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You searched on: Topic Area: Nanotechnology

Displaying records 71 to 80 of 193 records.
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71. Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Nanotechnology
Published: 4/10/2012
Authors: Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910

72. Significantly Improved Trapping Lifetime of Nanoparticles in an Optical Trap using Feedback Control
Topic: Nanotechnology
Published: 4/10/2012
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, Jason John Gorman
Abstract: We demonstrate an increase in trapping lifetime for optically trapped nanoparticles by more than an order of magnitude using feedback control. This has been demonstrated through simu- lation and experimental results for 100, nm gold particles and 3 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909642

73. On CD-AFM bias related to probe bending
Topic: Nanotechnology
Published: 4/9/2012
Authors: Vladimir A Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910903

74. Modeling the effects of acid amplifiers on photoresist stochastics
Topic: Nanotechnology
Published: 3/23/2012
Authors: Gregg M. Gallatin, Patrick Naulleau, Robert Brainard
Abstract: The tradeoff between Resolution, Line Edge Roughness (LER) and Sensitivity, the so called RLS tradeoff, continues to be a difficult challenge, especially for EUV lithography. Acid amplifiers have recently been proposed as a method to improve upon t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910777

75. Tumor Necrosis Factor Interaction with Gold Nanoparticles
Topic: Nanotechnology
Published: 3/14/2012
Authors: De-Hao D. Tsai, Sherrie R. Elzey, Frank W DelRio, Robert I. MacCuspie, Suvajyoti S. Guha, Michael Russel Zachariah, Athena M Keene, Jeffrey D Clogston, Vincent A Hackley
Abstract: We report on a systematic investigation of molecular conjugation of tumor necrosis factor protein-α (TNF) onto gold nanoparticles (AuNPs) and the subsequent binding behavior to its antibody (anti-TNF). We employ a combination of physical and spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909899

76. Electrospray ‹ Differential Mobility Analysis as an Orthogonal Tool to Size Exclusion Chromatography for Characterization of Protein Aggregates
Topic: Nanotechnology
Published: 3/12/2012
Authors: Suvajyoti S. Guha, Joshua R. Wayment, Michael J Tarlov, Michael Russel Zachariah
Abstract: The biopharmaceutical industry characterizes and quantifies aggregation of protein therapeutics using multiple analytical techniques to cross validate results. Here we demonstrate the use of electrospray-differential mobility analysis (ES-DMA), a gas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909715

77. Characterizing Equilibrium in Epitaxial Growth
Topic: Nanotechnology
Published: 2/20/2012
Authors: Paul N. Patrone, Russel Caflisch, Dionisios Margetis
Abstract: Using a kinetic model of epitaxial growth, we describe how geometry controls kinetic pathways through which external deposition influences the state of a vicinal surface. The state of the surface is determined by three key, adjustable parameters: th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909660

78. Quantitative Measurements of the Size Scaling of Linear and Circular DNA in Nanofluidic Slitlike Confinement
Topic: Nanotechnology
Published: 2/14/2012
Authors: Elizabeth A Strychalski, Jon C Geist, Michael Gaitan, Laurie E Locascio, Samuel M Stavis
Abstract: Quantitative size measurements of single linear and circular DNA molecules in nanofluidic slitlike confinement are reported. A novel experimental method using DNA entropophoresis down a nanofluidic staircase implemented comprehensive variation of sl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908052

79. Nanometrology Using Through-Focus Scanning Optical Microscopy Method
Topic: Nanotechnology
Published: 12/21/2011
Authors: Ravikiran Attota, Richard M Silver
Abstract: We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905395

80. Feedback Control of Optically Trapped Particles
Topic: Nanotechnology
Published: 12/17/2011
Authors: Jason John Gorman, Arvind Kumar Balijepalli, Thomas W LeBrun
Abstract: Optical trapping is a method for manipulating micro- and nanoscale particles that is widely used in biophysics and colloid science, among other areas. This method uses optical forces to confine the position of a particle to a localized region, which ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908148



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