NIST logo

Publications Portal

You searched on:
Topic Area: Nanotechnology

Displaying records 251 to 260 of 395 records.
Resort by: Date / Title


251. Characterization and Ion-Induced Degradation of Cross-Linked Poly(Methyl Methacylate) Studies Using Time of Flight Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 12/30/2006
Authors: M S. Wagner, K Lenghaus, John G Gillen, Michael J Tarlov
Abstract: In this study, a series of random copolymers of methyl methacrylate (MMA) and ethylene glycol dimethacrylate (EGDMA) were prepared as surface-initiated polymer (SIP) films on silicon substrates using atom transfer radical polymerization. Positive and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831017

252. Elastic mapping and quantitative nanoscale modulus measurements of SnO2 nanobelts
Topic: Nanotechnology
Published: 12/21/2006
Authors: Yuegui Zheng, Robert E. Geer, Malgorzata Kopycinska-Mueller, Donna C. Hurley
Abstract: A comparative study of the elastic uniformity and modulus of single-crystal SnO2 nanobelts is presented employing two nondestructive techniques based on atomic force microscopy: differential ultrasonic force microscopy (d-UFM) and atomic force acoust ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50382

253. After Two Decades a Second Anchor for the VPDB delta-13-C Scale
Topic: Nanotechnology
Published: 11/15/2006
Authors: T.B. Coplen, W.A. Brand, M. Gehre, M. Groning, H.A.J. Meijer, Blaza Toman, R Michael Verkouteren
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901931

254. Nanoparticle Lithography and Imaging Scanning Probe Microscopy
Topic: Nanotechnology
Published: 10/1/2006
Authors: Jaroslaw Grobelny, De-Hao D. Tsai, Doo-In Kim, Pradeep Narayanan Namboodiri, Robert Francis Cook, Michael Russel Zachariah
Abstract: Scanning tunnelling microscopy (STM) imaging was performed on goldsurfaces with a large coverage of monodispersed silver nanoparticlessoft-landed on the surface from the gas phase. In both ambient and ultra-highvacuum conditions, STM scanning was fou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850977

255. Competitive Adsorption of PEG, CI^u-^, and SPS/MPS on Cu: An In Situ Ellipsometric Study
Topic: Nanotechnology
Published: 8/1/2006
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: The adsorption of Cu electrodeposition accelerating agents SPS and MPS on evaporated Cu thin films was examined in-situ using spectroscopic ellipsometry under quiescent conditions. Both the thiol (MPS) and disulfide (SPS) resulted in definitive chan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831400

256. 3D Molecular Imaging SIMS
Topic: Nanotechnology
Published: 7/1/2006
Authors: John G Gillen, Albert J. Fahey, M Wagner, Christine M. Mahoney
Abstract: Thin monolayer and bilayer filsm of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF^d5^+ polyatomic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831393

257. Characterization of Drug-Eluting Stent (DES) Materials With Cluster Secondary Ion Mass Spectrometry (SIMS)
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, Martin McDermott
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was utilized to analyze several materials commonly used in drug eluting stents (DES). Poly(ethylene-co-vinyl acetate) (PEVA), Poly(lactic-co-glycolic acid) (PLGA) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831403

258. Evaluation of the Shapes of Auger- and Secondary-Electron Linescans Across Interfaces With the Logistic Function
Topic: Nanotechnology
Published: 7/1/2006
Authors: Scott A Wight, Cedric John Powell
Abstract: We report on the use of the extended logistic function for fitting Auger-electron (AE) and secondary-electron (SE) linescans. Such fits provide convenient and objective measures of parameters describing the interface width and possible asymmetry of a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831408

259. SIMS Depth Profiling of Polymer Blends With Protein Based Drugs
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, J Yu, Albert J. Fahey, J Gardella
Abstract: The use of SF5+ cluster ions for depth profiling has been successful for polymer-drug mixtures and polymer blends. This study reports results of the surface and in-depth characterization of two component blend films of poly(L-lactic acid) (PLLA) and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831391

260. Temperature-Controlled Depth Profiling in Polymeric Biomaterials Using Cluster Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, J Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile through various polymeric biomaterials at a series of temperatures from -125 oC to 150 oC. The depth profile characteristics (e.g. inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831404



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series