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Topic Area: Nanotechnology

Displaying records 251 to 260 of 387 records.
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251. SIMS Depth Profiling of Polymer Blends With Protein Based Drugs
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, J Yu, Albert J. Fahey, J Gardella
Abstract: The use of SF5+ cluster ions for depth profiling has been successful for polymer-drug mixtures and polymer blends. This study reports results of the surface and in-depth characterization of two component blend films of poly(L-lactic acid) (PLLA) and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831391

252. Temperature-Controlled Depth Profiling in Polymeric Biomaterials Using Cluster Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, J Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile through various polymeric biomaterials at a series of temperatures from -125 oC to 150 oC. The depth profile characteristics (e.g. inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831404

253. Quantum Dot Dissemination and Behavior in Bacterial Biofilms
Topic: Nanotechnology
Published: 5/7/2006
Authors: Jayne B Morrow, Richard D Holbrook, Cynthia J Zeissler
Abstract: Quantum dots (QDs) are colloidal semiconductor nanocrystals that photoluminescence emission is proportional to the dot size and have been utilized in fluorescent imaging in biological systems. Biofilms are communities of microorganisms attached to su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902126

254. Variable Magnification With Kirkpatrick-Baez Optics for Synchrotron X-Ray Microscopy
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 5/1/2006
Authors: Terrence J Jach, A S Bakulin, S M Durbin, J Pedulla, A T Macrander
Abstract: We describe the distinction between the operation of a short focal lengthx-ray microscope forming a real image with a laboratory source (convergentillumination) and with a highly collimated intense beam from a synchrotronlight source (K\{o}hler illum ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831409

255. Size-related plasticity effects in AFM silicon cantilever tips
Topic: Nanotechnology
Published: 4/17/2006
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: We are developing dynamic atomic force microscopy (AFM) techniques to determine nanoscale elastic properties. Atomic force acoustic microscopy (AFAM) makes use of the resonant frequencies of an AFM cantilever while its tip contacts the sample surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50330

256. Elastodynamic characterization of imprinted nanolines
Topic: Nanotechnology
Published: 4/3/2006
Authors: Ward L Johnson, Colm Flannery, Sudook A Kim, Roy Howard Geiss, Christopher L Soles, Paul R Heyliger
Abstract: Experimental techniques employing Brillouin light scattering (BLS) and analytical techniques employing finite-element (FE) and Farnell-Adler models are being developed for characterizing acoustic modes and determining elastic moduli and dimensions o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50332

257. Characterization of Gunpowder Samples Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Topic: Nanotechnology
Published: 4/1/2006
Authors: Christine M. Mahoney, John G Gillen, Albert J. Fahey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901923

258. New Guidelines for delta-13-C Measurements
Topic: Nanotechnology
Published: 4/1/2006
Authors: T.B. Coplen, W.A. Brand, M. Gehre, M. Groning, H.A.J. Meijer, Blaza Toman, R Michael Verkouteren
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901932

259. Influence of surface energy and relative humidity on AFM nanomechanical contact stiffness
Topic: Nanotechnology
Published: 3/9/2006
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, D Julthongpiput, Michael J Fasolka
Abstract: The effects of surface functionality and relative humidity (RH) on nanomechanical properties were investigated using atomic force acoustic microscopy (AFAM), a contact scanned probe microscopy (SPM) technique. Self-assembled monolayers (SAMs) with co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50243

260. Summary of ISO/TC 201 Standard: XIII. ISO 18114:2003 - Surface Chemical Analysis - Secondary Ion Mass Spectrometry - Determination of Relative Sensitivity Factors From Ion-Implanted Reference Materials
Topic: Nanotechnology
Published: 3/1/2006
Author: David S Simons
Abstract: Ion-implanted materials are commonly used in secondary-ion mass spectrometry for the calibration of instruments. This international Standard was prepared to provide a uniform method for determining the relative sensitivity factor (RSF) of an element ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831402



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