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Topic Area: Nanotechnology
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Displaying records 321 to 330 of 387 records.
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321. Driven DNA Transport Into an Asymmetric Nanometer-Scale Pore
Topic: Nanotechnology
Published: 10/2/2000
Authors: S. E. Henrickson, Martin Misakian, B Robertson, John J Kasianowicz
Abstract: To understand the mechanism by which individual DNA molecules partition into a nanometer-scale pore, we studied the concentration and voltage dependence of polynucleotide-induced current blockades of single a-hemolysin ionic channels. At fixed singl ...

322. Amphibole Asbestos From Libby, Montana: Aspects of Nomenclature
Topic: Nanotechnology
Published: 10/1/2000
Authors: A G Wylie, Jennifer R Verkouteren
Abstract: Richterite-asbestos and winchite-asbestos are not listed in the Federal regulations governing asbestos. However, asbestiform winchite is found in the gangue at the Libby, Montana, vermiculite deposit, where asbestos-related diseases have been report ...

323. Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy
Topic: Nanotechnology
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specifici ...

324. Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source
Topic: Nanotechnology
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NS ...

325. The Tremolite-Actinolite-Ferro-Actinolite Series: Systematic Relationships Among Cell Parameters Composition, Optical Properties, and Habit and Evidence of Discontinuities
Topic: Nanotechnology
Published: 9/1/2000
Authors: Jennifer R Verkouteren, A G Wylie
Abstract: The cell parameters, optical properties and chemical composition of 103 samples in the tremolite-actinolite-ferro-actinolite series have been measured. The combination of properties and the large number of samples provided a powerful means of determi ...

326. PC/MAC Image Processing Freeware for Examining Spectral Images
Topic: Nanotechnology
Published: 8/1/2000
Author: David S. Bright
Abstract: Lispix is a public domain image processing system for Windows and the Macintosh, is applied to exploration of a spectral image of data cube.

327. Phosphor Imaging Plate Measurement of Electron Scattering in the Environmental Scanning Electron Microscope
Topic: Nanotechnology
Published: 8/1/2000
Authors: Scott A Wight, Cynthia J Zeissler
Abstract: Phosphor Imaging Plate Technology is applied to electron beam scattering in the Environmental Scanning Electron Microscope. The plate is exposed to primary and scattered electrons which stimulate the phosphor grains to an excited state. The intensi ...

328. Characterization of the Electron Beam Specimen Interaction in the ESEM with SIM Imaging
Topic: Nanotechnology
Published: 7/1/2000
Authors: Scott A Wight, John G Gillen, G B. Saupe
Abstract: A Secondary Ion Mass Spectrometry (SIMS) study has been undertaken to examine surfaces and films modified in the environmental scanning electron microscope (ESEM). Examination of the modifications induced by ESEM electrons and ions lead to a better ...

329. New Low-Index Liquid Refractive Index Standard: SRM 1922
Topic: Nanotechnology
Published: 6/1/2000
Authors: Jennifer R Verkouteren, Stefan D Leigh
Abstract: A new standard for the calibration of refractometers has been developed. Standard Reference Material (SRM) 1922 is a mineral oil with a refractive index n^dD^=1.46945 at 20 C, which is within the range of the Brix scale (% sucrose). The change in ...

330. Channeling-Induced Asymmetric Distortion of Depth Profiles from Polycrystalline-TiN/Ti/TiN(001) Trilayers During Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 5/1/2000
Authors: G Ramanath, J E Greene, I Petrov, J E Baker, L H Allen, John G Gillen
Abstract: Asymmetric depth profiles of elemental and molecular secondary ions are observed during secondary ion mass spectrometry (SIMS) analyses of polycrystalline-TiN/Ti/TiN(001) trilayers using a Cs+ ion beam. The sputter-etching rate R and the secondary i ...

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