NIST logo

Publications Portal

You searched on:
Topic Area: Nanotechnology

Displaying records 71 to 80 of 391 records.
Resort by: Date / Title


71. Tumor Necrosis Factor Interaction with Gold Nanoparticles
Topic: Nanotechnology
Published: 3/14/2012
Authors: De-Hao D. Tsai, Sherrie R. Elzey, Frank W DelRio, Robert I. MacCuspie, Suvajyoti S. Guha, Michael Russel Zachariah, Athena M Keene, Jeffrey D Clogston, Vincent A Hackley
Abstract: We report on a systematic investigation of molecular conjugation of tumor necrosis factor protein-α (TNF) onto gold nanoparticles (AuNPs) and the subsequent binding behavior to its antibody (anti-TNF). We employ a combination of physical and spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909899

72. Electrospray ‹ Differential Mobility Analysis as an Orthogonal Tool to Size Exclusion Chromatography for Characterization of Protein Aggregates
Topic: Nanotechnology
Published: 3/12/2012
Authors: Suvajyoti S. Guha, Joshua R. Wayment, Michael J Tarlov, Michael Russel Zachariah
Abstract: The biopharmaceutical industry characterizes and quantifies aggregation of protein therapeutics using multiple analytical techniques to cross validate results. Here we demonstrate the use of electrospray-differential mobility analysis (ES-DMA), a gas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909715

73. Fractional Diffusion, Low Exponent Levy Stable Laws, and Slow Motion Denoising of Helium Ion Microscope Nanoscale Imagery
Series: Journal of Research (NIST JRES)
Report Number: 117.006
Topic: Nanotechnology
Published: 2/22/2012
Authors: Andras Vladar, Alfred S Carasso
Abstract: Helium ion microscopes (HIM) are capable of acquiring images with better than 1nm resolution, and HIM images are particularly rich in morphological surface details. However, such images are generally quite noisy. A major challenge is to denoise the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906607

74. Characterizing Equilibrium in Epitaxial Growth
Topic: Nanotechnology
Published: 2/20/2012
Authors: Paul N. Patrone, Russel Caflisch, Dionisios Margetis
Abstract: Using a kinetic model of epitaxial growth, we describe how geometry controls kinetic pathways through which external deposition influences the state of a vicinal surface. The state of the surface is determined by three key, adjustable parameters: th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909660

75. Reaction Network Governing Diphosphine-Protected Gold Nanocluster Formation from Nascent Cationic Platforms
Topic: Nanotechnology
Published: 2/16/2012
Authors: John M Pettibone, Jeffrey W Hudgens
Abstract: We identify the reaction network governing gold monolayer protected cluster (MPC) formation during the reduction of Au(PPh^d3^)Cl and L^u5^ (L^u5^ = 1,5-bis(diphenylphosphino)pentane) in solutions. UV-vis spectroscopy and electrospray ionization mass ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909879

76. Quantitative Measurements of the Size Scaling of Linear and Circular DNA in Nanofluidic Slitlike Confinement
Topic: Nanotechnology
Published: 2/14/2012
Authors: Elizabeth A Strychalski, Jon C Geist, Michael Gaitan, Laurie E Locascio, Samuel M Stavis
Abstract: Quantitative size measurements of single linear and circular DNA molecules in nanofluidic slitlike confinement are reported. A novel experimental method using DNA entropophoresis down a nanofluidic staircase implemented comprehensive variation of sl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908052

77. Copper oxide nanoparticle mediated DNA damage in terrestrial plant models
Topic: Nanotechnology
Published: 12/22/2011
Authors: Bryant C Nelson, Donald H Atha, Elijah J Petersen, Huanhua Wang, Danielle Cleveland, Richard D Holbrook, Pawel Jaruga, M Miral Dizdar, Baoshan Xing
Abstract: Engineered nanoparticles, due to their unique electrical, mechanical and catalytic properties, are presently found in many commercial products and will be intentionally or inadvertently released at increasing concentrations into the natural environme ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908088

78. Nanometrology Using Through-Focus Scanning Optical Microscopy Method
Topic: Nanotechnology
Published: 12/21/2011
Authors: Ravikiran Attota, Richard M Silver
Abstract: We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905395

79. Feedback Control of Optically Trapped Particles
Topic: Nanotechnology
Published: 12/17/2011
Authors: Jason John Gorman, Arvind Kumar Balijepalli, Thomas W LeBrun
Abstract: Optical trapping is a method for manipulating micro- and nanoscale particles that is widely used in biophysics and colloid science, among other areas. This method uses optical forces to confine the position of a particle to a localized region, which ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908148

80. Influence of Interfacial Chemistry and Molecular Length on the Electronic Properties of Metal-Molecule-Silicon Junctions Produced by Flip Chip Lamination  
Topic: Nanotechnology
Published: 12/15/2011
Authors: Michael A Walsh, Mariona Coll, Benjamin Jones, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910382



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series