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You searched on: Topic Area: Nanotechnology Sorted by: date

Displaying records 11 to 20 of 235 records.
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11. Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its Mitigation
Topic: Nanotechnology
Published: 11/17/2015
Authors: Michael T Postek, Andras Vladar
Abstract: This is the fourth part of a series of tutorial papers discussing various causes of measurement uncertainty in scanned particle beam instruments, and some of the solutions researched and developed at NIST and other research institutions. Scanned part ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918469

12. Radiative damping in wave guide based FMR measured via analysis of perpendicular standing spin waves in sputtered Permalloy films
Topic: Nanotechnology
Published: 11/17/2015
Authors: Thomas J Silva, Justin M Shaw, Hans Toya Nembach, Mathias Weiler, Martin Schoen
Abstract: The damping α of the spinwave resonances in 75 nm, 120 nm, and 200 nm -thick Permalloy films is measured via vector-network- analyzer ferromagnetic-resonance (VNA-FMR). Inductive coupling between the sample and the waveguide leads to an addi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919208

13. Gold Nanoparticle Quantitation by Whole Cell Tomography
Topic: Nanotechnology
Published: 11/13/2015
Authors: Aric Warner Sanders, Kavita M Jeerage, Cindi Schwartz, Alexandra E Curtin, Ann Chiaramonti Chiaramonti Debay
Abstract: Many proposed biomedical applications for engineered gold nanoparticles require their incorporation by mammalian cells in specific numbers and locations. Here, the number of gold nanoparticles inside of individual mammalian stem cells was character ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918316

14. Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical Normalization
Topic: Nanotechnology
Published: 11/5/2015
Authors: Jing Qin, Richard M Silver, Bryan M Barnes, Hui Zhou, Ronald G Dixson, Mark Alexander Henn
Abstract: Quantitative optical measurements of deep sub-wavelength, three-dimensional, nanometric structures with sensitivity to sub-nanometer details address an ubiquitous measurement challenge. A Fourier domain normalization approach is used in the Fourier ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914423

15. Strategies for transmission electron microscopy specimen preparation of polymer composites
Series: Special Publication (NIST SP)
Report Number: 1200-16
Topic: Nanotechnology
Published: 9/29/2015
Authors: Keana C K Scott, Lucille A Giannuzzi
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919252

16. Quantitative Measurement of Resolution as a Function of Defocus in Different Microscopy Modalities Using a Simplified Technique
Topic: Nanotechnology
Published: 9/23/2015
Authors: Aric Warner Sanders, Alexandra E Curtin, Ryan Skinner
Abstract: The distance over which the resolution of a microscope image changes appreciably, related to the depth of field, is an important parameter. This value determines the height of an object that can be imaged and said to be ,in focusŠ. Although this dist ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917950

17. Using 3D Nanotomography to Visualize Defects in the Fabrication of Superconducting Electronics
Topic: Nanotechnology
Published: 9/23/2015
Authors: Aric Warner Sanders, Anna E Fox, Paul David Dresselhaus
Abstract: Superconducting electronics is an established technological field for sensors, quantum computation and quantum-based standards and is emerging as an important low-power alternative to semiconductors. As in any electronics fabrication, the production ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917945

18. A method to determine the number of nanoparticles in a cluster using conventional optical microscopes
Topic: Nanotechnology
Published: 9/10/2015
Authors: Hyeong G. Kang, Ravikiran Attota, Premsagar Purushotham Kavuri, Vipin Nagnath Tondare, Andras Vladar
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918715

19. Custom Modification of AFM Tips for Fast, High Force Resolution Single-Molecule Force Spectroscopy
Topic: Nanotechnology
Published: 9/5/2015
Authors: Aric Warner Sanders, Jaevyn Faulk, Devin Thomas Edwards, Thomas T Perkins
Abstract: In addition to providing the ability to image on the nanoscale, atomic force microscopy (AFM) has the ability to measure small (pN) forces at a single point. This ability has led to new insights into conformation changes in biological molecules; in p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917952

20. Linear relation between Heisenberg exchange and interfacial Dzyaloshinskii‹Moriya interaction in metal films
Topic: Nanotechnology
Published: 8/3/2015
Authors: Hans Toya Nembach, Justin M Shaw, Mathias A. Weiler, Emilie Marie Jue, Thomas J Silva
Abstract: Proposals for novel spin-orbitronic logic and memory devices are often dependent on assumptions as to how materials with large spin-orbit and ferromagnets interact when in contact. Such interactions give rise to a host of novel phenomena, such as ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917482



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