NIST logo

Publications Portal

You searched on:
Topic Area: Math
Sorted by: title

Displaying records 211 to 220 of 225 records.
Resort by: Date / Title

211. Transient Convection-Diffusion Modelling of Peak Temperature in Orthogonal Cutting
Topic: Math
Published: 8/19/2012
Authors: Timothy J Burns, Steven P Mates, Richard L. Rhorer, Eric Paul Whitenton, Debasis Basak
Abstract: Numerical finite-difference simulations of a two-dimensional transient fast convection-slow diffusion model of the temperature field in orthogonal cutting, due to Tlusty, have been shown to provide better predictions of the peak temperature during or ...

212. Trapezoidal and Triangular Distributions for Type B Evaluation of Standard Uncertainty
Topic: Math
Published: 2/26/2007
Authors: Raghu N Kacker, James F Lawrence
Abstract: A Type B standard uncertainty is determined from a probability distribution specified by scientific judgment based on all available information. The ISO-GUM discusses symmetric distributions only. Sometimes an asymmetric distribution is needed. We de ...

213. Uncertainties in Scaling Factors for Ab Intio Vibrational Frequencies
Topic: Math
Published: 8/26/2005
Authors: K Irikura, R Johnson, Raghu N Kacker
Abstract: The n-qubit concurrence canonical decomposition (CCD) is a generalization of the two-qubit canonical decomposition SU(4)=[SU(2) (x) SU(2)] ? [SU(2) (x) SU(2)], where ? is the commutative group which phases the maximally entangled Bell basis. A pre ...

214. User Guide to CADMUS, a Simplified Parallel Routine for Laplacian-Fractal Growth
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6180
Topic: Math
Published: 6/1/1998
Authors: H A Fowler, J E Devaney, John G Hagedorn

215. Using Model Checking to Generate Tests from Specifications
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6166
Topic: Math
Published: 11/1/1998
Authors: P E Ammann, Paul E Black, William J Majurski

216. Using Nanoscillatory Splines to Model Urban Environments
Topic: Math
Published: 1/15/2004
Authors: David E. Gilsinn, Marjorie A McClain, Christoph Johann Witzgall

217. Using Nonoscillatory Splines to Model Urban Environments
Topic: Math
Published: 1/15/2004
Authors: David E. Gilsinn, Marjorie A McClain, Christoph Johann Witzgall
Abstract: In this paper we introduce the notion of Lavery splines and examine their properties in the univariate case. We also discuss some of the details involved with computing these splines on irregularly spaced data.

218. Variable Projection for Nonlinear Least Squares Problems
Topic: Math
Published: 8/2/2012
Authors: Dianne M O'Leary, Bert W Rust
Abstract: The variable projection algorithm of Golub and Pereyra (1973) has proven to be quite valuable in the solution of nonlinear least squares problems in which a substantial number of the parameters are linear. Its advantages are efficiency and, more imp ...

219. Volume Estimation of Molded Artifacts by B-Splines
Topic: Math
Published: 10/9/2009
Authors: David E. Gilsinn, Bruce R. Borchardt, Amelia Tebbe
Abstract: The volumes of two industrially molded non-metallic artifacts were estimated using surface data obtained by a coordinate measuring machine. A tensor product of B-splines was used to model the probed data points on the surface and the Divergence Theor ...

220. Waveform metrology and a quantitative study of regularized deconvolution
Topic: Math
Published: 5/1/2010
Authors: Paul D Hale, Andrew M Dienstfrey
Abstract: We present methodology and preliminary results of a Monte-Carlo simulation to perform a quantified analysis of regularized deconvolution in the context of full waveform metrology. We analyze the behavior of different regularized inversion methods wi ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series