NIST logo

Publications Portal

You searched on:
Topic Area: Nanotechnology

Displaying records 91 to 100 of 387 records.
Resort by: Date / Title


91. Trapping and Release of Citrate-Capped Gold Nanoparticles
Topic: Nanotechnology
Published: 8/1/2011
Authors: Darwin R Reyes-Hernandez, Geraldine I. Mijares, Brian Joseph Nablo, Kimberly A Briggman, Michael Gaitan
Abstract: An electrical method to trap and release charged gold nanoparticles on and from the surface of alkanethiol self-assembled-monolayer (SAM) modified gold electrodes is presented. Gold nanoparticle (GNP) coated electrodes were formed by immersing amine ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904039

92. Lithography and Chemical Modeling of Acid Amplfiers for Use in EUV Photoresists
Topic: Nanotechnology
Published: 7/28/2011
Authors: Kirstin Kruger, craig higgins, Gregg M. Gallatin, Robert Brainard
Abstract: We postulate that the best way to simultaneously improve resolution, line edge roughness (LER), and sensitivity all in EUV resists is to increase the number of acid molecules generated per absorbed photon. In previous work, we showed that acid ampli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908397

93. A circular dielectric grating for vertical extraction of single quantum dot emission
Topic: Nanotechnology
Published: 7/25/2011
Authors: Marcelo Ishihara Davanco, Matthew T. Rakher, Dieter Schuh, Antonio Badolato, Kartik A Srinivasan
Abstract: We demonstrate a suspended circular grating composed of partially etched annular trenches in a thin GaAs membrane, designed for e±cient and moderately broadband ( approx. 5 nm) extraction of emission from single InAs quantum dots. Simulations indic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908236

94. Far infrared and Terahertz thermal detectors for radiometry using a carbon nanotube array
Topic: Nanotechnology
Published: 7/18/2011
Authors: John H Lehman, Erich N Grossman
Abstract: We present a description of a 1.5 mm long, vertically aligned carbon nanotube array (VANTA) on a thermopile, and separately on a pyroelectric detector. Three VANTA samples, having average lengths of 40 µm, 150 µm and 1.5 mm were evaluated with respe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908490

95. Surface-directed Growth of Nanowires: A Scalable Platform for Nanodevice Fabrication
Topic: Nanotechnology
Published: 7/11/2011
Author: Babak Nikoobakht
Abstract: Optical lithography continues to be the popular technique for further miniaturization of electronic circuitry and its components. However, as further device miniaturization continues, complexity of pattern generation and cost increase; therefore th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908140

96. Small fluctuations in epitaxial growth via conservative noise
Topic: Nanotechnology
Published: 7/7/2011
Authors: Paul N. Patrone, Rongrong Wang, Dionisios Margetis
Abstract: We study the combined effect of growth (material deposition from above) and nearest-neighbor entropic and force-dipole interactions in a stochastically perturbed system of N line defects (steps) on a vicinal crystal surface in 1+1 dimensions. Firs ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908523

97. Fate of nanoparticles during life cycle of polymer nanocomposites
Topic: Nanotechnology
Published: 7/6/2011
Authors: Tinh Nguyen, Bastien T. Pellegrin, Coralie Bernard, Xiaohong Gu, Justin M Gorham, Paul E Stutzman, Deborah L Stanley, Walter Eric Byrd, John W Hettenhouser, Joannie W Chin
Abstract: Nanoparticles are increasingly used in consumer and structural polymeric products to enhance a variety of properties. Under the influences of environmental factors (e.g., ultraviolet, moisture, temperature) and mechanical actions (e.g., scratching, v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907488

98. Electrical Characterization of Photoconductive GaN Nanowire Devices from 50 MHz to 33 GHz
Topic: Nanotechnology
Published: 7/1/2011
Authors: Thomas M Wallis, Dazhen Gu, Atif Imtiaz, Pavel Kabos, Paul Timothy Blanchard, Norman A Sanford, Kristine A Bertness, Christpher Smith
Abstract: The electrical response of two-port., photoconductive GaN nanowire devices was measured from 50 MHz to 33 GHz. The admittance of individual contacted nanowires showed an increase on the order of 10% throughout the measured frequency range after expo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903093

99. Evaluating the characteristics of multiwall carbon nanotubes
Topic: Nanotechnology
Published: 7/1/2011
Authors: John H Lehman, M. Terrones, Elisabeth Mansfield, Katie Hurst, Vincent Muenier
Abstract: During the past 20 years, multiwall carbon nanotubes (MWCNTs) have become an important industrial material. Hundreds of tons are produced each year. This review is a survey of the scientific literature, motivated by industrial requirements and guidel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907346

100. One-dimensional p-n heterojunctions of zinc oxide on gallium nitride: A structural characterization
Topic: Nanotechnology
Published: 7/1/2011
Authors: Babak Nikoobakht, John E Bonevich, Andrew A Herzing
Abstract: Recently we showed lateral growth of ZnO nanowires and nanowalls on single crystal GaN and formation of bi- and tri-directional assembly of nanowires and nanowalls using a surface-directed vapor-liquid-solid process (SVLS). Taking advantage of this ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907758



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series