NIST logo

Publications Portal

You searched on: Author: howard yoon Sorted by: date

Displaying records 71 to 80 of 128 records.
Resort by: Date / Title


71. Spectral Radiance Comparisons of Two High-Temperature Blackbodies With Temperatures Determined Using Absolute Detectors and ITS-90 Techniques, ed. by D. Ripple
Published: 1/1/2003
Authors: Howard W Yoon, Charles E Gibson, J L Gardner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104809

72. Temperature Control of Pulse Heated Specimens in a Kolsky Bar Apparatus Using Microsecond Time-Resolved Pyrometry
Published: 1/1/2003
Authors: D Basak, Howard W Yoon, R Rhorer, T J Burns, T Matsumoto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104320

73. Temperature Scales using Radiation Thermometers Calibrated using Absolute Irradiance and Radiance Responsivity
Published: 1/1/2003
Authors: Howard W Yoon, David W Allen, Charles E Gibson, Robert D. Saunders, Bettye C Johnson, Steven W Brown, Keith R. Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104811

74. The Development and the Characterization of an Absolute Pyrometer Calibrated for Spectral Radiance Responsivity
Published: 1/1/2003
Authors: David W Allen, Robert D. Saunders, Bettye C Johnson, Charles E Gibson, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104299

75. The realization of the NIST Detector-based Spectral Irradiance Scale
Published: 1/1/2003
Authors: Howard W Yoon, Charles E Gibson, P Y. Barnes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104273

76. Thermal Imaging of Metals In A Kolsky-Bar Apparatus, ed. by K.E. Cramer and X.P. Maldague
Published: 1/1/2003
Authors: Howard W Yoon, D Basak, R Rhorer, E Whitenton, T J Burns, R Fields, L Levine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104810

77. Thermal Imaging of Metals in a Kolsky-Bar Apparatus
Published: 1/1/2003
Authors: Eric Paul Whitenton, Richard L. Rhorer, Howard W Yoon, D Basak, Richard Joel Fields, Lyle E Levine, Timothy J Burns
Abstract: For materials testing at elevated temperatures, we describe the design and the development of a resistively heated Kolsky-bar apparatus. The temperature of the sample is determined by non-contact thermometry and the spatial temperature gradients in t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822262

78. Thermal imaging of metals in a Kolsky-bar apparatus, Proc. of Thermosense XXV, ed. by K.E. Cramer and X.P. Maldague
Published: 1/1/2003
Authors: Howard W Yoon, D Basak, R Rhorer, E Whitenton, T J Burns, R Fields, L Levine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104271

79. Long-Term Temporal Stability of the National Institute of Standards and Technology Spectral Irradiance Scale Determined Using Absolute Filter Radiometers
Published: 10/1/2002
Authors: Howard W Yoon, Charles E Gibson
Abstract: The temporal stability of the NIST spectral irradiance scale as measured using broad-band filter radiometers calibrated for absolutespectral irradiance responsivity is described. The working standard FEL lamps and the check standard FEL lamps have b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841605

80. Realization of the National Institute of Standards and Technology Detector-Based Spectral Irradiance Scale
Published: 10/1/2002
Authors: Howard W Yoon, Charles E Gibson, P Y. Barnes
Abstract: A detector-based spectral irradiance scale has been realized at the National Institute of Standards and Technology. Unlike the previousNIST spectral irradiance scales, the new scale is generated using filter radiometers calibrated for absolute spect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841604



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series