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Displaying records 281 to 290 of 402 records.
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281. Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods
Topic: Nanotechnology
Published: 9/23/2005
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos, Roy Howard Geiss
Abstract: We describe a dynamic atomic force microscopy (AFM) method to measure the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) techniques and involves the resonant ...

282. IMS-Based Trace Explosives Detectors for First Responder Use
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7240
Topic: Nanotechnology
Published: 9/1/2005
Authors: Jennifer R Verkouteren, John G Gillen, R Michael Verkouteren, Robert A Fletcher, E S. Etz, George A Klouda, Alim A Fatah, P Mattson
Abstract: The purpose of this document is to establish minimum performance requirements and an associated test method for Ion Mobility Spectrometry (IMS) based trace explosives detectors for use by the first responder community. Information concerning the the ...

283. Contact mechanics and tip shape in afm-based nanomechanical measurements
Topic: Nanotechnology
Published: 8/31/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: Stiffness-load curves obtained in quantitative atomic force acoustic microscopy (AFAM) measurements depend on both the elastic properties of the sample and the geometry of the atomic force microscope (AFM) tip. The geometry of silicon AFM tips change ...

284. Quantitative Elastic-Property Measurements at the Nanoscale with Atomic Force Acoustic Microscopy
Topic: Nanotechnology
Published: 8/31/2005
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos, Roy Howard Geiss
Abstract: We are developing metrology for rapid, quantitative assessment of elastic porperties with nanoscale spatial resolution. Atomic force acoustic microscopy (AFAM) methods enable modulus measurements at either a single point or as a map of local property ...

285. Depth Profiling of Poly(L-Lactic Acid)/Pluronic Polymer BlendsWith Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Topic: Nanotechnology
Published: 6/1/2005
Authors: Christine M. Mahoney, J Yu, J Gardella
Abstract: Polymeric blends comprised of the biodegradable polymer poly-L-lactic acid (PLLA) and polyethylene oxide (PEO) are of considerable interest due to their potential applications as protein drug delivery devices. In such devices, the PEO component will ...

286. Miniature Piezoceramic Actuators with Improved Fatigue Resistance
Topic: Nanotechnology
Published: 6/1/2005
Authors: Stephanie A Hooker, Jens Mueller, Clayton Kostelecky, K. Womer
Abstract: Piezoelectric ceramics are desirable actuator materials for many biomedical applications due to their ability to generate precise, controlled motion with applied voltage. Herein, we report the fabrication of miniature piezoelectric ceramic actuators ...

287. Acoustical methods to determine thin-film and nanoscale mechanical properties
Topic: Nanotechnology
Published: 5/31/2005
Authors: Donna C. Hurley, Roy Howard Geiss, N Jennett, Malgorzata Kopycinska-Mueller, A Maxwell, Jens Mueller, David Thomas Read, J Wright
Abstract: We describe two acoustical methods to evaluate the mechanical properties of thin films and nanoscale structures: atomic force acoustic microscopy and surface acoustic wave spectroscopy. The elastic properties of an 800-nm-thick nickel film were exami ...

288. In Situ Ellipsometric Study of PEG/Cl^u-^ Coadsorption on Cu, Ag, and Au
Topic: Nanotechnology
Published: 5/1/2005
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: Spectroscopic ellipsometry was used to examine the adsorption of polyethylene glycol (PEG) and Cl- on polycrystalline Cu, Ag and Au electrodes in sulfuric acid. In halide-free sulfuric acid, PEG adsorption on Cu and Ag is minimal at potentials positi ...

289. Nanometrology - FY 2004 Programs and Selected Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7130
Topic: Nanotechnology
Published: 4/15/2005
Author: C M Allocca
Abstract: The MSEL Nanometrology Program incorporates basic measurement metrologies to determine material properties, process monitoring at the nanoscale, nano-manufacturing and fabrication techniques, and structural characterization and analysis techniques, s ...

290. Elastic-property measurements of ultrathin films using atomic force acoustic microscopy
Topic: Nanotechnology
Published: 4/5/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Jens Mueller, Donna C. Hurley
Abstract: Atomic force acoustic microscopy (AFAM), an emerging technique that affords nanoscale lateral and depth resolution, was employed to measure the elastic properties of ultrathin films. In this study we measured the indentation modulus M of three nickel ...

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