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You searched on: Topic Area: Nanotechnology

Displaying records 91 to 100 of 188 records.
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91. Evaluating the characteristics of multiwall carbon nanotubes
Topic: Nanotechnology
Published: 7/1/2011
Authors: John H Lehman, M. Terrones, Elisabeth Mansfield, Katie Hurst, Vincent Muenier
Abstract: During the past 20 years, multiwall carbon nanotubes (MWCNTs) have become an important industrial material. Hundreds of tons are produced each year. This review is a survey of the scientific literature, motivated by industrial requirements and guidel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907346

92. Guided three-dimensional catalyst folding during Metal assisted Chemical Etching of Silicon
Topic: Nanotechnology
Published: 6/28/2011
Authors: Konrad Rykaczewski, Owen J. Hildreth, Ching P. Wong, Andrei G. Fedorov, John Henry j Scott
Abstract: In order to fabricate truly complex three-dimensional (3D) silicon nanostructures fabrication methods which expand beyond the concept of creation of straight 3D structures by direct extension of two dimensional (2D) patterns need to be developed. In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908006

93. Hydrodynamic Fractionation of Finite Size Nano Gold Clusters
Topic: Nanotechnology
Published: 6/15/2011
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Julian S. Taurozzi, Michael Russel Zachariah, Vincent A Hackley
Abstract: We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908232

94. Methodology for imaging of nano-to-microscale water condensation dynamics on complex nanostructures
Topic: Nanotechnology
Published: 6/11/2011
Authors: Konrad Rykaczewski, John Henry j Scott
Abstract: By transferring of a small part of a macroscale sample to a novel thermally insulated sample platform we are able to mitigate flooding and electron heating problems typically associated with Environmental Scanning Electron Microscopy imaging of water ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908396

95. Physicochemical characterization and in vitro hemolysis evaluation of silver nanoparticles
Topic: Nanotechnology
Published: 6/7/2011
Authors: Vytautas Reipa, Jonghoon Choi, Nam Sun Wang, Victoria M. Hitchins, Peter L. Goering, Robert Malinauskas
Abstract: In anticipation of the increased use of various forms of silver as an antimicrobial agent in medical devices, the objective of this study was to evaluate the in vitro hemolytic potential of silver nanoparticles in dilute human blood, and to relate pa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906184

96. An Integrated Electrochromic Nanoplasmonic Optical Switch
Topic: Nanotechnology
Published: 5/25/2011
Authors: Amit Kumar Agrawal, Benjamin James McMorran, Ceren Susut, Henri J Lezec, Gery R Stafford, Ugo Bertocci, Albert A. Talin
Abstract: no abstract
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908255

97. Fabrication and characterization of silicon-based molecular electronic devices
Topic: Nanotechnology
Published: 5/21/2011
Authors: Christina Ann Hacker, Michael A Walsh, Sujitra Jeanie Pookpanratana, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908433

98. Silicon-based Molecular Electronics in the Post-Hype Era
Topic: Nanotechnology
Published: 4/8/2011
Author: Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908431

99. Effects of shape distortions and imperfections on mode frequencies and collective linewidths in nanomagnets
Topic: Nanotechnology
Published: 3/28/2011
Authors: Hans Toya Nembach, Justin M Shaw, Thomas J Silva, Ward L Johnson, Sudook A Kim, Robert D McMichael, Pavel Kabos
Abstract: We used Brillouin light scattering to show that shape distortions in Ni80Fe20 nanoelements can have a dramatic effect on the measured linewidth of certain modes. By intentionally introducing an amount of ,egg-likeŠ shape distortion to an ideal ellip ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907044

100. Modeling the transfer of line edge roughness from an EUV mask to the wafer
Topic: Nanotechnology
Published: 3/25/2011
Authors: Gregg M. Gallatin, Patrick Naulleau
Abstract: Contributions to line edge roughness (LER) from extreme ultraviolet (EUV) masks have recently been shown to be an issue of concern for both the accuracy of current resist evaluation tests as well the ultimate LER requirements for the 22 nm production ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908144



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