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Author: howard yoon

Displaying records 51 to 60 of 121 records.
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51. Kolsky Bar With Electrical Pulse Heating of the Sample
Published: 6/1/2003
Authors: Eric Paul Whitenton, Michael Kennedy, Matthew A. Davies, Gerald V. Blessing, Brian S. Dutterer, Richard L. Rhorer, Howard W Yoon, Lyle E Levine, Richard Joel Fields, D Basak, Timothy J Burns
Abstract: The accuracy of simulations for modeling of machining processes is often limited due to insufficient knowledge of the material properties during machining, which can involve strain rates on the order of 104 per second or higher, plus rapid material h ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821995

52. A SURF Beamline for Synchrotron Source-Based Absolute Radiometry
Published: 2/1/2003
Authors: Ping-Shine Shaw, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
Abstract: A new source-based radiometry beamline at Synchrotron Ultraviolet Radiation Facility (SURF III) was constructed recently. The goal of this beamline is to establish a national source standard with wide spectral range from far UVto IR by using the cal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841629

53. FASCAL 2: A New NIST Facility for the Calibration of the Spectral Irradiance of Sources
Published: 2/1/2003
Authors: Howard W Yoon, J E Proctor, Charles E Gibson
Abstract: The Facility for Automated Spectroradiometric Calibrations (FASCAL) is the primary facility for spectral irradiance and spectral radiance calibrations at NIST and has been in continous use since the early 1970's. Due to the increasing demands for sp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841660

54. A Method for Testing the Spectral Responsivity of Infrared Cameras using Tunable Lasers, ed. by G.C. Holst
Published: 1/1/2003
Authors: Joseph Paul Rice, Keith R Lykke, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104727

55. Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining
Published: 1/1/2003
Authors: Matthew A Davies, Howard W Yoon, T L Schmitz, T J Burns, M D Kennedy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103716

56. Calibrated thermal microscopy of the tool-chp interface in machining
Published: 1/1/2003
Authors: Matthew A. Davies, Howard W Yoon, Tony L Schmitz, Timothy J Burns, Michael Kennedy
Abstract: This paper presents the results of calibrated, microscopic measurement of the temperature fields at the tool-chip interface during the steady-state, orthogonal machining of AISI 1045 steel. The measurement system consists of a nearly diffraction lim ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821886

57. Constitutive Model Data for Machining Simulation Using the NIST Pulse-Heat Kolsky Bar
Published: 1/1/2003
Authors: Eric Paul Whitenton, Michael Kennedy, Matthew A. Davies, Gerald V. Blessing, Brian S. Dutterer, Richard L. Rhorer, Howard W Yoon, Richard Joel Fields, D Basak, Timothy J Burns
Abstract: A new facility for dynamic material testing using a traditional Kolsky bar with the addition of controlled electrical-resistive pulse heating has been established at the National Institute of Standrds and Technology (NIST). Dynamic stress-strain data ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821954

58. FASCAL 2: A New NIST Facility for the Spectral Irradiance Calibrations of Sources
Published: 1/1/2003
Authors: Howard W Yoon, J E Proctor, Charles E Gibson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104270

59. Kolsky Bar with Electrical Pulse Heating of the Sample
Published: 1/1/2003
Authors: R Rhorer, D Basak, G Blessing, T J Burns, Matthew A Davies, B Dutterer, R Fields, M D Kennedy, L Levine, E Whitenton, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104725

60. Linearity of InGaAs Photodiodes
Published: 1/1/2003
Authors: Howard W Yoon, James J. Butler, Thomas C Larason, George P Eppeldauer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104272



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