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You searched on: Author: Andrew Rukhin

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1. Quantifying Uncertainty in Accelerometer Sensitivity Studies
Published: 6/22/2015
Authors: Andrew L Rukhin, David J. Evans
Abstract: Key Comparisons of accelerometers sensitivity measurement are performed to compare the sensitivity of linear accelerometers. The key comparison reference value (KCRV) for charge sensitivity as a function of frequency and the accompanying uncertain ...

2. Random Effects Model for Bias Estimation: Higher Order Asymptotic Inference
Published: 5/31/2015
Author: Andrew L Rukhin
Abstract: A common issue in metrology is to validate or to calibrate laboratory's method. To solve this problem a lab performs measurements on a certified reference material with a given coverage interval. Assuming that the measurand is random with a normal ...

3. Decision-Theoretic Issues in Heterogeneity Variance Estimation
Published: 2/8/2015
Author: Andrew L Rukhin
Abstract: In a random-effects setting of meta-analysis the between-study variance estimation is studied from the decision-theoretic point of view. The problem concerns simultaneous inference on curve-confined natural parameters of independent heterogeneous ch ...

4. The ABCs of Using Standard Reference Materials in the Analysis of Foods and Dietary Supplements: A Practical Guide
Series: Special Publication (NIST SP)
Report Number: 260-181
Published: 6/2/2014
Authors: Katherine E Sharpless, David Lee Duewer, Katrice A Lippa, Andrew L Rukhin
Abstract: Although ,nutraceuticals‰ and ,functional foods‰ seem to be ill-defined terms, both are often used to indicate a food that contains compounds providing benefits beyond basic nutrition, often with the expectation that these compounds are protectiv ...

5. Decision-Theoretic Aspects of Meta-Analysis
Published: 4/1/2014
Author: Andrew L Rukhin
Abstract: In the random-effects model of meta-analysis a canonical representation of the restricted likelihood function is obtained. The relationship between the common mean estimators and the heterogeneity variance estimators is explored via this representati ...

6. Bounds on Elementary Symmetric Functions
Published: 1/31/2014
Author: Andrew L Rukhin
Abstract: Tight bounds on an elementary symmetric function are established for given values of these polynomials of lower order.

7. Restricted Likelihood Representation for Multivariate Heterogeneous Random Effects Models
Published: 1/31/2014
Author: Andrew L Rukhin
Abstract: In the random-effects model of meta-analysis for heterogeneous multidimensional data a canonical representation of the restricted likelihood function is obtained. This representation is related to a linear data transform which is based on the algebr ...

8. Bayes Estimators of Heterogeneity Variance and T-Systems
Published: 1/8/2014
Author: Andrew L Rukhin
Abstract: The considered problem concerns simultaneous inference for curve-confined natural parameters of independent, heterogeneous gamma-random variables with known shape parameters. The meta-analysis motivated loss function is suggested and some propertie ...

9. Compatibility Verification of Certified Reference Materials and User Measurements
Published: 12/9/2013
Author: Andrew L Rukhin
Abstract: A problem that frequently occurs in metrology is one of assessing compatibility of data obtained by a user laboratory with the specified values and uncertainty estimates from the certificate of analysis. The user‰s data are summarized by a measura ...

10. Assessing Conformity of Two Laboratories: Formulations as a Statistical Hypothesis Testing Problem
Published: 1/9/2013
Author: Andrew L Rukhin
Abstract: A decision problem frequently occurring in metrology is that of compatibility of data obtained by two (or several) different laboratories, methods or instruments. Several statistical approaches to this conformity assessment problem are reviewed inclu ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
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