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Author: David Gundlach

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1. Predicting the J-V Curve in Organic Photovoltaics Using Impedance Spectroscopy
Published: 6/2/2014
Authors: James Ian Basham, Thomas N Jackson, David J Gundlach
Abstract: We employ impedance spectroscopy as a method to predict the current-voltage curve in organic photovoltaics. This technique allows the quantification of the recombination rate, series resistance, carrier density and lifetime very close to normal oper ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915218

2. Highly reproducible and reliable metal/graphene contact by UV-Ozone treatment
Published: 3/17/2014
Authors: Wei Li, Christina Ann Hacker, Guangjun Cheng, Angela R Hight Walker, Curt A Richter, David J Gundlach, Yiran Liang, boyuan Tian, Xuelei Liang, Lianmao Peng
Abstract: Resist residue from the device fabrication process is a significant source of contamination at the metal/graphene contact interface. Ultraviolet Ozone (UVO) treatment is proven here, by X-ray photoelectron spectroscopy (XPS) and Raman measurement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915002

3. Modulated photocurrent spectroscopy of CdTe/CdS solar cells-equivalent circuit analysis
Published: 5/20/2013
Authors: Behrang H Hamadani, John F Roller, Kounavis Panagiotis, Nikolai B Zhitenev, David J Gundlach
Abstract: We have used the technique of photocurrent modulated spectroscopy to investigate the dynamic response of charge carrier transport in thin film CdTe/CdS solar cells as a function of light bias and temperature over a broad excitation frequency range. T ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912092

4. Graphene as Transparent Electrode for Direct Observation of Hole Photoemission from Silicon to Oxide
Published: 3/27/2013
Authors: Rusen Yan, Qin Q. Zhang, Oleg A Kirillov, Wei Li, James Ian Basham, Alexander George Boosalis, Xuelei X. Liang, Debdeep Jena, Curt A Richter, Alan C. Seabaugh, David J Gundlach, Huili G. Xing, Nhan V Nguyen
Abstract: The outstanding electrical and optical properties of graphene make it an excellent alternative as a transparent electrode. Here we demonstrate the application of graphene as collector material in internal photoemission (IPE) spectroscopy; enabling th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912851

5. Band Offset Determination of Atomic-Layer-Deposited Al2O3 and HfO2 on InP by Internal Photoemission and Spectroscopic Ellipsometry
Published: 1/9/2013
Authors: Kun Xu, Oleg A Kirillov, David J Gundlach, Nhan V Nguyen, Pei D Ye, Min Xu, Lin Dong, Hong Sio
Abstract: Band offsets at the interfaces of n- and p-type InP ((100) and (111)A) and atomic-layer-deposited (ALD) Al2O3 were measured with internal photoemission and spectroscopic ellipsometry. Similarly, the band offsets at the interface of semi-insulatin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911342

6. Observation of spin-valve effect in Alq3 using a low work function metal
Published: 9/7/2012
Authors: Hyuk-Jae Jang, Kurt Pernstich, David J Gundlach, Oana Jurchescu, Curt A Richter
Abstract: We present the observation of magnetoresistance in Co/Ca/Alq3/Ca/NiFe spin-valve devices. Thin Ca layers contacting 150 nm thick Alq3 enable the injection of spin-polarized electrons into Alq3 due to engineering of the band alignment. The devices ex ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911326

7. Determination of graphene work function and graphene-insulator-semiconductor band alignment by internal photoemission spectroscopy
Published: 7/11/2012
Authors: Rusen Yan, Qin Q. Zhang, Wei Li, Irene G. Calizo, Tian T. Shen, Curt A Richter, Angela R Hight Walker, Xuelei X. Liang, David J Gundlach, Nhan V Nguyen, Huili Grace Xing, Alan Seabaugh
Abstract: We determined the band alignment of a graphene-oxide-silicon structure using internal photoemission spectroscopy. From the flatband voltage and Dirac voltage we infer a 4.3  10e11 cm-2 negative extrinsic charge present on the graphene surface. Als ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911396

8. Measuring domain sizes and compositional heterogeneities in P3HT-PCBM bulk heterojunction thin films with 1H spin diffusion NMR spectroscopy
Published: 3/21/2012
Authors: Ryan C Nieuwendaal, Hyun W. Ro, David Germack, Regis J Kline, Calvin Chan, Amit Kumar Agrawal, David J Gundlach, David Lloyd VanderHart, Dean M DeLongchamp
Abstract: In this manuscript we show that 1H spin diffusion NMR is a valuable method for estimating the domain sizes in thin films of a polymer-fullerene blend for bulk heterojunction (BHJ) photovoltaics. Variations in common BHJ film processing parameters hav ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908099

9. Flip Chip Lamination to electrically contact organic single crystals on flexible substrates
Published: 4/20/2011
Authors: Oana Jurchescu, Brad Conrad, Christina Ann Hacker, David J Gundlach, Curt A Richter
Abstract: The fabrication of top metal contacts for organic electronics represents a challenge and has important consequences for electrical properties of such systems. We report a low cost and non-destructive printing process, Flip Chip Lamination (FCL), to f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907524

10. Controlling the Microstructure of Solution-Processible Small Molecules in Thin-Film Transistors through Substrate Chemistry
Published: 2/4/2011
Authors: Regis J Kline, Steven D Hudson, Xinran Zhang, David J Gundlach, Andrew Moad, Lee J Richter, Oana Jurchescu, Thomas Jackson, Sanker Subramanian, John E Anthony, Michael F. Toney
Abstract: Solution-processible small molecules have tremendous potential for providing both high charge carrier mobility and low cost processing. This study outlines a detailed microstructural study of the effect of substrate chemistry on fluorinated 5,11-bis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906810



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