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Topic Area: Nanotechnology

Displaying records 251 to 260 of 391 records.
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251. Competitive Adsorption of PEG, CI^u-^, and SPS/MPS on Cu: An In Situ Ellipsometric Study
Topic: Nanotechnology
Published: 8/1/2006
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: The adsorption of Cu electrodeposition accelerating agents SPS and MPS on evaporated Cu thin films was examined in-situ using spectroscopic ellipsometry under quiescent conditions. Both the thiol (MPS) and disulfide (SPS) resulted in definitive chan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831400

252. 3D Molecular Imaging SIMS
Topic: Nanotechnology
Published: 7/1/2006
Authors: John G Gillen, Albert J. Fahey, M Wagner, Christine M. Mahoney
Abstract: Thin monolayer and bilayer filsm of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF^d5^+ polyatomic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831393

253. Characterization of Drug-Eluting Stent (DES) Materials With Cluster Secondary Ion Mass Spectrometry (SIMS)
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, Martin McDermott
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was utilized to analyze several materials commonly used in drug eluting stents (DES). Poly(ethylene-co-vinyl acetate) (PEVA), Poly(lactic-co-glycolic acid) (PLGA) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831403

254. Evaluation of the Shapes of Auger- and Secondary-Electron Linescans Across Interfaces With the Logistic Function
Topic: Nanotechnology
Published: 7/1/2006
Authors: Scott A Wight, Cedric John Powell
Abstract: We report on the use of the extended logistic function for fitting Auger-electron (AE) and secondary-electron (SE) linescans. Such fits provide convenient and objective measures of parameters describing the interface width and possible asymmetry of a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831408

255. SIMS Depth Profiling of Polymer Blends With Protein Based Drugs
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, J Yu, Albert J. Fahey, J Gardella
Abstract: The use of SF5+ cluster ions for depth profiling has been successful for polymer-drug mixtures and polymer blends. This study reports results of the surface and in-depth characterization of two component blend films of poly(L-lactic acid) (PLLA) and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831391

256. Temperature-Controlled Depth Profiling in Polymeric Biomaterials Using Cluster Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, J Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile through various polymeric biomaterials at a series of temperatures from -125 oC to 150 oC. The depth profile characteristics (e.g. inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831404

257. Quantum Dot Dissemination and Behavior in Bacterial Biofilms
Topic: Nanotechnology
Published: 5/7/2006
Authors: Jayne B Morrow, Richard D Holbrook, Cynthia J Zeissler
Abstract: Quantum dots (QDs) are colloidal semiconductor nanocrystals that photoluminescence emission is proportional to the dot size and have been utilized in fluorescent imaging in biological systems. Biofilms are communities of microorganisms attached to su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902126

258. Variable Magnification With Kirkpatrick-Baez Optics for Synchrotron X-Ray Microscopy
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 5/1/2006
Authors: Terrence J Jach, A S Bakulin, S M Durbin, J Pedulla, A T Macrander
Abstract: We describe the distinction between the operation of a short focal lengthx-ray microscope forming a real image with a laboratory source (convergentillumination) and with a highly collimated intense beam from a synchrotronlight source (K\{o}hler illum ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831409

259. Size-related plasticity effects in AFM silicon cantilever tips
Topic: Nanotechnology
Published: 4/17/2006
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: We are developing dynamic atomic force microscopy (AFM) techniques to determine nanoscale elastic properties. Atomic force acoustic microscopy (AFAM) makes use of the resonant frequencies of an AFM cantilever while its tip contacts the sample surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50330

260. Elastodynamic characterization of imprinted nanolines
Topic: Nanotechnology
Published: 4/3/2006
Authors: Ward L Johnson, Colm Flannery, Sudook A Kim, Roy Howard Geiss, Christopher L Soles, Paul R Heyliger
Abstract: Experimental techniques employing Brillouin light scattering (BLS) and analytical techniques employing finite-element (FE) and Farnell-Adler models are being developed for characterizing acoustic modes and determining elastic moduli and dimensions o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50332



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