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You searched on: Author: Dylan Williams

Displaying records 1 to 10 of 180 records.
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1. A Significance Test for Reverberation-Chamber Measurement Uncertainty in Total Radiated Power of Wireless Devices
Published: 10/27/2015
Authors: Catherine A Remley, Chih-Ming Wang, Dylan F Williams, Joop Aan Den Toorn, Christopher L Holloway
Abstract: We develop a significance test that determines whether the component of uncertainty due to the finite number of stepped mode-stirring samples or the component due to the lack of spatial uniformity dominates for a particular chamber set-up and stirrin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917869

2. Physical Models for 2.4 mm and 3.5 mm Coaxial VNA Calibration Kits Developed within the NIST Microwave Uncertainty Framework
Published: 5/22/2015
Authors: Jeffrey A Jargon, Chihyun Cho, Dylan F Williams, Paul D Hale
Abstract: We develop physical models of commercially available 2.4 mm and 3.5 mm coaxial calibration kits for vector network analyzers. These models support multiline thru-reflect-line (TRL) and open-short-load-thru (OSLT) calibrations, and include error mecha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917573

3. Rectangular-Waveguide Impedance
Published: 5/22/2015
Authors: Dylan F Williams, Jeffrey A Jargon, Uwe Arz, Paul D Hale
Abstract: We discuss the role of the wave impedance in temporal measurements in rectangular waveguide and present a simple rule-of-thumb for estimating the difference of the temporal electric and magnetic field waveforms supported by the dominant TE10 mode. We ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917863

4. Millimeter-Wave Modulated-Signal and Error-Vector-Magnitude Measurement With Uncertainty
Published: 5/1/2015
Authors: Catherine A Remley, Dylan F Williams, Paul D Hale, Chih-Ming Wang, Jeffrey A Jargon, Youngcheol Park
Abstract: We provide techniques to generate and characterize precision wideband millimeter-wave modulated signals. We use predistortion to obtain a significant improvement in signal quality and an associated reduction in the error vector magnitude (EVM) of the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916609

5. Parameter Estimation and Uncertainty Evaluation in a Low Rician K-Factor Reverberation-Chamber Environment
Published: 10/15/2014
Authors: Chih-Ming Wang, Catherine A Remley, Ansgar T. Kirk, Ryan J. Pirkl, Christopher L Holloway, Dylan F Williams, Paul D Hale
Abstract: In this paper we study statistical methods for estimating the Rician K-factor when this parameter is small. A fiducial approach for making statistical inference on the K-factor is discussed. The approach requires a Monte Carlo method to compute the u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914638

6. Correction to ,A General Waveguide Circuit TheoryŠ
Series: Journal of Research (NIST JRES)
Report Number: 097.024erata2014
Published: 10/6/2014
Authors: Dylan F Williams, Roger B. Marks
Abstract: N/A
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913711

7. Crosstalk Corrections for Coplanar-Waveguide Scattering-Parameter Calibrations
Published: 8/1/2014
Authors: Dylan F Williams, Franz-Josef Schmuckle, Ralf Doerner, Phung Ngoc Gia, Uwe Arz, Wolfgang Heinrich
Abstract: We study crosstalk and crosstalk corrections in coplanar waveguide vector-network-analyzer calibrations. We show that while crosstalk corrections can improve measurement accuracy, the effectiveness of the corrections depends on a number of factors, i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912597

8. Characterizing a Noninsertable Directional Device Using the NIST Uncertainty Framework
Published: 6/6/2014
Authors: Jeffrey A Jargon, Dylan F Williams, Paul D Hale, Michael D Janezic
Abstract: We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913524

9. A Prescription for THz Transistor Characterization
Published: 4/4/2014
Author: Dylan F Williams
Abstract: Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-mill ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915171

10. Calibrated Oscilloscope Measurements for System-Level Characterization of Weakly Nonlinear Sources
Published: 4/4/2014
Authors: Catherine A Remley, Dylan F Williams, Paul D Hale, Chih-Ming Wang, Jeffrey A Jargon, Youngcheol Park
Abstract: We present a technique to characterize and correct for linear and weakly nonlinear distortion introduced by the nonideal response of a wideband, high-frequency modulated-signal source. The magnitude and phase relationships between frequency component ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915592



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  • SP 250-XX: Calibration Services
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  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
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