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Author: Terrence Jach

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1. High Resolution X-ray Spectrometry of Solids using the Microcalorimeter X-ray Detector
Published: 9/20/2010
Author: Terrence J Jach
Abstract: We analyze here the spectrum of the AI Kα and Mg Kα x-ray lines obtained by electron excitation of a multielement glass. The spectrum was obtained in an electron beam probe using a microcalorimeter x-ray detector. With 7 eV resolution, we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904634

2. Multiplexed microcalorimeter arrays for precision measurements from microwave to gamma-ray wavelengths
Published: 8/21/2007
Authors: Joel Nathan Ullom, William Bertrand Doriese, James A Beall, William Duncan, S. Lisa Ferreira, Gene C Hilton, Robert Daniel Horansky, Kent D Irwin, Terrence J Jach, John A B Mates, Nathan A Tomlin, Galen C O'Neil, Carl D Reintsema, Nicholas Ritchie, Daniel Richard Schmidt, Leila R Vale, Yizi Xu, Barry L. Zink, Andrew Hoover, Clifford R Rudy, Derek Tournear, Duc Vo, Michael W Rabin
Abstract: Cryogenic microcalorimeters are a promising technology for ultrasensitive measurements of electromagnetic radiation from microwave to gamma-ray wavelengths. Cryogenic microcalorimeters derive their exquisite sensitivity from the minimal thermal noise ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32579

3. Variable Magnification With Kirkpatrick-Baez Optics for Synchrotron X-Ray Microscopy
Series: Journal of Research (NIST JRES)
Published: 5/1/2006
Authors: Terrence J Jach, A S Bakulin, S M Durbin, J Pedulla, A T Macrander
Abstract: We describe the distinction between the operation of a short focal lengthx-ray microscope forming a real image with a laboratory source (convergentillumination) and with a highly collimated intense beam from a synchrotronlight source (K\{o}hler illum ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831409

4. Long-Range Strains and the Effects of Applied Field at 180 Ferroelectric Domain Walls in Lithium Niobate
Published: 2/1/2004
Authors: Terrence J Jach, S. Kim, V. Gopalan, S M Durbin, David S. Bright
Abstract: rroelectric domains with antiparallel polarization are readily induced in congruent LiNbO3 with electric fields above 240 kV/cm at room temperature. Even in the absence of external fields, these 180 walls exhibit wide regions of shear strain, of th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831298

5. Comparative Thickness Measurements of SiO^d2^/Si Films for Thickness Less than 10 nm
Published: 1/1/2004
Authors: Terrence J Jach, Joseph A. Dura, Nhan V Nguyen, J R. Swider, G Cappello, Curt A Richter
Abstract: We report on a comparative measurement of SiO^d2^/Si dielectric film thickness (t < 10 nm) using grazing incidence x-ray photoelectron spectroscopy, neutron reflectometry, and spectroscopic ellipsometry. Samples with nominal thicknesses of 3 nm to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831275

6. Comparative Thickness Measurements of SiO^d2^/Si Films for Thicknesses Less than 10 nm
Published: 1/1/2004
Authors: Terrence J Jach, Joseph A. Dura, Nhan V Nguyen, J Swider, G Cappello, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31662

7. Surface and Thin Film Analysis - A Compendium of Principles, Instrumentation, and Applications
Published: 4/1/2003
Author: Terrence J Jach
Abstract: Book review of Surface and Thin Film Analysis, (H. Bubert and H. Jenett, eds) published by Wiley-VCH, Weinheim, 2002.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831268

8. Grazing Incidence X-Ray Photoelectron Spectroscopy: A Method to Study Gate Dielectric Films on Si
Published: 11/1/2002
Authors: Terrence J Jach, E Landree
Abstract: Grazing Incidence X-ray Photoelectron Spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemistry of ultrathin gate dielectric films. It combines aspects of x-ray reflectivity and convent ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831285

9. Real-Time Studies of Strains at Ferroelectric Domain Walls under an Applied Field
Published: 8/17/2002
Authors: Terrence J Jach, S. Kim, S M Durbin, V. Gopalan, David S. Bright
Abstract: We report on an improved method of visualizing domains in congruent ferroelectric crystals such as LiNbO^d3 with Bragg x-ray topography. Using monochromatic synchrotron undulator radiation and a magnifying x-ray camera, we are able to image domains c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831254

10. Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics
Published: 12/1/2001
Authors: Terrence J Jach, S M Durbin, A S Bakulin, David S. Bright, C B Stagarescu, G Srajer, D. Haskel, J Pedulla
Abstract: Modern technology permits us to fabricate Kirkpatrick-Baez (KB) multilayer optics with performance close to the theoretical limit. We have constructed a KB field-imaging microscope which operates in the x-ray energy range 6-10 keV with a field of vi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831231



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