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You searched on: Topic Area: Nanotechnology

Displaying records 31 to 40 of 197 records.
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31. Capabilities of Single Particle Inductively Coupled Plasma Mass Spectrometry for the Size Measurement of Nanoparticles: A Case Study on Gold Nanoparticles
Topic: Nanotechnology
Published: 2/28/2014
Authors: Jingyu Liu, Karen E Murphy, Robert I. MacCuspie, Michael R Winchester
Abstract: The increasing application of engineered nanomaterials in consumer and medical products has motivated the development of single particle inductively coupled plasma mass spectrometry (spICP-MS) for characterizing nanomaterials under realistic envi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914724

32. Head and Media Challenges for 3 Tb/in^u2^ Microwave Assisted Magnetic Recording
Topic: Nanotechnology
Published: 2/3/2014
Authors: Thomas J Silva, Justin M Shaw, Hans Toya Nembach, Mike Mallary, Kumar Srinivasan, Gerado Bertero, Dan Wolf, Christian Kaiser, Michael Chaplin, Mahendra Pakala, Leng Qunwen, Yiming Wang, Carl Elliot, Lui Francis
Abstract: A specific design for Microwave Assisted Magnetic Recording (MAMR) at about 3Tb/in^u2^ (0.47 Tb/cm^u2^ or 4.7 Pb/m^u2^) is discussed in detail to highlight the challenges of MAMR and to contrast its requirements with conventional Perpendicular Magnet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914220

33. Template synthesis of gold nanoparticles with an organic molecular cage
Topic: Nanotechnology
Published: 1/16/2014
Authors: Ryan McCaffrey, Hai Long, Yinghua Jin, Aric Warner Sanders, Wounjhang Park, Wei Zhang
Abstract: We report a novel strategy for the controlled synthesis of gold nanoparticles (AuNPs) with narrow size distribution (1.9 {plus or minus} 0.4 nm) through NP nucleation and growth inside the cavity of a well-defined three-dimensional, shape-persist ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915368

34. Does Your SEM Really Tell the Truth? - How would you know? Part 1
Topic: Nanotechnology
Published: 12/16/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The high resolution of the SEM is especially suited for both qualitative and quantit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912761

35. Impact of UV Irradiation on the Surface Chemistry and Structure of Multiwall Carbon Nanotube Epoxy Nanocomposites
Topic: Nanotechnology
Published: 12/6/2013
Authors: Elijah J Petersen, Thomas F. Lam, Justin M Gorham, Keana C K Scott, Christian John Long, Deborah L Stanley, Renu Sharma, James Alexander Liddle, Tinh Nguyen
Abstract: One of the most promising applications of nanomaterials is as nanofillers to enhance the properties of polymeric materials. However, the effect of nanofillers on polymers subject to typical environmental stresses, such as ultraviolet (UV) radiation, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913865

36. Nanomanufacturing Concerns about Measurements made in the SEM II: Specimen Contamination
Topic: Nanotechnology
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar, Premsagar Purushotham Kavuri
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The improvements that have been made have significantly improved the overall SEM per ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914028

37. Nanomanufacturing concerns about Measurements made in the SEM I: Imaging and its Measurement
Topic: Nanotechnology
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The high resolution of the SEM is especially useful for qualitative and quantitative applications for both nanotechnology and nanomanufacturing. But, should users be concerned about the imaging and measurements made with this instrument? Perhaps one ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914029

38. Temperature-Programmed Electrospray-Differential Mobility Analysis for Characterization of Ligated Nanoparticles in Complex Media
Topic: Nanotechnology
Published: 8/12/2013
Authors: De-Hao D. Tsai, Frank W DelRio, John M Pettibone, Pin Ann Lin, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: In this study, an electrospray-differential mobility analyzer (ES-DMA) was operated with an aerosol flow-mode, temperature-programmed approach to enhance its ability to characterize the particle size distributions (PSDs) of nanoscale particles (NPs) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913860

39. Through-focus scanning optical microscopy for defect inspection of EUV masks
Topic: Nanotechnology
Published: 8/12/2013
Authors: Ravikiran Attota, Vibhu Jindal
Abstract: The TSOM method provides three-dimensional nanoscale metrology using a conventional optical microscope. Substantial improvements in defect detectability using the TSOM method will be presented. The TSOM method shows potential to (i) detect phase defe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914027

40. Multiscale Correlative Microscopy of the Interaction of Au Nanoparticles with Rat Cortex Neural Progenitor Cells
Topic: Nanotechnology
Published: 8/8/2013
Authors: Ann Chiaramonti Chiaramonti Debay, Aric Warner Sanders, Alexandra E Curtin, Kavita M Jeerage, Cindi Schwartz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914328



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