, A M Mayes
Abstract: A two-part review of research concerning block copolymer thin films is presented. The first section summarizes experimental and theoretical studies of the fundamental physics of these systems, concentrating upon the forces that govern film morpholog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841503

324. Fabrication and Electron Microprobe Characterization of Barium-Strontium-Titanate (BST) Films
Topic: Nanotechnology
Published: 2/1/2001
Authors: Ryna B. Marinenko, J T. Armstrong, Debra L Kaiser, Joseph J. Ritter, Peter K. Schenck, C P. Bouldin, J Blendell, Igor Levin
Abstract: Barium strontium titanate (BST) thin films of varying composition and thickness (5nm to 400nm) on (100)Si or Pt/(100)Si substrates were measured using an electron microprobe analyzer with wavelength dispersive x-ray spectrometers. Most of the films ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831201

325. Cluster Primary Ion Beam Secondary Ion Mass Spectrometry for Semiconductor Characterization
Topic: Nanotechnology
Published: 1/1/2001
Authors: John G Gillen, S V. Roberson, Albert J. Fahey, Marlon L Walker, J Bennett, R Lareau
Abstract: We are evaluating the use of polyatomic and cluster primary ion beams for characterization of semiconductor materials by secondary ion mass spectrometry using both magnetic sector and time-of-flight SIMS instruments. Primary ion beams of SF^d5^+, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831200

326. P-on-N Si Interband Tunnel Diode Grown by Molecular Beam Epitaxy
Topic: Nanotechnology
Published: 1/1/2001
Authors: David S Simons, P Chi, S L Rommel, T E Dillon, K D Hobart, P E Thompson, P R Berger
Abstract: Si interband tunnel diodes have been successfully fabricated by molecular beam epitaxy and room temperature peak-to-valley current ratios of 1.7 have been achieved. The diodes consist of opposing n- and p-type {delta}-doped injectors separated by an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831189

327. Preparation and Certification of K-411 Glass Microspheres
Topic: Nanotechnology
Published: 12/1/2000
Authors: Ryna B. Marinenko, S V. Roberson, J S Small, Barbara B. Thorne, Douglas H. Blackburn, D Kauffman, Stefan D Leigh
Abstract: The production and characterization of NBS K-411 glass microspheres in the 3-40 um range for certification as a NIST Standard Reference Material (SRM) are described. EDS quantitative analysis and heterogeneity evaluations of the microspheres were ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831165

328. Shape Factors of ISO 12103-A3 (Medium Test Dust)
Topic: Nanotechnology
Published: 11/1/2000
Authors: Robert A Fletcher, David S. Bright
Abstract: A new derivative of Arizona sand, ISO Medium Test Dust, is coming into use as a liquid optical particle count calibrant. ISO Medium Test Dust and optical particle counters are used to test filtering efficiency. Particle shape plays a role in both fil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831146

329. Driven DNA Transport Into an Asymmetric Nanometer-Scale Pore
Topic: Nanotechnology
Published: 10/2/2000
Authors: S. E. Henrickson, Martin Misakian, B Robertson, John J Kasianowicz
Abstract: To understand the mechanism by which individual DNA molecules partition into a nanometer-scale pore, we studied the concentration and voltage dependence of polynucleotide-induced current blockades of single a-hemolysin ionic channels. At fixed singl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830159

330. Amphibole Asbestos From Libby, Montana: Aspects of Nomenclature
Topic: Nanotechnology
Published: 10/1/2000
Authors: A G Wylie, Jennifer R Verkouteren
Abstract: Richterite-asbestos and winchite-asbestos are not listed in the Federal regulations governing asbestos. However, asbestiform winchite is found in the gangue at the Libby, Montana, vermiculite deposit, where asbestos-related diseases have been report ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831463



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