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Topic Area: Nanotechnology
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Displaying records 321 to 330 of 391 records.
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321. Cluster Primary Ion Beam Secondary Ion Mass Spectrometry for Semiconductor Characterization
Topic: Nanotechnology
Published: 1/1/2001
Authors: John G Gillen, S V. Roberson, Albert J. Fahey, Marlon L Walker, J Bennett, R Lareau
Abstract: We are evaluating the use of polyatomic and cluster primary ion beams for characterization of semiconductor materials by secondary ion mass spectrometry using both magnetic sector and time-of-flight SIMS instruments. Primary ion beams of SF^d5^+, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831200

322. P-on-N Si Interband Tunnel Diode Grown by Molecular Beam Epitaxy
Topic: Nanotechnology
Published: 1/1/2001
Authors: David S Simons, P Chi, S L Rommel, T E Dillon, K D Hobart, P E Thompson, P R Berger
Abstract: Si interband tunnel diodes have been successfully fabricated by molecular beam epitaxy and room temperature peak-to-valley current ratios of 1.7 have been achieved. The diodes consist of opposing n- and p-type {delta}-doped injectors separated by an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831189

323. Preparation and Certification of K-411 Glass Microspheres
Topic: Nanotechnology
Published: 12/1/2000
Authors: Ryna B. Marinenko, S V. Roberson, J S Small, Barbara B. Thorne, Douglas H. Blackburn, D Kauffman, Stefan D Leigh
Abstract: The production and characterization of NBS K-411 glass microspheres in the 3-40 um range for certification as a NIST Standard Reference Material (SRM) are described. EDS quantitative analysis and heterogeneity evaluations of the microspheres were ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831165

324. Shape Factors of ISO 12103-A3 (Medium Test Dust)
Topic: Nanotechnology
Published: 11/1/2000
Authors: Robert A Fletcher, David S. Bright
Abstract: A new derivative of Arizona sand, ISO Medium Test Dust, is coming into use as a liquid optical particle count calibrant. ISO Medium Test Dust and optical particle counters are used to test filtering efficiency. Particle shape plays a role in both fil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831146

325. Driven DNA Transport Into an Asymmetric Nanometer-Scale Pore
Topic: Nanotechnology
Published: 10/2/2000
Authors: S. E. Henrickson, Martin Misakian, B Robertson, John J Kasianowicz
Abstract: To understand the mechanism by which individual DNA molecules partition into a nanometer-scale pore, we studied the concentration and voltage dependence of polynucleotide-induced current blockades of single a-hemolysin ionic channels. At fixed singl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830159

326. Amphibole Asbestos From Libby, Montana: Aspects of Nomenclature
Topic: Nanotechnology
Published: 10/1/2000
Authors: A G Wylie, Jennifer R Verkouteren
Abstract: Richterite-asbestos and winchite-asbestos are not listed in the Federal regulations governing asbestos. However, asbestiform winchite is found in the gangue at the Libby, Montana, vermiculite deposit, where asbestos-related diseases have been report ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831463

327. Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy
Topic: Nanotechnology
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specifici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831196

328. Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source
Topic: Nanotechnology
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NS ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831210

329. The Tremolite-Actinolite-Ferro-Actinolite Series: Systematic Relationships Among Cell Parameters Composition, Optical Properties, and Habit and Evidence of Discontinuities
Topic: Nanotechnology
Published: 9/1/2000
Authors: Jennifer R Verkouteren, A G Wylie
Abstract: The cell parameters, optical properties and chemical composition of 103 samples in the tremolite-actinolite-ferro-actinolite series have been measured. The combination of properties and the large number of samples provided a powerful means of determi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831109

330. PC/MAC Image Processing Freeware for Examining Spectral Images
Topic: Nanotechnology
Published: 8/1/2000
Author: David S. Bright
Abstract: Lispix is a public domain image processing system for Windows and the Macintosh, is applied to exploration of a spectral image of data cube.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831171



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