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You searched on: Author: Vincent Lee

Displaying records 1 to 10 of 17 records.
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1. EVALUATION OF THE RANGE PERFORMANCE OF LASER SCANNERS USING NON-PLANAR TARGETS
Published: 11/1/2015
Authors: Prem Kumar Rachakonda, Balasubramanian Muralikrishnan, Craig M Shakarji, Vincent D Lee, Daniel S Sawyer
Abstract: The Dimensional Metrology Group (DMG) at the National Institute of Standards and Technology (NIST) is supporting the development of documentary standards for performance evaluation of Laser scanners. This evaluation could be performed by determinin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919240

2. Design and calibration of an artifact for evaluating laser scanning articulating arm CMMs used for measuring complex non-concurrent surfaces
Published: 10/30/2015
Authors: Vincent D Lee, Steven David Phillips, Craig M Shakarji, Jeffrey Hosto, Jeffrey Huber, Gillich Barbara
Abstract: Dimensional metrology is a foundational science finding applications throughout modern technology, including the testing of human-worn body armor designed to mitigate damage from kinetic projectiles fired from small arms. We describe the design and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919256

3. Towards the Development of a Documentary Standard for Derived-Point to Derived-Point Distance Performance Evaluation of Spherical Coordinate 3D Imaging Systems
Published: 10/30/2015
Authors: Balasubramanian Muralikrishnan, Katharine M Shilling, Prem Kumar Rachakonda, Wei Ren, Vincent D Lee, Daniel S Sawyer
Abstract: This paper describes ongoing research work within the Dimensional Metrology Group (DMG) at the National Institute of Standards and Technology (NIST) in support of the development of a documentary standard for derived-point to derived-point distance p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917419

4. Considerations for Design and In-Situ Calibration of High Accuracy Length Artifacts for Field Testing of Laser Trackers
Published: 3/1/2015
Authors: Aaron Hudlemeyer, Daniel S Sawyer, Christopher J. Blackburn, Vincent D Lee, Mark Meuret, Craig M Shakarji
Abstract: Interim testing of laser trackers can be problematic due to the lack of high precision, long length artifacts that maintain their calibrated lengths during measurement. Gravitational loading, fixturing forces, and changes in the atmospheric conditio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916346

5. Volumetric Performance Evaluation of a Laser Scanner Based on Geometric Error Model
Published: 1/5/2015
Authors: Balasubramanian Muralikrishnan, Massimiliano M. Ferrucci, Daniel S Sawyer, Grant Gerner, Vincent D Lee, Christopher J. Blackburn, Steven David Phillips, Yuri Yakovlev, Andrey Astrelin, Spike Milligan, John Palmateer
Abstract: We discuss a geometric error model for those large volume laser scanners that have the laser source and a spinning prism mirror mounted on a platform that can rotate about the vertical axis. We describe the terms that constitute the model, address th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916328

6. A Method of Determining Sphere Center to Center Distance Using Laser Trackers For Evaluating Laser Scanners.
Published: 11/11/2014
Authors: Prem Kumar Rachakonda, Balasubramanian Muralikrishnan, Vincent D Lee, Daniel S Sawyer, Steven David Phillips, John Palmateer
Abstract: The Dimensional Metrology Group (DMG) at the National Institute of Standards and Technology (NIST) is involved in the development of documentary standards for volumetric performance evaluation of laser scanners. Typical evaluation of these scanne ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916458

7. Laser scanner two-face errors on spherical targets
Published: 11/11/2014
Authors: Balasubramanian Muralikrishnan, Katharine M Shilling, Daniel S Sawyer, Prem Kumar Rachakonda, Vincent D Lee, Steven David Phillips, Geraldine S Cheok, Kamel S Saidi
Abstract: Geometric misalignments within the construction of a laser scanner such as offsets, tilts, and eccentricities, result in systematic errors in the measured point coordinates (range and angles). Many of these sources of error are sensitive to two-face ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916435

8. Evaluating CT for Metrology: The Influence of Material Thickness on Measurements
Published: 10/7/2014
Authors: Joseph Schlecht, Eric Ferley, Shaun COUGHLIN , Steven David Phillips, Vincent D Lee, Craig M Shakarji
Abstract: X-ray imaging provides a non-destructive means to measure internal features of a workpiece, and CT offers unique capabilities for internal measurements in 3-D. However, due to the computational nature of CT and its indirect measurement process, asses ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916961

9. A Proposed Interim Check for Field Testing a Laser Tracker‰s 3-D Length Measurement Capability Using a Calibrated Scale Bar as a Reference Artifact
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 8016
Published: 10/1/2014
Authors: Vincent D Lee, Christopher J. Blackburn, Balasubramanian Muralikrishnan, Daniel S Sawyer, Mark Meuret, Aaron Hudlemeyer
Abstract: This paper describes a proposed interim check for field testing a laser tracker‰s 3-D length measurement capability using a calibrated scale bar as a reference artifact. The tests described here are constructed to be sensitive to uncompensated error ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916126

10. Ranging Performance Evaluation of a Laser Scanner
Published: 10/20/2013
Authors: Massimiliano M. Ferrucci, Balasubramanian Muralikrishnan, Christopher J. Blackburn, Daniel S Sawyer, Steven David Phillips, Vincent D Lee, Peter Petrov, Yuri Yakovlev, Andrey Astrelin, Spike Milligan, John Palmateer
Abstract: Large volume laser scanners are used for a variety of purposes, including dimensional metrology of large artifacts, digitization and reverse engineering, as well as historical preservation and archiving. In evaluating the performance of laser sca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914333



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