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You searched on: Topic Area: Nanotechnology

Displaying records 91 to 100 of 229 records.
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91. Infrared hemispherical reflectance of carbon nanotube mats and arrays in the 5 um to 50 um wavelength region
Topic: Nanotechnology
Published: 7/15/2012
Authors: John H Lehman, C J Chunnilall, Evangelos Theocharous, Aric Warner Sanders
Abstract: We present the absolute infrared (5 μm to 50 μm) reflectance of films produced from commercially available carbon nanotubes. Data were obtained using the upgraded NPL directional- hemispherical reflectance measurement facility. A brief d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908159

92. A Glowing Future for Lab on a Chip Testing Standards
Topic: Nanotechnology
Published: 6/28/2012
Author: Samuel M Stavis
Abstract: Testing standards are more fundamental from a metrological perspective and less controversial from an industrial perspective than product standards, representing a path of less resistance towards the standardization and commercialization of lab on a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910438

93. Photo-induced Surface Transformation of Silica Nanocomposites
Topic: Nanotechnology
Published: 6/22/2012
Authors: Justin M Gorham, Tinh Nguyen, Coralie Bernard, Deborah L Stanley, Richard D Holbrook
Abstract: The physicochemical, UV-induced surface modifications to silica nanoparticle (SiNP) - epoxy composites have been investigated. The silica nanocomposites (SiNCs) were prepared using a two-part epoxy system with 10 % mass fraction of SiNPs and expose ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910637

94. Large Stroke Electrostatic Comb-Drive Actuators Based on a Novel Flexure Mechanism
Topic: Nanotechnology
Published: 6/20/2012
Authors: Mohammad Olfatnia, Siddharth Sood, Jason John Gorman, Shorya Awtar
Abstract: This paper reports in-plane electrostatic comb-drive actuators with stroke as large as 245 µm, achieved by employing a novel Clamped Paired Double Parallelogram (C-DP-DP) flexure mechanism. For a given flexure beam length (L1), comb gap (G), and actu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911098

95. Preparation of Nanoparticle Dispersions from Powdered Material Using Ultrasonic Disruption
Series: Special Publication (NIST SP)
Report Number: 1200-2
Topic: Nanotechnology
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910680

96. Preparation of Nanoscale TiO2 Dispersions in Biological Test Media for Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-4
Topic: Nanotechnology
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910683

97. Preparation of Nanoscale TiO2 Dispersions in an Environmental Matrix for Eco-Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-5
Topic: Nanotechnology
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910684

98. Preparation of a Nanoscale TiO2 Aqueous Dispersion for Toxicological or Environmental Testing
Series: Special Publication (NIST SP)
Report Number: 1200-3
Topic: Nanotechnology
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910682

99. Reporting Guidelines for the Preparation of Aqueous Nanoparticle Dispersions from Dry Materials
Series: Special Publication (NIST SP)
Report Number: 1200-1
Topic: Nanotechnology
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910681

100. Nanoparticle Size and Shape Evaluation Using the TSOM Method
Topic: Nanotechnology
Published: 6/1/2012
Authors: Bradley N Damazo, Ravikiran Attota, Premsagar Purushotham Kavuri, Andras Vladar
Abstract: A novel through-focus scanning optical microscopy (TSOM) method that yields nanoscale information from optical images obtained at multiple focal planes will be used here for nanoparticle dimensional analysis. The TSOM method can distinguish not only ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911138



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