NIST logo

Publications Portal

You searched on: Topic Area: Electromagnetics

Displaying records 1 to 10 of 51 records.
Resort by: Date / Title


1. Parameter Estimation and Uncertainty Evaluation in a Low Rician K-Factor Reverberation-Chamber Environment
Topic: Electromagnetics
Published: 10/15/2014
Authors: Chih-Ming Wang, Catherine A Remley, Ansgar T. Kirk, Ryan J. Pirkl, Christopher L Holloway, Dylan F Williams, Paul D Hale
Abstract: In this paper we study statistical methods for estimating the Rician K-factor when this parameter is small. A fiducial approach for making statistical inference on the K-factor is discussed. The approach requires a Monte Carlo method to compute the u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914638

2. Amplifier and Transistor Noise-Parameter Measurements
Topic: Electromagnetics
Published: 10/1/2014
Author: James Paul Randa
Abstract: Methods for measuring the noise parameters of amplifiers and on-wafer transistors are reviewed. After some preliminary background information and conventions, noise parameters are defined and the most common measurement strategies are presented, bot ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915122

3. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Electromagnetics
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian John Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

4. MIMO Capacity in 2-D and 3-D Isotropic Environments
Topic: Electromagnetics
Published: 5/21/2013
Authors: Ryan J. Pirkl, Catherine A Remley
Abstract: We analyze the distribution of MIMO channel capacity for different antennas in 2-D and 3-D statistically isotropic environments. These represent possible test environments that may be generated by multi-probe anechoic and reverberation chambers, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910357

5. NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications
Series: Handbook (NIST HB)
Report Number: 150-11
Topic: Electromagnetics
Published: 4/25/2013
Authors: Bethany E Hackett, Bradley W Moore, Dennis G. Camell
Abstract: NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913586

6. Estimating Uncertainties in Antenna Measurements
Topic: Electromagnetics
Published: 4/8/2013
Author: Michael H Francis
Abstract: We describe general methods of estimating uncertainties in antenna measurements. These include estimates based on theory (analysis1), simulation, and altering the measurement system (self-coparison tests). The important component sources of uncertain ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913006

7. Evaluation of a Robotically Controlled Millimeter-Wave Near-Field Pattern Range at NIST Determining mechaincal suitability for antenna measurements
Topic: Electromagnetics
Published: 4/8/2013
Authors: David R Novotny, Joshua A Gordon, Jason B Coder, Michael H Francis, Jeffrey R Guerrieri
Abstract: The Antenna Metrology Laboratory at the National Institute of Standards and Technology, USA (NIST) is developing a robotically controlled near-field pattern range for measuring antennas and components from 50 GHz to 500 GHz. This new range is intende ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913071

8. Measurement of orbital asymmetry and strain in Co^d90^Fe^d10^/Ni multilayers and alloys: Origins of perpendicular anisotropy
Topic: Electromagnetics
Published: 2/13/2013
Authors: Justin M Shaw, Hans Toya Nembach, Thomas J Silva
Abstract: We use broadband ferromagnetic resonance spectroscopy and x-ray diffraction to investigate the fundamental origin of perpendicular anisotropy in Co^d90^Fe^d10^/Ni multilayers. By careful evaluation of the spectroscopic {I}g{/I}-factor, we determine ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913103

9. A Large-Signal Model of Ferroelectric Thin-Film Transmission Lines"
Topic: Electromagnetics
Published: 12/1/2011
Authors: Eduard Rocas, Juan C. Collado Gomez, Jordi Mateu, Nathan D Orloff, James C Booth, Juan Manuel O'C allaghan
Abstract: "This work evaluates the microwave nonlinear properties and tuning at RF frequencies of ferroelectric Ba0.3Sr0.7TiO3 thin-films by on-wafer measurements of the second and third-order harmonics and intermodulation products of several coplanar transmis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907951

10. Verification of Noise-Parameter Measurements and Uncertainties
Topic: Electromagnetics
Published: 11/1/2011
Authors: James Paul Randa, Dazhen Gu, David K Walker
Abstract: We propose and implement verification methods for measurements of noise parameters of amplifiers and transistors. Because the verification rests on the comparison of different measurement results, it also serves as a test of the uncertainties. The ve ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904668



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series