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Topic Area: Nanotechnology

Displaying records 361 to 370 of 395 records.
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361. Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100381

362. Indium Diffusion in n-type Gallium Arsenide
Topic: Nanotechnology
Published: 12/1/1997
Authors: W M Li, R M Cohen, David S Simons, P Chi
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100358

363. Measurement of ESEM Electron Beam Profiles with Self-Assembled Monolayers and SIMS
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100336

364. Microhotplate Chemical Vapor Deposition in the Environmental SEM Chamber
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, Richard E Cavicchi, M J Nystrom, F DiMeo
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100380

365. SIMS Imaging of Electron Beam Scattering in the Environmental SEM
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100383

366. The Scanning Scattering Microscopy for Surface and Buried Interface Roughness and Defect Imaging
Topic: Nanotechnology
Published: 12/1/1997
Authors: J Lorincik, J Fine, John G Gillen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100359

367. Carbonization Rate of Soot Precursor Particles
Topic: Nanotechnology
Published: 12/1/1996
Authors: R A Dobbins, G J Govatzidakis, W Lu, A F Schwartzman, Robert A Fletcher
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100348

368. Formation of Shallow Junctions During Rapid Thermal Processing from Electron-Beam Deposited Boron Sources
Topic: Nanotechnology
Published: 12/1/1996
Authors: W Zagozdzon-wosik, K Korablev, I Rusakova, David S Simons, J H Shi, P Chi, J C Wolfe
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100386

369. Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region
Topic: Nanotechnology
Published: 12/1/1996
Authors: G Redmond, C Gilles, M Fialin, O Rouer, Ryna B. Marinenko, Robert L. Myklebust, Dale E Newbury
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100370

370. The Role of Inclusions in U-Pb and Sm-Nd Garnet Geochronology: Stepwise Dissolution Experiments and Grace Uranium Mapping by Fission Track Analysis
Topic: Nanotechnology
Published: 1/1/1996
Authors: C.P. Dewolf, Cynthia J Zeissler, A.N. Halliday, K. Mezger, E.J. Essene
Abstract: The U-Pb and Sm-Nd dating of garnet are important tools for understanding rates of tectonometamorphic processes and have been widely applied in studies of metamorphic terranes. However, the budgets of uranium, lead, samarium, and neodymium in garnet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902131



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