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You searched on: Author: Terrence Jach

Displaying records 1 to 10 of 32 records.
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1. Quasiparticle Lifetime Broadening in Resonant X-ray Scattering of Ammonium Nitrate
Published: 7/29/2016
Authors: John Thomas Vinson, Terrence J Jach, Matthias Mueller, Rainer Unterrumsberger, Burkhard Beckhoff
Abstract: It has been previously shown that two effects cause dramatic changes in the x-ray absorption and emission spectrra from the N K edge of the insulating crystal ammonium nitate. First, vibrational disorder causes major changes in the absorption spe ...

2. The Multiple Origins of Broadening in Near-edge X-ray Spectra of Nitrogen Compounds
Published: 11/10/2014
Authors: John Thomas Vinson, Terrence J Jach, W. T. Elam, J. D. Denlinger
Abstract: A comparison of the N Kα emission spectrum of crystalline ammonium nitrate to molecular orbital calculations reveals a unique observation: the peak associated with the σNO recombination is broadened so extensively as to virtually disapp ...

3. High Resolution X-ray Spectrometry of Solids using the Microcalorimeter X-ray Detector
Published: 9/20/2010
Author: Terrence J Jach
Abstract: We analyze here the spectrum of the AI Kα and Mg Kα x-ray lines obtained by electron excitation of a multielement glass. The spectrum was obtained in an electron beam probe using a microcalorimeter x-ray detector. With 7 eV resolution, we ...

4. Multiplexed microcalorimeter arrays for precision measurements from microwave to gamma-ray wavelengths
Published: 8/21/2007
Authors: Joel Nathan Ullom, William B Doriese, James A Beall, William Duncan, S. Lisa Ferreira, Gene C Hilton, Robert D Horansky, Kent D. Irwin, Terrence J Jach, John A B Mates, Nathan A Tomlin, Galen C O\'Neil, Carl D Reintsema, Nicholas Ritchie, Daniel R Schmidt, Leila R Vale, Yizi Xu, Barry L. Zink, Andrew Hoover, Clifford R Rudy, Derek Tournear, Duc Vo, Michael W Rabin
Abstract: Cryogenic microcalorimeters are a promising technology for ultrasensitive measurements of electromagnetic radiation from microwave to gamma-ray wavelengths. Cryogenic microcalorimeters derive their exquisite sensitivity from the minimal thermal noise ...

5. Variable Magnification With Kirkpatrick-Baez Optics for Synchrotron X-Ray Microscopy
Series: Journal of Research (NIST JRES)
Published: 5/1/2006
Authors: Terrence J Jach, A S Bakulin, S M Durbin, J Pedulla, A T Macrander
Abstract: We describe the distinction between the operation of a short focal lengthx-ray microscope forming a real image with a laboratory source (convergentillumination) and with a highly collimated intense beam from a synchrotronlight source (K\{o}hler illum ...

6. Long-Range Strains and the Effects of Applied Field at 180 Ferroelectric Domain Walls in Lithium Niobate
Published: 2/1/2004
Authors: Terrence J Jach, S. Kim, J. A. Aust, S M Durbin, David Seymour Bright
Abstract: rroelectric domains with antiparallel polarization are readily induced in congruent LiNbO3 with electric fields above 240 kV/cm at room temperature. Even in the absence of external fields, these 180 walls exhibit wide regions of shear strain, of th ...

7. Comparative Thickness Measurements of SiO^d2^/Si Films for Thickness Less than 10 nm
Published: 1/1/2004
Authors: Terrence J Jach, Joseph A Dura, Nhan V Nguyen, J R. Swider, G Cappello, Curt A Richter
Abstract: We report on a comparative measurement of SiO^d2^/Si dielectric film thickness (t < 10 nm) using grazing incidence x-ray photoelectron spectroscopy, neutron reflectometry, and spectroscopic ellipsometry. Samples with nominal thicknesses of 3 nm to ...

8. Comparative Thickness Measurements of SiO^d2^/Si Films for Thicknesses Less than 10 nm
Published: 1/1/2004
Authors: Terrence J Jach, Joseph A Dura, Nhan V Nguyen, J Swider, G Cappello, Curt A Richter

9. Surface and Thin Film Analysis - A Compendium of Principles, Instrumentation, and Applications
Published: 4/1/2003
Author: Terrence J Jach
Abstract: Book review of Surface and Thin Film Analysis, (H. Bubert and H. Jenett, eds) published by Wiley-VCH, Weinheim, 2002.

10. Grazing Incidence X-Ray Photoelectron Spectroscopy: A Method to Study Gate Dielectric Films on Si
Published: 11/1/2002
Authors: Terrence J Jach, E Landree
Abstract: Grazing Incidence X-ray Photoelectron Spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemistry of ultrathin gate dielectric films. It combines aspects of x-ray reflectivity and convent ...

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