NIST logo

Publications Portal

You searched on: Author: howard yoon Sorted by: date

Displaying records 111 to 120 of 127 records.
Resort by: Date / Title

111. Radiometric Measurement Comparisons Using Transfer Radiometers in Support of the Calibration of NASA's Earth Observing System (EOS) Sensors, ed. by P.N. Slater
Published: 1/1/1999
Authors: James J. Butler, B L Markham, Bettye C Johnson, Steven W Brown, Howard W Yoon, R A Barnes, S F Biggar, E F Zalewski, P R Spyak, F Sakuma, Jill Cooper

112. A 400 nm to 2500 nm Absolute Spectral Radiance Comparison Using Filter Radiometers
Published: 10/1/1998
Authors: Howard W Yoon, Bettye C Johnson, D Kelch, S F Biggar, P R Spyak
Abstract: An integrating sphere source developed by MTL Systems, Inc. was calibrated for them by a commercial standards laboratory traceable to the National Institute of Standards and Technology (NIST), resulting in values of spectral radiance in the 400 nm to ...

113. A 400 nm to 2500 nm Absolute Spectral Radiance Comparison using Filter Radiometers
Published: 1/1/1998
Authors: Howard W Yoon, Bettye C Johnson, D Kelch, S F Biggar, P R Spyak

114. A Comparison of ITS-90 and Detector-Based Scales Between NPL and NIST Using Metal-Carbon Eutectics
Published: Date unknown
Authors: Graham Machin, Charles E Gibson, D L Lowe, David W Allen, Howard W Yoon

115. AC-Mode SW-IR Radiation Thermometers for Measurement of Ambient Temperatures
Published: Date unknown
Authors: George P Eppeldauer, Howard W Yoon
Abstract: Recent improvements in the fabrication technology of short-wave infrared (SWIR) quantum detectors opened a new era in radiation thermometry. Ambient and higher temperatures can be measured with low uncertainties using thermoelectrically (TE) cooled e ...

116. Absolute Flux Calibrations of Stars
Published: Date unknown
Authors: Gerald T Fraser, Steven W Brown, Howard W Yoon, Bettye C Johnson, Keith R Lykke
Abstract: Absolute stellar photometry is based on 1970s terrestrial measurements of the star Vega referenced against the Cu fixed-point blackbody. Significant advances in absolute radiometry have been made in the last 30 years that offer the potential to impro ...

117. Determination of Radiance Temperatures Using Detectors Calibrated for Absolute Spectral Power Responsivity
Published: Date unknown
Authors: Howard W Yoon, Charles E Gibson
Abstract: Our current spectral radiance and irradiance scales are derived from the radiance temperature determination of a blackbody at the freezing point of gold (GPBB) at 1337.33 K. The standard lamps disseminated for spectral irradiance have spectral output ...

118. Non-Contact Temperature Measurements of Micro-Scale Phenomena
Published: Date unknown
Author: Howard W Yoon
Abstract: Imaging trying to make temprature measurements in a spatial region equal to the edge of a printer paper or within the diameter of a strand of hair. The accurate computer modeling of the machining process requires measurements of the thermodynamic tem ...

119. Performance Comparisons of InGaAs, Extended InGaAs and Short-Wave HgCdTe Detectors Between 1 [mu]m and 2.5 [mu]m
Published: Date unknown
Authors: Howard W Yoon, Matt Dopkiss, George P Eppeldauer
Abstract: In this study, three different detectors, regular InGaAs, short-wave infrared extended-InGaAs (exInGaAs) with the bandgap wavelength at 2.6 mm and short-wave HgCdTe (swMCT) with the bandgap wavelength at 2.8 mm are studied. The detectors have active ...

120. Portable LED-Illuminated Radiance Source
Published: Date unknown
Authors: David W Allen, G Dezsi, Howard W Yoon

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series